US4038598A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Probe contact and junction detector
Assignee: United States Department of the Air Force
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Filing: 1976-03-16
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Granted: 1977-07-26
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Expires: 1996-03-16
Abstract
Abstract The detection and indication of a probe contact to metalization and to junctions on chips during microcircuit analysis is achieved by means of a circuit comprising a complementary MOS transistor logic circuit and light emitting diodes (LEDs). A polarity switching circuit provides probe contact indication in response to "0" and "1" logic levels for both forward and reverse bias conditions. Other switching circuits provide sensitivity level selection and the transfer of probe output to an alternate microcircuit analysis device. An auxiliary sound indicator is connected in parallel with the visual LED indicators. Probe assembly capacitance is minimized by a plexiglass insulator that inserts a fixed capacitance between each probe contact.
Inventors
- 👤 Vincent C. Kapfer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 03:23
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2886
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
225 words
A probe contact and junction detector for microcircuit analysis comprising a probe means, first and second complementary MOS hex buffer converter logic circuits connected to receive the output of said probe means, each said hex buffer converter logic circuit comprising first, second, third, fourth, fifth and sixth buffer stages, each stage having an input and an output, said first buffer stage having its input connected to said probe means and its output connected to the inputs of said second and third buffer stages and through resistance means to the output of said fourth buffer stage, the outputs of said second and third buffer stages being connected to the inputs of said fourth, fifth and sixth buffer stages, and, each said light emitting diode means comprises first and second light emitting diodes, said first light emitting diode being connected between the outputs of said second and third buffer stages and the power supply means, and said second light emitting diode being connected between the outputs of said fifth and sixth buffer stages and the power supply means; a light emitting diode means connected to receive and respond to "0" and "1" level logic signals generated by each hex buffer converter logic circuit, and power supply means connected to provide a voltage source for said light emitting diode means and for said hex buffer converter logic circuits.
Claim 2
Dependent Claim
225 words
A probe contact and junction detector for microcircuit analysis comprising a probe means, first and second complementary MOS hex buffer converter logic circuits connected to receive the output of said probe means, each said hex buffer converter logic circuit comprising first, second, third, fourth, fifth and sixth buffer stages, each stage having an input and an output, said first buffer stage having its input connected to said probe means and its output connected to the inputs of said second and third buffer stages and through resistance means to the output of said fourth buffer stage, the outputs of said second and third buffer stages being connected to the inputs of said fourth, fifth and sixth buffer stages, and, each said light emitting diode means comprises first and second light emitting diodes, said first light emitting diode being connected between the outputs of said second and third buffer stages and the power supply means, and said second light emitting diode being connected between the outputs of said fifth and sixth buffer stages and the power supply means; a light emitting diode means connected to receive and respond to "0" and "1" level logic signals generated by each hex buffer converter logic circuit, and power supply means connected to provide a voltage source for said light emitting diode means and for said hex buffer converter logic circuits.
Claim 3
Dependent Claim
142 words
A probe contact and junction detector as defined in claim 1 wherein each said buffer stage comprises first and second P-channel MOS transistors and first, second, and third N-channel MOs transistors, the gates of said first and second P-channel and said first and third N-channel transistors being connected to the buffer stage input, the sources and substrates of said first and second N-channel transistors being connected to ground, the drains and substrates of said first and second P-channel and said second N-channel transistors being connected to said power supply means, the source of said first P-channel transistor and the drain of said first N-channel transistor being connected to the gate of said second N-channel transistor, and the drain of said third N-channel transistor and the sources of said second N-channel and said second P-channel transistors being connected to the buffer stage output.
Claim 4
Dependent Claim
24 words
A probe contact and junction detector as defined in claim 2 including a tone generator connected in parallel with said light emitting diode means.
Claim 5
Dependent Claim
61 words
A probe contact and junction detector as defined in claim 3 wherein said probe means comprises three coaxial cables, three tip jacks, the center conductor of each of said coaxial cables terminating in a tip jack, and a plexiglass mounting head, said tip jacks being mounted in said mounting head and positioned to provide a discrete fixed capacitance between probe contacts.
Claim 6
Dependent Claim
31 words
A probe contact and junction detector as defined in claim 4 including a switching means connected to selectively switch the output of said probe means to an alternate microcircuit analysis device.
Claim 7
Dependent Claim
35 words
A probe contact and junction detector as defined in claim 5 including a sensitivity switch connected to selectively disconnect said second complementary MOS hex buffer converter logic circuit from the output of said probe means.
Claim 8
Dependent Claim
26 words
A probe contact and junction detector as defined in claim 6 including a polarity switch connected to selectively reverse the polarity of the probe means contacts.
References Cited (Backward Citations)
US3787735A
Cited
US3838339A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-07-25 | 1981-01-24 | 1981-07-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-07-25 | 1985-01-24 | 1985-07-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-07-25 | 1989-01-24 | 1989-07-26 | $7700.00 | Window Closed / Lapsed |