US4010318A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Probe forming electron optical column having means for examining magnified image of the probe source
Assignee: RCA Corp
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Filing: 1975-09-15
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Granted: 1977-03-01
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Expires: 1995-09-15
Abstract
Abstract An electron optical column apparatus, including a source of electrons, is operable in either a setup or a probe mode. In the setup mode, the electron source is magnified in an image plane for examination of the source by a Faraday cup prior to operation of the column in the probe mode. In the probe mode, the electron source is demagnified on an object surface, for example, for recording video signals on a record medium.
Inventors
- 👤 George Herbert Needham Riddle
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 13:02
CPC Classifications
H; H01; H01J; H01J31/00; H01J31/08; G; G11; G11B; G11B11/00; G11B11/03; H01J37/00; H01J37/30; H01J37/3002; H01J37/3007
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
228 words
A dual mode electron optical column apparatus operable in either a probe or a setup mode comprising: 1. a source of providing a beam of electrons along a path toward an object surface to be probed; 2. means for providing a demagnified image of the source on the object surface when the electron optical column apparatus is in the probe mode; 3. means for providing a magnified image of the source in an image plane when the electron optical column apparatus is in the setup mode; 4. means, including sampling means selectively subject to location in the image plane in the path of the electron beam and subject to removal from the path, for determining the current density of the portion of the magnified image which is intercepted by the sampling means when the sampling means is located in the image plane in the path of the electron beam while the electron optical column apparatus is in the setup mode; and 5. means for varying the position of the magnified image of the source in the image plane relative to the sampling means while the sampling means is located in the path of the electron beam to permit determination of the current distribution of the magnified image by the current density determining means as various portions of the magnified image are, a seriatim, intercepted by the sampling means.
Claim 2
Dependent Claim
228 words
A dual mode electron optical column apparatus operable in either a probe or a setup mode comprising: 1. a source of providing a beam of electrons along a path toward an object surface to be probed; 2. means for providing a demagnified image of the source on the object surface when the electron optical column apparatus is in the probe mode; 3. means for providing a magnified image of the source in an image plane when the electron optical column apparatus is in the setup mode; 4. means, including sampling means selectively subject to location in the image plane in the path of the electron beam and subject to removal from the path, for determining the current density of the portion of the magnified image which is intercepted by the sampling means when the sampling means is located in the image plane in the path of the electron beam while the electron optical column apparatus is in the setup mode; and 5. means for varying the position of the magnified image of the source in the image plane relative to the sampling means while the sampling means is located in the path of the electron beam to permit determination of the current distribution of the magnified image by the current density determining means as various portions of the magnified image are, a seriatim, intercepted by the sampling means.
Claim 3
Dependent Claim
68 words
A dual mode electron optical apparatus as defined in claim 1 further including: 1. a platform for movably carrying a storage medium having a layer of electron beam sensitive material; and 2. means for intermittently blanking the electron beam in accordance with the signal to be recorded on the storage medium for selectively exposing the electron beam sensitive layer when the column apparatus is in the probe mode.
Claim 4
Dependent Claim
62 words
A dual mode electron optical column apparatus as defined in claim 2 wherein the platform rotatably carries the storage medium, and wherein the apparatus further includes means for moving the platform relative to the electron beam radially of the storage medium in order to record along a spiral track on the storage medium when the column apparatus is in the probe mode.
Claim 5
Dependent Claim
98 words
A dual mode electron optical column apparatus as defined in claim 1 wherein the means for providing a magnified image of the electron source when the column is in the setup mode comprises a first lens and a second lens; wherein the means for providing a demagnified image of the electron source when the column is in the probe mode comprises the second lens and a third lens; wherein the first lens is inoperative when the column is in the probe mode; and wherein the third lens is inoperative when the column apparatus is in the setup mode.
Claim 6
Dependent Claim
37 words
A dual mode electron optical column apparatus as defined in claim 4 wherein the focal length of the second lens, being operative in both the setup mode and the probe mode, is the same in both modes.
Claim 7
Dependent Claim
26 words
A dual mode electron optical column apparatus as defined in claim 1 further including means for adjusting the source to permit modification of the source characteristics.
Claim 8
Dependent Claim
35 words
A dual mode electron optical column apparatus as defined in claim 6, wherein the sampling means comprises a Faraday cup having an entrance window for sampling a portion of the magnified image of the source.
Claim 9
Dependent Claim
44 words
A dual mode electron optical column apparatus as defined in claim 7 wherein the position varying means sweeps the magnified image of the source across the entrance window in a television raster manner while the electron optical column apparatus is in the setup mode.
Claim 10
Dependent Claim
69 words
A dual mode electron optical column apparatus as defined in claim 8 wherein the current density determining means further includes a cathode ray display tube, and wherein the brightness of an image displayed on he cathode ray tube is derived from the output of the Faraday cup for visual display of the shape and quality of the source while the electron optical column apparatus is in the setup mode.
Claim 11
Dependent Claim
99 words
A dual mode electron optical column apparatus as defined in claim 8 wherein the current density determining means further includes a cathode ray display tube, wherein the vertical deflection of the luminescent spot on the screen of the cathode ray display tube is derived from the output of the Faraday cup, and wherein the horizontal deflection of the luminescent spot on the screen of the cathode ray display tube is correlated to the position of the magnified image with respect to the sampling window of the Faraday cup while the electron optical column apparatus is in the setup mode.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-02-29 | 1980-08-30 | 1981-03-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-02-29 | 1984-08-30 | 1985-03-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-02-29 | 1988-08-30 | 1989-03-01 | $7700.00 | Window Closed / Lapsed |