Ion beam separators

Claim 2

An ion beam separator comprising a curved ion beam passageway, a deflecting magnet for deflecting an ion beam injected into the passageway, and a beam width defining slit traversed by the ion beam prior to entry into the deflecting field of the said magnet, which slit is rotatable about an axis parallel with the beam height for adjusting the width of beam permitted to pass through the slit.

Claim 3

An ion beam separator as claimed in claim 1, wherein the said axis of rotation of the slit is located centrally of the slit and on the centre line of the required beam path for injection into the magnet field.

Claim 4

An ion beam separator as claimed in claim 2, wherein there is provided a servo-controlled drive coupled to the slit, the servo-control being responsive to a detector for ion beam intensity at the target and controlling the angular position of the slit to control the detected ion beam intensity in accordance with a predetermined requirement.

Claim 5

A magazine for semiconductor wafers comprising a first chamber for housing a pack of the wafers, a second chamber for rehousing the pack and spaced apart from the first chamber, wafer transfer means for sequential transfer of wafers from the first chamber to the second chamber and means for allowing access of an ion beam to the surface of a wafer during its transfer between the chambers.

Claim 6

A magazine for semiconductor wafers comprising a first chamber for housing a pack of the wafers, a second chamber for rehousing the pack and spaced apart from the first chamber, wafer transfer means for sequential transfer of wafers from the first chamber to the second chamber and means for allowing access of an ion beam to the surface of a wafer during its transfer between the chambers.

Claim 7

A magazine for semiconductor wafers as claimed in claim 4, wherein the chambers comprise cassettes.

Claim 8

A magazine for semiconductor wafers as claimed in claim 4, wherein the chambers comprise spaced apart internal parts of the magazine.

Claim 9

A magazine for semiconductor wafers as claimed in claim 4, wherein the transfer of wafers takes place along a substantially rectilinear path and at a substantially constant linear velocity.

Claim 10

A magazine for semiconductor wafers as claimed in claim 4, wherein the velocity of a wafer is varied in accordance with variation in the intensity of the ion beam.

Claim 11

A magazine for semiconductor wafers as claimed in claim 4, wherein the carriers of the pack are connected to each other so that they can be folded in the manner of a fan.

Claim 12

A magazine for semiconductor wafers as claimed in claim 4 wherein the transfer means comprise a push-rod, or at least one rotary spindle with means for engaging the wafer-carriers.

Claim 13

An ion beam separator comprising a curved ion beam passageway, a deflection magnet for deflecting an ion beam injected into the passageway, Y scanning means, and a mass defining slit, the position of which is adjustable to select for onward transmission the ion beam of a predetermined ion mass determined by the deflection by the deflecting magnet and the position of the mass defining slit, the said Y scanning means being located adjacent the position where the ion beam exits from the influence of the deflecting magnet and between the said deflecting magnet and the mass defining slit, and the said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet.

Claim 14

An ion beam separator comprising a curved ion beam passageway, a deflection magnet for deflecting an ion beam injected into the passageway, Y scanning means, and a mass defining slit, the position of which is adjustable to select for onward transmission the ion beam of a predetermined ion mass determined by the deflection by the deflecting magnet and the position of the mass defining slit, the said Y scanning means being located adjacent the position where the ion beam exits from the influence of the deflecting magnet and between the said deflecting magnet and the mass defining slit, and the said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet.

Claim 15

An ion beam separator as claimed in claim 11, wherein the Y scanning means operate by electrostatic deflection of the ion beam.

Claim 16

An ion beam separator as claimed in claim 11, wherein to provide X scanning of the ion beam over a target material, the target material is moved at a controlled speed in the X direction through the ion beam emerging from the mass defining slit.

Claim 17

An ion beam separator as claimed in claim 11, wherein means is provided for detecting the intensity of the ion beam incident upon the target material and intensity control means, responsive to the detected intensity, are operative to control the detected ion beam intensity in accordance with a predetermined requirement.

Claim 18

An ion beam separator comprising a curved ion beam passageway, a deflecting magnet for deflecting an ion beam injected into the passageway, and Y scanning means located close to the region where the ion beam exits from the influence of the deflecting magnet, said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet, said separator further comprising means for detecting the intensity of the ion beam incident upon a target material, and speed control means, responsive to the detected intensity, for adjusting the speed of X scan to secure the required characteristics of implanted ion dose.

