Method of obtaining proper probe alignment in a multiple contact environment

Claim 1

A method of aligning a plurality of probes to a plurality of contacts arranged in a pattern on a substrate, said method comprising the steps of: powering one of a selected pattern of probes or a like pattern of selected contacts such that upon the selected patterns being in coincidence, the plurality of probes will be in contact with predetermined contacts on the substrate; providing a circuit path through one of all of the other probes or contacts not so powered, bringing said plurality of probes into contact at random with said contacts of said substrate, and moving one of said substrate and probes until said selected patterns coincide as indicated by a completed circuit path between said selected patterns.

Claim 2

A method of aligning a plurality of probes to a plurality of contacts arranged in a pattern on a substrate, said method comprising the steps of: powering one of a selected pattern of probes or a like pattern of selected contacts such that upon the selected patterns being in coincidence, the plurality of probes will be in contact with predetermined contacts on the substrate; providing a circuit path through one of all of the other probes or contacts not so powered, bringing said plurality of probes into contact at random with said contacts of said substrate, and moving one of said substrate and probes until said selected patterns coincide as indicated by a completed circuit path between said selected patterns.

Claim 4

A method of aligning a plurality of probes to a plurality of contacts arranged in a pattern on a substrate, said method comprising the steps of: powering a selected pattern of probes, and providing a circuit path through at least a like pattern of contacts so that upon registration of the patterns, the plurality of probes will align with the plurality of contacts, bringing said plurality of probes into contact at random with said contacts of said substrate, and moving one of said substrate and probes until said selected patterns coincide as indicated by a completed circuit path between said selected patterns.

Claim 5

A method of aligning a plurality of probes to a plurality of contacts arranged in a pattern on a substrate, said method comprising the steps of: powering a selected pattern of probes, and providing a circuit path through at least a like pattern of contacts so that upon registration of the patterns, the plurality of probes will align with the plurality of contacts, bringing said plurality of probes into contact at random with said contacts of said substrate, and moving one of said substrate and probes until said selected patterns coincide as indicated by a completed circuit path between said selected patterns.

Claim 7

A method of aligning a tool to a plurality of electrically conductive contacts on a substrate, said method comprising the steps of; positioning a tool approximately in the area of said contacts on a substrate; providing at least a pair of probe clusters fixed with respect to said tool, each being associated with a contact on said substrate and having a plurality of spaced apart probes, each of said probes of a cluster being spaced from at least its adjacent probe a distance less than the width of the associated contact which is to be contacted but greater than one half the width of said contact; providing a source of electrical power to one of a selected probe of each of said pair of probe clusters or to their associated contacts, contacting said associated contacts with said selected probes, sensing whether a shorted condition exists between said selected probe and any other probe of a cluster and moving one of said tool and substrate until a non-shorting condition exists between the selected probe of each probe cluster and the associated contact, thereby indicating that said tool is aligned with said substrate.

Claim 8

A method of aligning a tool to a plurality of electrically conductive contacts on a substrate, said method comprising the steps of; positioning a tool approximately in the area of said contacts on a substrate; providing at least a pair of probe clusters fixed with respect to said tool, each being associated with a contact on said substrate and having a plurality of spaced apart probes, each of said probes of a cluster being spaced from at least its adjacent probe a distance less than the width of the associated contact which is to be contacted but greater than one half the width of said contact; providing a source of electrical power to one of a selected probe of each of said pair of probe clusters or to their associated contacts, contacting said associated contacts with said selected probes, sensing whether a shorted condition exists between said selected probe and any other probe of a cluster and moving one of said tool and substrate until a non-shorting condition exists between the selected probe of each probe cluster and the associated contact, thereby indicating that said tool is aligned with said substrate.

Claim 9

A method of aligning a plurality of probes to a plurality of electrically conductive contacts on a substrate, said contacts on the substrate including pad like contacts adjacent to the contacts on the substrate, said method comprising the steps of: positioning said plurality of probes approximately in the area of said contacts on said substrate; providing at least a pair of probe clusters each being associated with a contact on said substrate and having a plurality of spaced apart probes, each of said probes of a cluster being spaced from at least its adjacent probe a distance less than the width of the associated pad like contact which is to be contacted but greater than one half the width of said pad like contact, providing a source of electrical power to a selected probe of each of said pair of probe clusters, contacting said associated pad like contacts with the associated selected probes, sensing whether a shorted condition exists between said selected probe and any other probe of a cluster, and moving one of said plurality of probes and substrate until a non-shorting condition exists between the selected probe of each cluster and the associated contact thereby indicating that said plurality of probes is aligned with said substrate.

Claim 10

A method of aligning a plurality of probes to a plurality of electrically conductive contacts on a substrate, said contacts on the substrate including pad like contacts adjacent to the contacts on the substrate, said method comprising the steps of: positioning said plurality of probes approximately in the area of said contacts on said substrate; providing at least a pair of probe clusters each being associated with a contact on said substrate and having a plurality of spaced apart probes, each of said probes of a cluster being spaced from at least its adjacent probe a distance less than the width of the associated pad like contact which is to be contacted but greater than one half the width of said pad like contact, providing a source of electrical power to a selected probe of each of said pair of probe clusters, contacting said associated pad like contacts with the associated selected probes, sensing whether a shorted condition exists between said selected probe and any other probe of a cluster, and moving one of said plurality of probes and substrate until a non-shorting condition exists between the selected probe of each cluster and the associated contact thereby indicating that said plurality of probes is aligned with said substrate.