US4028657A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Deposited layer type thermometric resistance structure
Assignee: WC Heraus GmbH and Co KG
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Filing: 1975-10-22
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Granted: 1977-06-07
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Expires: 1995-10-22
Abstract
Abstract On an aluminum oxide or high-alumina ceramic substrate an intermediate layer of a rare earth, titanium or iron oxide or a mixture of such oxides is provided for matching the thermal expansion coefficient of the substrate to that of a platinum layer between 0.1 and 10 μ m thick applied in a resistor pattern configuration on the surface of the intermediate layer. The intermediate layer, unlike a glass embedding layer, allows heat treatment of the platinum layer by heating the entire structure makes it possible to avoid the embedding to heal local defects, without impairing the integrity of the structure (which occur when glass melt) and without co-crystallizing with aluminum oxide. The platinum layer thickness is consistent with stability of the specific resistance and the temperature coefficient of resistance.
Inventors
- 👤 Walter G. Reichelt
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 01:26
CPC Classifications
G; G01; G01K; G01K7/00; G01K7/16; G01K7/18; H; H01; H01C; H01C7/00; H01C7/006; H01C7/02; H01C7/021
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
130 words
A thermometric electrical resistance structure comprising a carrier substrate consisting chiefly of aluminum oxide, an intermediate layer on said substrate and a patterned platinum layer of a configuration suitable for use as an electrical resistance provided on said intermediate layer, having the improvement that: the platinum layer has a thickness in the range from 0.1 to 10 μm, and the intermediate layer has a thickness in the range from 0.1 to 10 μm and is composed of an oxide material selected from the group consisting of oxides of rare earch elements, titanium oxide, iron oxide and mixtures of at least two of said oxides, whereby said oxide material, by providing electrical and mechanical stability to the structure in manufacturing heat treatment, improves the quality and reliability of the thermometric structure.
Claim 2
Dependent Claim
130 words
A thermometric electrical resistance structure comprising a carrier substrate consisting chiefly of aluminum oxide, an intermediate layer on said substrate and a patterned platinum layer of a configuration suitable for use as an electrical resistance provided on said intermediate layer, having the improvement that: the platinum layer has a thickness in the range from 0.1 to 10 μm, and the intermediate layer has a thickness in the range from 0.1 to 10 μm and is composed of an oxide material selected from the group consisting of oxides of rare earch elements, titanium oxide, iron oxide and mixtures of at least two of said oxides, whereby said oxide material, by providing electrical and mechanical stability to the structure in manufacturing heat treatment, improves the quality and reliability of the thermometric structure.
Claim 3
Dependent Claim
19 words
A thermometric electrical resistance structure as defined in claim 1 in which said substrate consists essentially of aluminum oxide.
Claim 4
Dependent Claim
20 words
A thermometric electrical resistance structure as defined in claim 1 in which said substrate consists essentially of a high-alumina ceramic.
Claim 5
Dependent Claim
26 words
A thermometric electrical resistance structure as defined in claim 1 in which said intermediate layer has a thickness in the range from 0.5 to 5 μm.
Claim 6
Dependent Claim
27 words
A thermometric electrical resistance structure as defined in claim 1 in which the thickness of the platinum layer is in the range from 1 to 3 μm.
Claim 7
Dependent Claim
46 words
A thermometric electrical resistance structure as defined in claim 1 in which the platinum layer has the characteristics of a platinum layer subjected to heat treatment at a temperature in the range from 1000° to 1400° C for a period of from one to twenty hours.
Claim 8
Dependent Claim
23 words
A thermometric electrical resistance structure as defined in claim 1 in which the platinum layer has the characteristics of a vapor-deposited platinum layer.
Claim 9
Dependent Claim
23 words
A thermometric electrical resistance structure as defined in claim 1 in which the platinum layer has the characteristics of a sputtered platinum layer.
Claim 10
Dependent Claim
24 words
A thermometric electrical resistance structure as defined in claim 1 in which the platinum layer is covered with a protective coating of synthetic resin.
Claim 11
Dependent Claim
18 words
A thermometric electrical resistance structure as defined in claim 9 in which said synthetic resin is epoxy resin.
Claim 12
Dependent Claim
23 words
A thermometric electrical resistance structure as defined in claim 1 in which the platinum layer is covered with a protective coating of glass.
Claim 13
Dependent Claim
23 words
A thermometric electrical resistance structure as defined in claim 1 in which the platinum layer is covered with a protective metal oxide coating.
References Cited (Backward Citations)
US2802925A
Cited
US3845443A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-06-06 | 1980-12-06 | 1981-06-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-06-06 | 1984-12-06 | 1985-06-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-06-06 | 1988-12-06 | 1989-06-07 | $7700.00 | Window Closed / Lapsed |