US3985444A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Highly sensitive process for measuring fine deformation
Assignee: Canon Inc
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Filing: 1974-09-19
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Granted: 1976-10-12
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Expires: 1994-09-19
Abstract
Abstract A highly sensitive process for measuring fine deformation comprises a stage of illumination with beam to on a periodic structure having diffractive function as well as lacking in diffractive function, a stage of selecting wave of diffraction order having conjugate or nearly conjugate relation among diffracted wave fronts projected from the periodic structure by means of said illumination with beam so as to cause mutual interference, thus, the amount of deformation is measured by the interference fringe formed by said mutual interference when the basic period of periodic structure is displaced or periodic structure is deformed.
Inventors
- 👤 Matsuo Takashima
- 👤 Minoru Ohtsuka
- 👤 Kazuya Matsumoto
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 16:18
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/16; G01B11/165
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
113 words
A process for measuring fine deformation comprising the steps of: deforming a test object having a periodic structure on its surface, subjecting the periodic structure of the test object to illumination with incoherent light recording the deformed periodic structure on a recording medium to obtain a recorded object having a deformed periodic structural pattern, illuminating said object recorded with incoherent light, with a coherent beam so as to obtain a plurality of diffracted beams, directing two diffracted beams from among the plurality of diffracted beams onto an interference surface so as to form an interference fringe pattern, and detecting the deformation of the test object on the basis of the interference fringe pattern.
Claim 2
Dependent Claim
113 words
A process for measuring fine deformation comprising the steps of: deforming a test object having a periodic structure on its surface, subjecting the periodic structure of the test object to illumination with incoherent light recording the deformed periodic structure on a recording medium to obtain a recorded object having a deformed periodic structural pattern, illuminating said object recorded with incoherent light, with a coherent beam so as to obtain a plurality of diffracted beams, directing two diffracted beams from among the plurality of diffracted beams onto an interference surface so as to form an interference fringe pattern, and detecting the deformation of the test object on the basis of the interference fringe pattern.
Claim 3
Dependent Claim
15 words
The process according to claim 1, wherein said detecting step includes photographing said diffraction fringe.
Claim 4
Dependent Claim
137 words
A process for measuring deformation comprising the step of; deforming a test object having a periodic structure on its surface, subjecting the periodic structure of the test object to illumination with incoherent light recording the deformed periodic structure on a recording medium to obtain a recorded object having a deformed periodic structural pattern, illuminating the recorded object by means of two coherent beams so as to obtain one group of diffraction beams from one of said two coherent beams and another group of diffraction beams from the other coherent beam, directing one diffracted beam selected from the one group and another diffracted beam selected from the other group to an interference surface so as to obtain an interference fringe pattern on the interference surface, and detecting the deformation of the test object from the interference fringe pattern.
Claim 5
Dependent Claim
137 words
A process for measuring deformation comprising the step of; deforming a test object having a periodic structure on its surface, subjecting the periodic structure of the test object to illumination with incoherent light recording the deformed periodic structure on a recording medium to obtain a recorded object having a deformed periodic structural pattern, illuminating the recorded object by means of two coherent beams so as to obtain one group of diffraction beams from one of said two coherent beams and another group of diffraction beams from the other coherent beam, directing one diffracted beam selected from the one group and another diffracted beam selected from the other group to an interference surface so as to obtain an interference fringe pattern on the interference surface, and detecting the deformation of the test object from the interference fringe pattern.
Claim 6
Dependent Claim
66 words
The process according to claim 3, wherein one of said coherent beams is incident on the diffraction grating at an angle of incidence θ; the other of said coherent beams is incident on said diffraction grating at an angle of incidence -θ; and wherein said diffraction fringe is formed by the n th and the -n th order diffraction beams formed by said respective coherent beams.
Claim 7
Independent Claim
104 words
A system for measuring deformation comprising a first and a second sub-system, the first sub-system including an image forming optical system to subject a body having a periodic structure to illumination with incoherent light and to form an image of the body on a recording medium so as to form a diffraction grating, the second sub-system comprising: means for holding the recorded image obtained by means of the first sub-system, coherent means for illuminating the recorded image being held, and a detection-observation system for simultaneous observation of two diffracted beams chosen out of a plural number of diffracted beams, obtained from said recorded image,
Claim 8
Independent Claim
104 words
A system for measuring deformation comprising a first and a second sub-system, the first sub-system including an image forming optical system to subject a body having a periodic structure to illumination with incoherent light and to form an image of the body on a recording medium so as to form a diffraction grating, the second sub-system comprising: means for holding the recorded image obtained by means of the first sub-system, coherent means for illuminating the recorded image being held, and a detection-observation system for simultaneous observation of two diffracted beams chosen out of a plural number of diffracted beams, obtained from said recorded image,
Claim 9
Dependent Claim
39 words
A system for measuring deformation according to claim 5, characterized in that the means for holding the recorded image, of the second sub system includes a rotating means to enable the rotation of the recorded image in a plane.
Claim 10
Independent Claim
129 words
A system for measuring deformation characterized in that said system comprises a first and second sub-system, whereby the first sub-system comprises an image forming optical means to subject a body having a periodic structure to illumination with incoherent light and to form an image of the body on a recording medium, while the second sub-system comprises: a holding means for holding the recorded image obtained by means of the first sub-system, said image forming a diffraction grating, means for producing first and second coherent beams illuminating the recorded object at different angles, and a detection - observation system by means of which the n th order diffracted beam produced by the first coherent beam, and the -n th order diffracted beam produced by the second coherent beam are isolated.
Claim 11
Independent Claim
129 words
A system for measuring deformation characterized in that said system comprises a first and second sub-system, whereby the first sub-system comprises an image forming optical means to subject a body having a periodic structure to illumination with incoherent light and to form an image of the body on a recording medium, while the second sub-system comprises: a holding means for holding the recorded image obtained by means of the first sub-system, said image forming a diffraction grating, means for producing first and second coherent beams illuminating the recorded object at different angles, and a detection - observation system by means of which the n th order diffracted beam produced by the first coherent beam, and the -n th order diffracted beam produced by the second coherent beam are isolated.
Claim 12
Dependent Claim
32 words
A system for measuring deformation according to claim 7, characterized in that the means for producing the first and the second coherent beams of the second sub-system includes a single light source.
Claim 13
Dependent Claim
28 words
A system for measuring deformation according to claim 7, including means for adjusting the incident angles of the first and the second coherent beams of the second sub-system.
Claim 14
Dependent Claim
67 words
A system for measuring deformation according to claim 7, characterized in that the holding means for holding the recorded image of the second sub-system includes means for rotating the recorded image in a plane by means of which the recorded image, after having being illuminated by said two coherent beams in first position can be illuminated by said beams in another position different than said first position.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-10-12 | 1980-04-12 | 1980-10-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-10-12 | 1984-04-12 | 1984-10-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-10-12 | 1988-04-12 | 1988-10-12 | $7700.00 | Window Closed / Lapsed |