X-ray beam perpendicular finder

Claim 3

The device defined in Claim 1 wherein said patterns are defined by a plurality of cylindrical surfaces which pass through said layers in perpendicular alignment therewith.

Claim 4

The device defined in claim 1 wherein said cutouts through said semi-radio opaque layers are formed with said layers in surface to surface contact so that the pattern so formed is identical, said layers also having at least two cylindrical alignment pin surfaces which pass therethrough in perpendicular alignment therewith, said alignment pin surfaces being formed when said layers are in surface to surface contact so that the pattern can be exactly aligned on said nonradio opaque member.

Claim 5

The device defined in claim 1 including two sheets of nonradio opaque material, said sheets each having parallel side surfaces one of which is attached to one of said layers on the opposite side thereof from said member.

Claim 6

A process for locating the perpendicular ray of an X-ray beam field with respect to the location indicated to be the center of the field by an X-ray machine including the steps of: placing a device having first and second semiradio opaque sheets each having a protective nonradio opaque parallel surface layer on one surface thereof, a similar plurality of portions removed therethrough to define a pattern and means to space and maintain said first and second semi-radio opaque sheets in parallel alignment with their patterns in perpendicular registry including a block having parallel sides to which said sheets are connected on the opposite sides thereof from said protective layers, said block being constructed from a material allowing easier passage of X-rays than the material from which said sheets are constructed, in a known position with respect to the indicated center of the field; exposing a medium sensitive to X-rays through said device by producing an X-ray beam with the X-ray machine; and comparing the positions of the misalignments of said patterns, lines through registered portions of said patterns intersecting at the location of said perpendicular ray.

Claim 7

A process for locating the perpendicular ray of an X-ray beam field with respect to the location indicated to be the center of the field by an X-ray machine including the steps of: placing a device having first and second semiradio opaque sheets each having a protective nonradio opaque parallel surface layer on one surface thereof, a similar plurality of portions removed therethrough to define a pattern and means to space and maintain said first and second semi-radio opaque sheets in parallel alignment with their patterns in perpendicular registry including a block having parallel sides to which said sheets are connected on the opposite sides thereof from said protective layers, said block being constructed from a material allowing easier passage of X-rays than the material from which said sheets are constructed, in a known position with respect to the indicated center of the field; exposing a medium sensitive to X-rays through said device by producing an X-ray beam with the X-ray machine; and comparing the positions of the misalignments of said patterns, lines through registered portions of said patterns intersecting at the location of said perpendicular ray.

Claim 8

The process defined in Claim 5 including the additional step of: orienting a pinhole camera upward toward the source of said X-ray beams along the perpendicular ray indicated by the comparison of the positions of misalignments of said patterns; exposing a film sensitive to X-rays in said camera; and comparing said apparent focal spot size recorded with the X-ray machine specified apparent focal spot size to indicate the alignment of the X-ray beam source with the means which indicate the center of said X-ray beam field.

Claim 9

The process defined in claim 5 including: adjusting said X-ray machine in accordance with said observation; and repeating the steps in order until the visually indicated center and the actual center of the X-ray beam field coinside.

Claim 10

The process defined in claim 5 wherein said patterns are defined by a plurality of cylindrical surfaces which pass between the opposite side surfaces of said sheets in perpendicular alignment thereto, said plurality of cylindrical surfaces being established in alignment by being formed when said sheets are in surface to surface contact along with at least two cylindrical alignment surfaces also perpendicular to said sheets, whereby said alignment surfaces are used to assure alignment of said plurality of cylindrical surfaces where said sheets are connected to said block.