Complementary field effect transistor sense amplifier for one transistor per bit ram cell

Claim 2

A semiconductor random access memory comprising: a storage array including a plurality of storage cells; a first sense-write conductor coupled to a plurality of said storage cells for receiving data from and transferring data into any one of said storage cells when said one of said storage cells is selected, all of said storage cells including only field effect transistors of the same conductivity type; decode circuit means coupled to a plurality of said storage cells including one of said storage cells connected to said sense-write conductor for selecting storage cells coupled to said decode means by means of a first selection conductor; sense amplifier circuit means coupled to said first sense-write conductor for amplifying a sense signal imparted to said sense-write conductor by said selected storage cell and isolating said sense-write conductor so that it is electrically floating at times other than during a read operation or a write operation, and said sense amplifier circuit means including both P-channel and N-channel field effect transistors.

Claim 3

The semiconductor random access memory as recited in claim 1 wherein each of said storage cells comprises a MOSFET having its drain connected to a sense-write conductor, its gate connected to a selection conductor, and its source connected to one terminal of a storage capacitor having its other terminal connected to a common voltage conductor.

Claim 4

The semiconductor random access memory as recited in claim 1 including a second sense-write conductor coupled to a plurality of storage cells which are not connected to said first sense-write conductor or said first selection conductor, said second sense-write conductor also being coupled to said sense amplifier circuit means.

Claim 5

The semiconductor random access memory as recited in claim 3 further including a first dummy storage cell connected to said first sense-write conductor and a second dummy storage cell connected to said second sense-write conductor.

Claim 6

The semiconductor random access memory as recited in claim 4 wherein each of said dummy storage cells includes a MOSFET having its drain connected to a sense-write conductor, its gate connected to a dummy storage cell selection conductor, and its source connected to a storage capacitor having its other terminal connected to said common voltage conductor.

Claim 7

The semiconductor random access memory as recited in claim 3 further including sense-write conductor balancing circuit means coupled between said first and second sense-write conductors for equalizing potentials on said first and second sense-write conductors prior to selection of one of said storage cells in said semiconductor random access memory and then effectively isolating said first and second sense-write conductors from each other prior to imparting a signal to the one of said first and second sense-write conductors from said selected one of said storage cells, said sense-write conductor balancing circuit means including at least one N-channel field effect transistor and one P-channel field effect transistor.

Claim 8

The semiconductor random access memory as recited in claim 6 wherein said sense-write conductor balancing circuit means includes a P channel field effect transistor and an N channel field effect transistor coupled in parallel between said first sense-write conductor and said second sense-write conductor.

Claim 9

The semiconductor random access memory as recited in claim 7 further including clock means for providing a clock signal on a first clock conductor and a complementary clock signal on a second clock conductor, said first clock conductor being connected to the gate of said N channel field effect transistor and said second clock conductor being connected to the gate of said P channel field effect transistor.

Claim 10

The semiconductor random access memory as recited in claim 6 wherein said sense amplifier circuit means comprises cross coupled regenerative circuit means coupled to said first and second sense-write conductors for detecting a voltage difference between said first and second sense-write conductors representative of a sensed stored state of a selected storage cell and regeneratively assuming a state representative of said sensed stored state and amplifying a voltage representative of said sensed stored state on said sense-write conductor, said cross coupled regenerative circuit means including both P-channel field effect transistors and N-channel field effect transistors.

Claim 11

The semiconductor random access memory as recited in claim 9 wherein said isolation circuit means includes a first P channel field effect transistor having its drain connected to said first sense-write conductor, a second N channel field effect transistor having its drain connected to said first sense-write conductor, a third P channel field effect transistor having its drain connected to said first sense-write conductor, a third P channel field effect transistor having it drain connected to said second sense-write conductor and a fourth N channel field effect transistor having its drain connected to said second sense-write conductor, the gates of said first clock conductor and the gates of said second and fourth field effect transistors are connected to said second clock conductor, the source electrodes of said first and third field effect transistors being connected to said regenerative circuit means, said source electrodes of said second and fourth field effect transistors also being connected to said regenerative circuit means.

