Semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration

Claim 2

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side and a junction between said lightly and heavily doped regions extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least the surface of said junction between lightly doped and heavily doped regions in said first region; and first, second and third electrodes contacting said first, second and third regions, respectively, in which said first electrode extends toward said second electrode on said insulating layer and covers an entire surface portion of said heavily doped region, and at least a part of said lightly doped region together with the said surface of the junction between lightly doped and heavily doped regions in said first region.

Claim 3

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: an emitter region of one conductivity type including a lightly doped emitter region on a base side and a heavily doped emitter on the other side forming a lightly doped-heavily doped junction therebetween extending to the surface of the device; a base region of opposite conductivity type forming a first PN junction with said lightly doped emitter region; a collector region of said one conductivity type forming a second PN junction with said base region; an insulating layer formed on at least a part of said heavily doped emitter, said lightly doped emitter and said lightly doped-heavily doped junction at the surface of the device; said insulating layer being spaced from said first PN junction a distance shorter than the diffusion length of minority carriers in said lightly doped emitter; and electrodes for said emitter, base and collector; said electrode for said emitter extending on said insulating layer covering at least a part of said heavily doped emitter, said lightly doped emitter and said lightly doped-heavily doped junction at the surface of the device.

Claim 4

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: an emitter region of one conductivity type including a lightly doped emitter region on a base side and a heavily doped emitter on the other side forming a lightly doped-heavily doped junction therebetween extending to the surface of the device; a base region of opposite conductivity type forming a first PN junction with said lightly doped emitter region; a collector region of said one conductivity type forming a second PN junction with said base region; an insulating layer formed on at least a part of said heavily doped emitter, said lightly doped emitter and said lightly doped-heavily doped junction at the surface of the device; said insulating layer being spaced from said first PN junction a distance shorter than the diffusion length of minority carriers in said lightly doped emitter; and electrodes for said emitter, base and collector; said electrode for said emitter extending on said insulating layer covering at least a part of said heavily doped emitter, said lightly doped emitter and said lightly doped-heavily doped junction at the surface of the device.

Claim 5

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: an emitter region of one conductivity type including a lightly doped emitter region on a base side and a heavily doped emitter on the other side forming a lightly doped-heavily doped junction therebetween extending to the surface of the device; said junction being comb-shaped; a base region of opposite conductivity type forming a first PN junction with said lightly doped emitter region; said first PN junction being comb-shaped to match the comb shape of said lightly doped-heavily doped junction; a collector region of said one conductivity type forming a second PN junction with said base region; an insulating layer formed on the surface of at least a part of said heavily doped emitter, said lightly doped emitter and said lightly doped-heavily doped junction; said insulating layer being located from said first PN junction within the distance shorter than the diffusion length of minority carriers in said lightly doped emitter; and electrodes for said emitter, base and collector.

Claim 6

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: an emitter region of one conductivity type including a lightly doped emitter region on a base side and a heavily doped emitter on the other side forming a lightly doped-heavily doped junction therebetween extending to the surface of the device; said junction being comb-shaped; a base region of opposite conductivity type forming a first PN junction with said lightly doped emitter region; said first PN junction being comb-shaped to match the comb shape of said lightly doped-heavily doped junction; a collector region of said one conductivity type forming a second PN junction with said base region; an insulating layer formed on the surface of at least a part of said heavily doped emitter, said lightly doped emitter and said lightly doped-heavily doped junction; said insulating layer being located from said first PN junction within the distance shorter than the diffusion length of minority carriers in said lightly doped emitter; and electrodes for said emitter, base and collector.

Claim 7

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type including a lightly doped-heavily doped junction therein extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with the lightly doped region of said first region; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least said lightly doped region of the said first region at the surface of the device; and electrodes contacting said first region, said second region and said third region respectively, in which an electrode contacting said first region extends on said insulating layer and covers at least said lightly doped-heavily doped junction beneath said insulating layer.

Claim 8

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type including a lightly doped-heavily doped junction therein extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with the lightly doped region of said first region; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least said lightly doped region of the said first region at the surface of the device; and electrodes contacting said first region, said second region and said third region respectively, in which an electrode contacting said first region extends on said insulating layer and covers at least said lightly doped-heavily doped junction beneath said insulating layer.

Claim 9

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side forming a junction extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least a surface of said lightly doped and said heavily doped region in said first region; and first, second and third electrodes contacting said first, second and third region respectively, said first electrode comprising a conductive polycrystalline silicon contacting said heavily doped region.

Claim 10

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side forming a junction extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least a surface of said lightly doped and said heavily doped region in said first region; and first, second and third electrodes contacting said first, second and third region respectively, said first electrode comprising a conductive polycrystalline silicon contacting said heavily doped region.

Claim 11

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side forming a junction extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least a surface of said lightly doped and said heavily doped region in said first region and a surface end of said first PN junction; and first, second and third electrodes contacting with said first, second and third regions respectively, in which said second electrode extends toward said first electrode on said insulating layer and covers an entire surface portion of said first PN junction and at least a part of said lightly doped region.

Claim 12

A bipolar-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side forming a junction extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least a surface of said lightly doped and said heavily doped region in said first region and a surface end of said first PN junction; and first, second and third electrodes contacting with said first, second and third regions respectively, in which said second electrode extends toward said first electrode on said insulating layer and covers an entire surface portion of said first PN junction and at least a part of said lightly doped region.

Claim 13

A bipolary-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side forming a junction extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least a surface of said lightly doped and said heavily doped region in said first region; said insulating layer including electric charges therein to change the condition of said surface of said lightly doped region; and first, second and third electrodes contacting with said first, second and third regions respectively, in which said first electrode extends toward said second electrode on said insulating layer and covers an entire surface portion of said heavily doped region and at least a part of said lightly doped region.

Claim 14

A bipolary-type semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration comprising: a first semiconductor region of one conductivity type consisting of a lightly doped region on one side and a heavily doped region on the other side forming a junction extending to the surface of the device; a second semiconductor region of the opposite conductivity type forming a first PN junction with said lightly doped region on said side; a third semiconductor region of said one conductivity type forming a second PN junction with said second region; an insulating layer covering at least a surface of said lightly doped and said heavily doped region in said first region; said insulating layer including electric charges therein to change the condition of said surface of said lightly doped region; and first, second and third electrodes contacting with said first, second and third regions respectively, in which said first electrode extends toward said second electrode on said insulating layer and covers an entire surface portion of said heavily doped region and at least a part of said lightly doped region.