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US4008602A Expired / Lapsed US ⏱️ 0.0 years remaining

Ultrasonic testing of multilayer ceramic capacitors

Assignee: Kemet Electronics Corp
•
Filing: 1973-10-22
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Granted: 1977-02-22
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Expires: 1993-10-22
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Abstract

Abstract Ultrasonic testing method for detecting detrimental internal voids in ceramic capacitors.

Inventors

  • 👤 Gordon R. Love

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 17:40
CPC Classifications
G; G01; G01N; G01N29/00; G01N29/04; G01N29/11; G01N2291/00; G01N2291/02; G01N2291/023; G01N2291/0231

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 199 words
A method of determining the presence of detrimental void defects in a multilayer ceramic capacitor body having a pair of parallel opposed surfaces and having a plurality of planar metal electrodes, the planar surfaces of said metal electrodes being arranged parallel to said parallel opposed surfaces and separated by and completely enclosed within ceramic dielectric said method comprising transmitting ultrasonic energy at a selected ultrasonic frequency into a fired ceramic capacitor body having from about 5 to 100 planar parallel metal electrodes, said electrodes being from about 2 to 10 microns thick and separated from each other by about 15 to 100 microns of ceramic, the direction of said ultrasonic energy being substantially perpendicular to a surface of said capacitor body and to said planar metal electrodes; detecting a portion of said ultrasonic energy which passes through said metal electrodes and said ceramic dielectric and emerges from said capacitor body; and comparing the magnitude of said portion of ultrasonic with a predetermined magnitude to provide an indication of the presence in said capacitor body of a detrimental void defect having a dimension parallel to said electrodes as small as 100 microns and a thickness as small as 5 microns.
Claim 2
Independent Claim 199 words
A method of determining the presence of detrimental void defects in a multilayer ceramic capacitor body having a pair of parallel opposed surfaces and having a plurality of planar metal electrodes, the planar surfaces of said metal electrodes being arranged parallel to said parallel opposed surfaces and separated by and completely enclosed within ceramic dielectric said method comprising transmitting ultrasonic energy at a selected ultrasonic frequency into a fired ceramic capacitor body having from about 5 to 100 planar parallel metal electrodes, said electrodes being from about 2 to 10 microns thick and separated from each other by about 15 to 100 microns of ceramic, the direction of said ultrasonic energy being substantially perpendicular to a surface of said capacitor body and to said planar metal electrodes; detecting a portion of said ultrasonic energy which passes through said metal electrodes and said ceramic dielectric and emerges from said capacitor body; and comparing the magnitude of said portion of ultrasonic with a predetermined magnitude to provide an indication of the presence in said capacitor body of a detrimental void defect having a dimension parallel to said electrodes as small as 100 microns and a thickness as small as 5 microns.
Claim 3
Dependent Claim 278 words
Method for determining the presence of detrimental void defects in a multilayer ceramic capacitor body having a pair of parallel opposed surfaces and having a plurality of planar metal electrodes, the planar surfaces of said metal electrodes being arranged parallel to said parallel opposed surfaces and separated by and completely enclosed within ceramic dielectric said method comprising transmitting a pulse of ultrasonic energy at a selected ultrasonic frequency into a fired ceramic capacitor body having from about 5 to 100 planar parallel metal electrodes, said electrodes being from about 2 to 10 microns thick and separated from each other by about 15 to 100 microns of ceramic, the direction of said transmitted ultrasonic energy being substantially perpendicular both to one of said pair of parallel opposed surfaces of the multilayer ceramic capacitor body and to said planar metal electrodes to provide a reflection pulse of ultrasonic energy from the location where said transmitted pulse of ultrasonic energy leaves said multilayer ceramic capacitor body at said other parallel opposed surface of said ceramic capacitor body, said reflection pulse being reflected back along substantially the same direction as the transmitted pulse, detecting said reflection pulse after said reflection pulse exits said ceramic capacitor body at the surface where said transmitted pulse entered said capacitor body, and comparing the magnitude of said reflection pulse with a predetermined magnitude corresponding to a reflection pulse for a void-free capacitor body, reflection pulse magnitude less than said predetermined to provide an indication of the presence in said capacitor body of a detrimental void defect having a dimension parallel to said electrodes as small as 100 microns and a thickness as small as 5 microns.
Claim 4
Dependent Claim 278 words
Method for determining the presence of detrimental void defects in a multilayer ceramic capacitor body having a pair of parallel opposed surfaces and having a plurality of planar metal electrodes, the planar surfaces of said metal electrodes being arranged parallel to said parallel opposed surfaces and separated by and completely enclosed within ceramic dielectric said method comprising transmitting a pulse of ultrasonic energy at a selected ultrasonic frequency into a fired ceramic capacitor body having from about 5 to 100 planar parallel metal electrodes, said electrodes being from about 2 to 10 microns thick and separated from each other by about 15 to 100 microns of ceramic, the direction of said transmitted ultrasonic energy being substantially perpendicular both to one of said pair of parallel opposed surfaces of the multilayer ceramic capacitor body and to said planar metal electrodes to provide a reflection pulse of ultrasonic energy from the location where said transmitted pulse of ultrasonic energy leaves said multilayer ceramic capacitor body at said other parallel opposed surface of said ceramic capacitor body, said reflection pulse being reflected back along substantially the same direction as the transmitted pulse, detecting said reflection pulse after said reflection pulse exits said ceramic capacitor body at the surface where said transmitted pulse entered said capacitor body, and comparing the magnitude of said reflection pulse with a predetermined magnitude corresponding to a reflection pulse for a void-free capacitor body, reflection pulse magnitude less than said predetermined to provide an indication of the presence in said capacitor body of a detrimental void defect having a dimension parallel to said electrodes as small as 100 microns and a thickness as small as 5 microns.
Claim 5
Dependent Claim 51 words
Method in accordance with claim 2 wherein a sequence of ultrasonic pulses are transmitted through said face of said capacitor body, said pulses being directed so as to substantially completely traverse said capacitor body at intervals less than a predetermined maximum tolerable void dimension to provide a traverse of reflection pulses.
Claim 6
Dependent Claim 58 words
Method in accordance with claim 3 wherein the reflection pulses obtained for each of said transmitted pulses are converted into corresponding electrical signals, each of said signals corresponding to ultrasonic reflection pulses having a magnitude less than said predetermined magnitude being adapted to provide an electrical indication of the presence of a void defect in said capacitor body.
Claim 7
Dependent Claim 52 words
A method in accordance with claim 4 wherein said electrical signals are converted into a visual display corresponding to said traverse of reflection pulses wherein the display of electrical signals corresponding to reflection pulse having a magnitude less than said predetermined magnitude are visually distinguishable from the display of the other pulses.
Claim 8
Dependent Claim 20 words
A method in accordance with claim 5 wherein said visual display is in the form of a permanent chart record.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1980-02-22 1980-08-23 1981-02-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1984-02-22 1984-08-23 1985-02-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1988-02-22 1988-08-23 1989-02-22 $7700.00 Window Closed / Lapsed

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