US4001860A
Expired / Lapsed
US
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Double diffused metal oxide semiconductor structure with isolated source and drain and method
Assignee: Signetics Corp
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Filing: 1975-08-04
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Granted: 1977-01-04
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Expires: 1995-08-04
Abstract
Abstract Metal oxide semiconductor structure having precisely grown channel with the source and drain isolated from each other by a PN junction. In the method, a double diffusion is carried out through the same opening in an oxide or insulating layer to obtain a very narrow precise channel region with minimum spreading and which can be utilized with a P-type substrate to provide PN isolation between the source and drain.
Inventors
- 👤 Thomas P. Cauge
- 👤 Joseph Kocsis
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 15:34
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/64; H10D30/65; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10W; H10W10/00; H10W10/01; H10W10/031; H10W10/30
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
365 words
In a metal insulator semiconductor structure, a semiconductor body of one conductivity type, an epitaxially grown layer of semiconductor material of uniform thickness ranging from 1-3 microns carried by the semiconductor body and being of opposite conductivity type so that there is a first PN junction between said body and said layer, said layer having a substantially planar surface, a layer of insulating material disposed on said surface, a first diffused region of said one conductivity type formed in and extending through said layer of semiconductor material and being defined by a second PN junction which extends from said surface through said layer of semiconductor material and down to said semiconductor body, said first region surrounding a portion of said layer to define a predetermined region and in such a manner so that said predetermined region gradually increases in width in cross-section as the predetermined region increases in depth and so that the bottom of the predetermined region is defined by said first PN junction and the sides are defined by said second PN junction, said predetermined region underlying a predetermined closed area on said surface, a second region of opposite conductivity type formed in said first region to a depth substantially less than the depth of the first region and being defined by a third PN junction which extends to the surface, said second region being in close proximity to the outer margin of the closed area and extending laterally in a direction away from the predetermined region, said second and third PN junctions serving to define a of to precise length underlying said predetermined closed area, a third region of opposite conductivity type formed in said predetermined region and extending to said surface in said predetermined region and spaced from said first region, gate metallization disposed on said layer of insulating material and overlying said channel, source contact metallization extending through said layer of insulating material and making contact with said second region, and drain contact metallization extending through said layer of insulating material and making contact with said third region, said source and drain contact metallization being isolated from each other and the semiconductor body by said first and second PN junctions.
Claim 2
Dependent Claim
365 words
In a metal insulator semiconductor structure, a semiconductor body of one conductivity type, an epitaxially grown layer of semiconductor material of uniform thickness ranging from 1-3 microns carried by the semiconductor body and being of opposite conductivity type so that there is a first PN junction between said body and said layer, said layer having a substantially planar surface, a layer of insulating material disposed on said surface, a first diffused region of said one conductivity type formed in and extending through said layer of semiconductor material and being defined by a second PN junction which extends from said surface through said layer of semiconductor material and down to said semiconductor body, said first region surrounding a portion of said layer to define a predetermined region and in such a manner so that said predetermined region gradually increases in width in cross-section as the predetermined region increases in depth and so that the bottom of the predetermined region is defined by said first PN junction and the sides are defined by said second PN junction, said predetermined region underlying a predetermined closed area on said surface, a second region of opposite conductivity type formed in said first region to a depth substantially less than the depth of the first region and being defined by a third PN junction which extends to the surface, said second region being in close proximity to the outer margin of the closed area and extending laterally in a direction away from the predetermined region, said second and third PN junctions serving to define a of to precise length underlying said predetermined closed area, a third region of opposite conductivity type formed in said predetermined region and extending to said surface in said predetermined region and spaced from said first region, gate metallization disposed on said layer of insulating material and overlying said channel, source contact metallization extending through said layer of insulating material and making contact with said second region, and drain contact metallization extending through said layer of insulating material and making contact with said third region, said source and drain contact metallization being isolated from each other and the semiconductor body by said first and second PN junctions.
Claim 3
Dependent Claim
33 words
A structure as in claim 1 wherein said semiconductor body is a form of silicon, said layer of semiconductor material is a form of silicon and wherein said insulating layer is silicon dioxide.
Claim 4
Dependent Claim
26 words
A structure as in claim 1 wherein said semiconductor body has a P-type impurity therein and said layer of semiconductor material has an N-type impurity therein.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-01-04 | 1980-07-05 | 1981-01-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-01-04 | 1984-07-05 | 1985-01-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-01-04 | 1988-07-05 | 1989-01-04 | $7700.00 | Window Closed / Lapsed |