Claim 19

An ion beam separator comprising a curved ion beam passageway, a deflecting magnet for deflecting an ion beam injected into the passageway, and Y scanning means located close to the region where the ion beam exits from the influence of the deflecting magnet, said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet, said separator further comprising means for detecting the intensity of the ion beam incident upon a target material, and speed control means, responsive to the detected intensity, for adjusting the speed of X scan to secure the required characteristics of implanted ion dose.

Claim 20

An ion beam separator as claimed in claim 15, wherein X scan is provided by X scanning means, which operate by electrostatic deflection of the ion beam and are positioned to operate upon the ion beam as it exits from the mass defining slit.

Claim 21

An ion beam separator comprising a curved ion beam passage, a deflecting magnet for deflecting an ion beam injected into the passageway, and Y scanning means located close to the region where the ion beam exits from the influence of the deflecting magnet, said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet, said separator further comprising a beam width defining slit traversed by the ion beam prior to entry into the deflecting field of the said magnet, which slit is rotatable about an axis parallel with the beam height for adjusting the width of beam permitted to pass through the slit.

Claim 22

An ion beam separator comprising a curved ion beam passage, a deflecting magnet for deflecting an ion beam injected into the passageway, and Y scanning means located close to the region where the ion beam exits from the influence of the deflecting magnet, said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet, said separator further comprising a beam width defining slit traversed by the ion beam prior to entry into the deflecting field of the said magnet, which slit is rotatable about an axis parallel with the beam height for adjusting the width of beam permitted to pass through the slit.

Claim 23

An ion beam separator as claimed in claim 17, wherein the said axis of rotation of the slit is located centrally of the slit and on the centre line of the required beam path for injection into the magnet field.

Claim 24

An ion beam separator as claimed in claim 18, wherein there is provided a servo-controlled drive coupled to the slit, the servo-control being responsive to a detector for ion beam intensity at the target and controlling the angular position of the slit to tend to maintain constant the detected ion beam intensity, or to vary the detected ion beam intensity in accordance with a predetermined pattern.

Claim 25

An ion beam separator comprising a curved ion beam passageway, a deflecting magnet for deflecting an ion beam injected into the passageway, and Y scanning means located close to the region where the ion beam exits from the influence of the deflecting magnet, said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet, said separator further comprising a magazine for semiconductor wafers comprising a first chamber for housing a pack of the wafers, a second chamber for rehousing the pack and spaced apart from the first chamber, wafer transfer means for sequential transfer of wafers from the first chamber to the second chamber and means for allowing access of an ion beam to the surface of a wafer during its transfer between the chambers.

Claim 26

An ion beam separator comprising a curved ion beam passageway, a deflecting magnet for deflecting an ion beam injected into the passageway, and Y scanning means located close to the region where the ion beam exits from the influence of the deflecting magnet, said Y scanning means causing the ion beam to scan in a direction perpendicular to the plane in which the beam is deflected by the deflecting magnet, said separator further comprising a magazine for semiconductor wafers comprising a first chamber for housing a pack of the wafers, a second chamber for rehousing the pack and spaced apart from the first chamber, wafer transfer means for sequential transfer of wafers from the first chamber to the second chamber and means for allowing access of an ion beam to the surface of a wafer during its transfer between the chambers.

Claim 27

An ion beam separator as claimed in claim 20, wherein the chambers comprise cassettes.

Claim 28

An ion beam separator as claimed in claim 20, wherein the chambers comprise spaced apart internal parts of the magazine.

Claim 29

An ion beam separator as claimed in claim 20, wherein the transfer of wafers takes place along a substantially rectilinear path and at a substantially constant linear velocity.

Claim 30

An ion beam separator as claimed in claim 20, wherein the velocity of a wafer is varied in accordance with variation in the intensity of the ion beam.

Claim 31

An ion beam separator as claimed in claim 20, wherein the carriers of the pack are connected to each other so that they can be folded in the manner of a fan.

Claim 32

An ion beam separator as claimed in claim 20, wherein the transfer means comprise a push-rod, or at least one rotary spindle with means for engaging the wafer-carriers.