Patent US5301232A successfully refreshed from Google Patents.
US4037101A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for analyzing fine grained substances
Assignee: Jeol Ltd
•
Filing: 1975-11-19
•
Granted: 1977-07-19
•
Expires: 1995-11-19
Abstract
Abstract A rock specimen is step scanned in an electron probe x-ray microanalyzer. A plurality of x-ray spectrometers (for example three) forming a part of said electron probe x-ray microanalyzer simultaneously detect characteristic x-rays corresponding to three elements at each scanning point on the rock specimen. The concentration of each element is calculated from the output signals of said plurality of x-ray spectrometers and the calculated elemental concentrations are then converted into atomic ratios accordingly. From this information, the type of mineral at each scanning point is designated by a character which is recorded on a display means in synchronism with the step scanning so as to display a mineral map of the specimen being examined.
Inventors
- 👤 Kimio Okumura
- 👤 Tatsunori Soya
- 👤 Yosuke Kauchi
- 👤 Hideyuki Ohi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 20:41
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/225
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
115 words
In a method of analyzing the fine texture of a specimen comprising the steps for (a) irradiating the specimen surface with a fine diameter electron beam, (b) scanning the irradiating position two-dimensionally over a given area on said specimen surface, (c) measuring the characteristic x-rays produced as a result of beam irradiaton corresponding to certain elements, (d) calculating the content ratios of each element from the results of said characteristic x-ray measurement, the improvement comprising the steps for (e) generating signals from the content ratios of said elements which are indicative of the chemical phase at the point being irradiated, and (f) displaying said signals two-dimensionally in synchronism with said scanning of the irradiating position.
Claim 2
Dependent Claim
115 words
In a method of analyzing the fine texture of a specimen comprising the steps for (a) irradiating the specimen surface with a fine diameter electron beam, (b) scanning the irradiating position two-dimensionally over a given area on said specimen surface, (c) measuring the characteristic x-rays produced as a result of beam irradiaton corresponding to certain elements, (d) calculating the content ratios of each element from the results of said characteristic x-ray measurement, the improvement comprising the steps for (e) generating signals from the content ratios of said elements which are indicative of the chemical phase at the point being irradiated, and (f) displaying said signals two-dimensionally in synchronism with said scanning of the irradiating position.
Claim 3
Dependent Claim
122 words
In a device for analyzing the fine texture of a specimen substance comprising (a) an irradiating means for irradiating the specimen surface with an electron beam, (b) a scanning means for scanning said irradiating position two-dimensionally over a given area on said specimen surface, (c) an x-ray analyzing means for measuring the characteristic x-rays produced as a result of beam irradiation, (d) calculating means for calculating the content ratios of each element from the outputs of said x-ray analyzing means, the improvement comprising (e) means for generating signals from the content ratios of said elements which are indicative of the chemical phase at the point being irradiated, and (f) display means for displaying the signals two-dimensionally in synchronism with said scanning means.
Claim 4
Dependent Claim
122 words
In a device for analyzing the fine texture of a specimen substance comprising (a) an irradiating means for irradiating the specimen surface with an electron beam, (b) a scanning means for scanning said irradiating position two-dimensionally over a given area on said specimen surface, (c) an x-ray analyzing means for measuring the characteristic x-rays produced as a result of beam irradiation, (d) calculating means for calculating the content ratios of each element from the outputs of said x-ray analyzing means, the improvement comprising (e) means for generating signals from the content ratios of said elements which are indicative of the chemical phase at the point being irradiated, and (f) display means for displaying the signals two-dimensionally in synchronism with said scanning means.
Claim 5
Dependent Claim
23 words
A device as claimed in claim 2, in which said x-ray analyzing means is comprised of a plurality of wavelength dispersive x-ray spectrometers.
Claim 6
Dependent Claim
21 words
A device as claimed in claim 2, in which said x-ray analyzing means is comprised of an energy dispersive x-ray spectrometer.
Claim 7
Dependent Claim
19 words
A device as claimed in claim 2, in which said display means is comprised of a character display means.
References Cited (Backward Citations)
US3204095A
Cited
US3229087A
Cited
US3479506A
Cited
US3733484A
Cited
US3733483A
Cited
US3909612A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-07-18 | 1981-01-17 | 1981-07-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-07-18 | 1985-01-17 | 1985-07-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-07-18 | 1989-01-17 | 1989-07-19 | $7700.00 | Window Closed / Lapsed |