US3978338A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Illumination system in a scanning electron microscope
Assignee: Jeol Ltd
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Filing: 1975-04-07
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Granted: 1976-08-31
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Expires: 1995-04-07
Abstract
Abstract A scanning electron microscope comprising a double gap lens in its electron beam irradiating system. The double gap lens is arranged between the electron gun and the final stage condenser lens, and is excited by a lens current such that a large change of electron beam diameter may be controlled by a small change of lens excitation current.
Inventors
- 👤 Katsuyoshi Ueno
- 👤 Hirotami Koike
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 20:17
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
183 words
An illumination system for directing an electron beam from a source to produce a very fine beam diameter spot on a specimen, said system useful in a scanning electron microscope or the like, comprising a first lens having a plurality of pole gaps in a single magnetic circuit; and at least one independent lens; said first lens and at least one independent lens positioned along the beam path between the source and specimen, said first lens being nearer said source than said at least one independent lens; said first lens and at least one independent lens having in combination an excitation current-beam diameter at specimen curve wherein an excitation of the first lens is increased the beam diameter decreases somewhat and then diverges and thereafter in a highly sensitive mode with a very small increase in excitation current beam diameter decreases rapidly to a very fine diameter and, means for supplying sufficient excitation current to said first lens to operate said system in the highly sensitive mode such that a small variation in excitation current results in a large variation in beam diameter.
Claim 2
Dependent Claim
183 words
An illumination system for directing an electron beam from a source to produce a very fine beam diameter spot on a specimen, said system useful in a scanning electron microscope or the like, comprising a first lens having a plurality of pole gaps in a single magnetic circuit; and at least one independent lens; said first lens and at least one independent lens positioned along the beam path between the source and specimen, said first lens being nearer said source than said at least one independent lens; said first lens and at least one independent lens having in combination an excitation current-beam diameter at specimen curve wherein an excitation of the first lens is increased the beam diameter decreases somewhat and then diverges and thereafter in a highly sensitive mode with a very small increase in excitation current beam diameter decreases rapidly to a very fine diameter and, means for supplying sufficient excitation current to said first lens to operate said system in the highly sensitive mode such that a small variation in excitation current results in a large variation in beam diameter.
Claim 3
Dependent Claim
166 words
An illumination system for directing an electron beam from a source to produce a very fine beam diameter spot upon a specimen useful in a scanning electron microscope or the like; comprising a first lens having two pole gaps in a single magnetic circuit; and at least one independent lens; said first lens and at least one independent lens positioned along the beam path between the source and specimen, said first lens being nearer said source than said at least one independent lens; said first lens and at least one independent lens having an excitation current-beam diameter at specimen curve as shown in FIG. 2 wherein as excitation of the first lens increases a highly sensitive mode being the portion of the curve labeled c on FIG. 2 is obtained; and, means for supplying sufficient excitation current to said first lens to operate said system in the highly sensitive mode such that a small variation in excitation current results in a large variation in beam diameter.
Claim 4
Dependent Claim
166 words
An illumination system for directing an electron beam from a source to produce a very fine beam diameter spot upon a specimen useful in a scanning electron microscope or the like; comprising a first lens having two pole gaps in a single magnetic circuit; and at least one independent lens; said first lens and at least one independent lens positioned along the beam path between the source and specimen, said first lens being nearer said source than said at least one independent lens; said first lens and at least one independent lens having an excitation current-beam diameter at specimen curve as shown in FIG. 2 wherein as excitation of the first lens increases a highly sensitive mode being the portion of the curve labeled c on FIG. 2 is obtained; and, means for supplying sufficient excitation current to said first lens to operate said system in the highly sensitive mode such that a small variation in excitation current results in a large variation in beam diameter.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-08-31 | 1980-03-01 | 1980-08-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-08-31 | 1984-03-01 | 1984-08-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-08-31 | 1988-03-01 | 1988-08-31 | $7700.00 | Window Closed / Lapsed |