US4012832A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for non-destructive removal of semiconductor devices
Assignee: Unisys Corp
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Filing: 1976-03-12
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Granted: 1977-03-22
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Expires: 1996-03-12
Abstract
Abstract Semiconductor devices having a conductive lead pattern on the bottom of the device are bonded to conductive pads on a substrate to form an electrical connection therewith. The connection comprises two layers of conductive adhesive plastic separated by a small chip of conductive alloy which melts above the curing temperature of the adhesive plastic. The non-destructive removal of a semiconductor device from the substrate is accomplished by heating only the semiconductor device to be removed until the alloy chip under the device melts, thus, permitting the non-destructive removal of the semiconductor device without the application of force which would tend to destroy the semiconductor device.
Inventors
- 👤 John Reed Crane
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 09:05
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/30; H10W72/071; H10W72/072; H10W72/07231; H10W72/07236; H10W72/073; H10W72/07331; H10W72/20; H10W72/251; H10W72/252; H10W72/351; H10W72/353; H10W72/354; H10W72/381; H10W72/50; H10W72/531; H10W72/5363; H10W90/00; H10W90/701; H10W90/751; H10W90/756
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
111 words
The method of bonding semiconductor devices to a substrate or base to enable their non-destructive removal and replacement, comprising the steps of: providing a substrate having a conductive target pad thereon, applying a first conductive plastic layer over said conductive target pad, applying a conductive alloy chip over said first conductive plastic layer, applying a second conductive plastic layer over said conductive alloy chip, applying a semiconductor device over said second conductive plastic layer, and curing said first and said second conductive plastic layer at a temperature below the melting point of said conductive alloy chip to provide a semiconductive device conductively bonded to said conductive target pad on said substrate.
Claim 2
Independent Claim
111 words
The method of bonding semiconductor devices to a substrate or base to enable their non-destructive removal and replacement, comprising the steps of: providing a substrate having a conductive target pad thereon, applying a first conductive plastic layer over said conductive target pad, applying a conductive alloy chip over said first conductive plastic layer, applying a second conductive plastic layer over said conductive alloy chip, applying a semiconductor device over said second conductive plastic layer, and curing said first and said second conductive plastic layer at a temperature below the melting point of said conductive alloy chip to provide a semiconductive device conductively bonded to said conductive target pad on said substrate.
Claim 3
Dependent Claim
31 words
The method as set forth in claim 1 which further includes the step of heating said conductive alloy chip to its melting point and removing said semiconductor device from said substrate.
Claim 4
Dependent Claim
90 words
The method as set forth in claim 2 which further includes the steps of: removing from said substrate and said semiconductor device the remains of said conductive alloy chip, applying conductive plastic to said first conductive plastic layer, applying a new conductive alloy chip over said first conductive plastic layer, applying conductive plastic over said new conductive alloy chip, applying a semiconductor device over said conductive plastic on said new conductive alloy, and curing said conductive plastic at a temperature below the melting point of said new conductive alloy chip.
Claim 5
Dependent Claim
84 words
The method set forth in claim 2 which further includes the steps of: removing from said substrate and said semiconductor device said first and said second conductive plastic layers and the remains of said conductive alloy chip, applying new first and second conductive plastic layers and a new conductive alloy chip to said substrate, applying a new semiconductor device over said new second conductive layer, and curing said conductive plastic layers at a temperature below the melting point of said new conductive alloy chip.
Claim 6
Dependent Claim
88 words
The method as set forth in claim 1 which further includes the steps of: providing a package having a conductive base, applying a third conductive plastic layer over said base, applying a conductive alloy sheet over said third conductive plastic layer, applying a fourth conductive plastic layer over said conductive alloy sheet, applying said substrate containing said semiconductor device over said fourth conductive plastic layer, and curing said conductive plastic layers at a temperature below the melting point of said conductive alloy chip and said conductive alloy sheet.
Claim 7
Dependent Claim
30 words
The method as set forth in claim 5 which further includes the step of heating said conductive alloy sheet to its melting point and removing said substrate from said package.
Claim 8
Dependent Claim
47 words
The method as set forth in claim 6 which further includes the step of: heating an isolated area of said substrate to melt one of a plurality of conductive alloy chips on said substrate, and removing one of a plurality of the semiconductor devices from said substrate.
Claim 9
Dependent Claim
34 words
The method as set forth in claim 6 wherein the step of heating said conductive alloy sheet to its melting point includes raising the temperature of said conductive alloy chip below its melting point.
Claim 10
Dependent Claim
48 words
The method as set forth in claim 7 wherein said substrate contains a plurality of semiconductive devices thereon and the step of heating an isolated area of said substrate to melt one of a plurality of conductive alloy chips does not melt other alloy chips on said substrate.
Claim 11
Dependent Claim
46 words
The method as set forth in claim 7 wherein the step of melting said alloy sheet is accomplished in the range of 160° C to 170° C and the step of melting said alloy chip is accomplished in the range of 180° C to 190° C.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-03-21 | 1980-09-20 | 1981-03-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-03-21 | 1984-09-20 | 1985-03-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-03-21 | 1988-09-20 | 1989-03-22 | $7700.00 | Window Closed / Lapsed |