Claim 12

The semiconductor random access memory as recited in claim 9 wherein said sense amplifier circuit means comprises isolation circuit means coupled to said first and second sense-write conductors for isolating, respectively, said first and second sense-write conductors during said equalization of potential of said first and second sense-write conductors by means of said sense-write conductor balancing circuit means and coupling said first and second sense-write conductors to said cross coupled regenerative circuit means during sensing of a voltage representative of a sensed stored state, said isolation circuit means including both P-channel field effect transistor and N-channel field effect transistors.

Claim 13

The semiconductor random access memory as recited in claim 11 wherein said cross-coupled regenerative circuit means includes first and second P channel field effect transistors having their source electrodes coupled, respectively, to a second voltage conductor and third and fourth N channel field effect transistors having their source electrodes connected, respectively, to said common voltage conductor, the gate electrodes of said first and third field effect transistors being coupled to said second sense-write conductor and the gates of said second and fourth field effect transistors being coupled to said first sense-write conductor, the source electrodes of said first, second, third and fourth field effect transistors all being coupled, respectively, to said isolation circuit means.

Claim 14

A MOS semiconductor random access memory including first and second arrays of one-transistor storage cells arranged in rows and columns, all of said transistors being of the same conductivity type, each row of said one-transistor storage cells being coupled, respectively, to a connon sense-write conductor each column of said one-transistor storage cells being coupled, respectively, to a column selection conductor, a plurality of sense amplifiers, one for each row, each of said sense amplifiers coupled, respectively, between said sense-write conductor of one of said rows of said first array and a corresponding sense-write conductor of said one of said rows of said second array, a dummy storage cell connected, respectively, to each of said sense-write conductors of said MOS semiconductor random access memory, one of said sense amplifiers comprising: complementary sense-write conductor balance circuit means coupled between first and second ones of said sense-write conductors for equalizing potentials on said first and second sense-write conductors prior to selection of one of said storage cells in said semiconductor random access memory and then effectively isolating said first and second sense-write conductors from each other prior to imparting a signal to the one of said first and second sense-write conductors from said selected one of said storage cells; complementary cross-coupled regenerative circuit means coupled to said first and second sense-write conductors for detecting a voltage difference between said first and second sense-write conductors representative of a sensed stored state of a selected storage cell and regeneratively assuming a state representative of said sensed stored state and amplifying a voltage representative of said sensed stored state on said sense-write conductor; and complementary isolation circuit means coupled to said first and second sense-write conductors for effectively isolating, respectively, said first and second sense-write conductors during said equalization of potential on said first and second sense-write conductors during said equalization of potential on said first and second sense-write conductors by means of said complementary sense-write conductor balance circuit means during sensing of a voltage representative of said sensed stored state.

Claim 15

A MOS semiconductor random access memory including first and second arrays of one-transistor storage cells arranged in rows and columns, all of said transistors being of the same conductivity type, each row of said one-transistor storage cells being coupled, respectively, to a connon sense-write conductor each column of said one-transistor storage cells being coupled, respectively, to a column selection conductor, a plurality of sense amplifiers, one for each row, each of said sense amplifiers coupled, respectively, between said sense-write conductor of one of said rows of said first array and a corresponding sense-write conductor of said one of said rows of said second array, a dummy storage cell connected, respectively, to each of said sense-write conductors of said MOS semiconductor random access memory, one of said sense amplifiers comprising: complementary sense-write conductor balance circuit means coupled between first and second ones of said sense-write conductors for equalizing potentials on said first and second sense-write conductors prior to selection of one of said storage cells in said semiconductor random access memory and then effectively isolating said first and second sense-write conductors from each other prior to imparting a signal to the one of said first and second sense-write conductors from said selected one of said storage cells; complementary cross-coupled regenerative circuit means coupled to said first and second sense-write conductors for detecting a voltage difference between said first and second sense-write conductors representative of a sensed stored state of a selected storage cell and regeneratively assuming a state representative of said sensed stored state and amplifying a voltage representative of said sensed stored state on said sense-write conductor; and complementary isolation circuit means coupled to said first and second sense-write conductors for effectively isolating, respectively, said first and second sense-write conductors during said equalization of potential on said first and second sense-write conductors during said equalization of potential on said first and second sense-write conductors by means of said complementary sense-write conductor balance circuit means during sensing of a voltage representative of said sensed stored state.