Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
260 words
A photodiode for an alternating current driven light valve of the type wherein the photocapacitance of a light responsive semiconductor layer of said diode which is supported on a transparent substrate of said valve to receive light transmitted therethrough can be modulated in response to changes in the intensity of such incident light, the improvement in said diode comprising: a. first and second semiconductor layers forming the rectifying junction of a charge storage photodiode; b. said first layer being a light responsive photoconductor the photocapacitance of which can be modulated in response to changes in the intensity of said incident light and being located between said second layer and said substrate, and said second layer being a semiconductor having an impurity type opposite to that of said first layer; c. said first layer having a defect center gradient from a first region of semiconductor material having a low density of defect centers to a second region of semiconductor material having a higher density of defect centers, said second region being contiguous with said junction and said first region being contiguous with said second region and being exposed to receive said incident light which is effective to generate charge carriers which are stored in said second region and which change the photocapacitive depletion width adjacent said junction to enhance the sensitivity of said diode; and, d. a voltage or field activated light modulating medium adjacent said second layer on the side opposite the first layer, said medium and said first and second layers being sandwiched between a pair of transparent electrodes.
Claim 2
Dependent Claim
260 words
A photodiode for an alternating current driven light valve of the type wherein the photocapacitance of a light responsive semiconductor layer of said diode which is supported on a transparent substrate of said valve to receive light transmitted therethrough can be modulated in response to changes in the intensity of such incident light, the improvement in said diode comprising: a. first and second semiconductor layers forming the rectifying junction of a charge storage photodiode; b. said first layer being a light responsive photoconductor the photocapacitance of which can be modulated in response to changes in the intensity of said incident light and being located between said second layer and said substrate, and said second layer being a semiconductor having an impurity type opposite to that of said first layer; c. said first layer having a defect center gradient from a first region of semiconductor material having a low density of defect centers to a second region of semiconductor material having a higher density of defect centers, said second region being contiguous with said junction and said first region being contiguous with said second region and being exposed to receive said incident light which is effective to generate charge carriers which are stored in said second region and which change the photocapacitive depletion width adjacent said junction to enhance the sensitivity of said diode; and, d. a voltage or field activated light modulating medium adjacent said second layer on the side opposite the first layer, said medium and said first and second layers being sandwiched between a pair of transparent electrodes.
Claim 3
Dependent Claim
23 words
A device as in claim 1 wherein said first region is thicker than said second region whereby the dark current may be minimal.
Claim 4
Dependent Claim
45 words
A device as in claim 1 wherein the defect concentration of said first layer is varied from low in said first region to high in said second region by progressively lowering the temperature of said substrate during deposition of said first layer on said substrate.
Claim 5
Dependent Claim
50 words
A device as in claim 3 wherein the semi-conductor material of both regions of said first layer is cadmium sulfide and wherein said defect centers comprise both shallow electron traps and recombination centers, said density of defect centers being varied by said variation of temperature during deposition of said regions.
Claim 6
Dependent Claim
49 words
A device as in claim 4 wherein said first layer has a graded optical absorption coefficient which varies across its thickness, said first region having a low optical absorption coefficient and said second region having a higher optical absorption coefficient due to said higher density of shallow electron traps.
Claim 7
Dependent Claim
66 words
A device as in claim 1 wherein said second relatively high defect density region is the result of the formation of a chemical alloy in said region with the semiconductor of said first region thus varying the band gap of the device from said first low defect density region to said second high defect density region, said defect centers including the atoms of said alloying material.
Claim 8
Dependent Claim
17 words
A device as in claim 6 wherein said first region is more stoichiometric than said second region.
Claim 9
Dependent Claim
57 words
A device as in claim 7 wherein said first layer comprises a first region of CdS and a second region of CdS 1-x Se x and wherein said second region of said layer is formed by alloying CdS with CdSe creating a relatively "orange" region compared to the first region which is a "yellow" pure CdS region.
Claim 10
Dependent Claim
40 words
A device as in claim 8 wherein said first layer has a graded optical absorption coefficient which varies across its thickness, said first region having a low optical absorption coefficient and said second region having a higher optical absorption coefficient.
Claim 11
Dependent Claim
35 words
A device as in claim 8 wherein said first layer is formed by reactively sputtering CdS on to said substrate initially in an H 2 S atmosphere and finally in an H 2 Se atmosphere.
Claim 12
Dependent Claim
46 words
A device as in claim 8 wherein said first region is formed by reactively sputtering CdS on to said substrate from a first target and then reactively sputtering CdS 1-x Se x from a second target on to said first region to form said second region.
Claim 13
Dependent Claim
51 words
A device as in claim 8 wherein said first and second regions are respectively formed by dual boat evaporation followed by heat treatment in a hydrogen sulfide atmosphere, said first evaporation depositing a first region of CdS and said second evaporation depositing a second region of CdS 1-x Se x .
Claim 14
Dependent Claim
29 words
A device as in claim 1 wherein said first region is at least twice as thick as said second region whereby the dark current of said device is reduced.
Claim 15
Dependent Claim
26 words
A device as in claim 1 wherein said first region is at least 12 μm thick and said second region is at least 4 μm thick.
Claim 16
Dependent Claim
22 words
A device as in claim 1 wherein said photosensor has a broad spectral response with non-exponential carrier generation and low recombination velocities.
Claim 17
Dependent Claim
23 words
A device as in claim 15 wherein said spectral response substantially matches that of a P-1 phosphor of a commercial cathode ray tube.