US3996468A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electron microscope aperture system
Assignee: National Aeronautics and Space Administration
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Filing: 1973-07-23
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Granted: 1976-12-07
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Expires: 1993-07-23
Abstract
Abstract An electron microscope including an electron source, a condenser lens having either a circular aperture for focusing a solid cone of electrons onto a specimen or an annular aperture for focusing a hollow cone of electrons onto the specimen, and an objective lens having an annular objective aperture, for focusing electrons passing through the specimen onto an image plane. The invention also entails a method of making the annular objective aperture using electron imaging, electrolytic deposition and ion etching techniques.
Inventors
- 👤 with respect to an invention of Fletcher James C. Administrator of the National Aeronautics and Space Administration
- 👤 Klaus Heinemann
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 11:57
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/261; H01J37/263; H01J37/02; H01J37/04; H01J37/153; H01J2237/00; H01J2237/22; H01J2237/226; H01J2237/26; H01J2237/2614
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
98 words
In an improved electron optical system of the type having an electron source for generating an electron stream, condenser means for focusing said electron stream onto a specimen, a condenser aperture for guiding the electron stream onto the specimen, and an objective lens for focusing said electron stream onto an image plane, wherein the improvement comprises an objective aperture plate having an annular aperture as the only opening therein for limiting the number of electrons which can intersect the said image plane to only that fraction which has passed the said objective lens in the same lens zone.
Claim 2
Dependent Claim
98 words
In an improved electron optical system of the type having an electron source for generating an electron stream, condenser means for focusing said electron stream onto a specimen, a condenser aperture for guiding the electron stream onto the specimen, and an objective lens for focusing said electron stream onto an image plane, wherein the improvement comprises an objective aperture plate having an annular aperture as the only opening therein for limiting the number of electrons which can intersect the said image plane to only that fraction which has passed the said objective lens in the same lens zone.
Claim 3
Dependent Claim
23 words
The optical system of claim 1 wherein the objective aperture plate is located in the back focal plane of the said objective lens.
Claim 4
Dependent Claim
23 words
The optical system of claim 1 adapted for dark field operation wherein the condenser means includes a condenser lens having a circular aperture.
Claim 5
Dependent Claim
23 words
The optical system of claim 1 adapted for bright field operation wherein the condenser means includes a condenser lens having an annular aperture.
Claim 6
Dependent Claim
91 words
An electron optical system, comprising: an electron source for developing an electron stream; a condenser lens for focusing said electron stream onto a specimen; a condenser aperture for guiding the electron stream onto the said specimen; an objective lens for focusing said electron stream onto an image plane; an annular objective aperture plate having an annular aperture as the only opening therein for limiting the number of electrons which can intersect the said image plane to only that fraction which has passed the said objective lens in the same lens zone.
Claim 7
Dependent Claim
91 words
An electron optical system, comprising: an electron source for developing an electron stream; a condenser lens for focusing said electron stream onto a specimen; a condenser aperture for guiding the electron stream onto the said specimen; an objective lens for focusing said electron stream onto an image plane; an annular objective aperture plate having an annular aperture as the only opening therein for limiting the number of electrons which can intersect the said image plane to only that fraction which has passed the said objective lens in the same lens zone.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-12-07 | 1980-06-07 | 1980-12-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-12-07 | 1984-06-07 | 1984-12-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-12-07 | 1988-06-07 | 1988-12-07 | $7700.00 | Window Closed / Lapsed |