Semiconductor temperature switches

Claim 2

A semiconductor temperature switch actuatable at a predetermined temperature within a temperature range up to about 55°C and adapted for operating at voltages up to about 400 volts, comprising a semiconductor device formed of first, second, third and fourth layers defining therebetween first, second and third junctions: said first layer being of one conductivity type of germanium and having a first current-carrying electrode attached thereto; said second layer being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least about 50%; said third layer being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10L d ; said fourth layer being of said opposite conductivity type and having a second current-carrying electrode attached thereto; said first junction having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction having a breakover voltage essentially equal to said operating voltage at said predetermined switching temperature within said temperature range when a voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction having an injection efficiency of charge carriers into said third layer of at least about 80%; whereby when said switch reaches said predetermined temperature, said second junction changes from a reversed biased to a forward biased junction to permit a marked increase in the flow of current therethrough.

Claim 3

A semiconductor temperature switch in accordance with claim 1 wherein said first layer is p-type germanium said second and fourth layers are n-type germanium, and said third layer is high purity, p-type germanium having a resistivity of at least 20 ohm-centimeters.

Claim 4

A semiconductor temperature switch in accordance with claim 2 wherein said first p-type germanium layer is gallium-doped and said n-type germanium is arsenic-doped.

Claim 5

A semiconductor temperature switch in accordance with claim 1 wherein said first layer is p-type germanium, said second and fourth layers are n-type germanium, and said third layer is π-type germanium.

Claim 6

A semiconductor temperature switch in accordance with claim 4 wherein said first p-type germanium layer is gallium-doped and said n-type germanium is arsenic-doped.

Claim 7

A semiconductor temperature switch in accordance with claim 1 wherein said first layer is n-type germanium, said second and fourth layers are p-type germanium and said third layer is n-type germanium with a resistivity of at least 20 ohm-centimeters.

Claim 8

A semiconductor temperature switch in accordance with claim 6 wherein said first n-type germanium layer is arsenic-doped and said p-type germanium is gallium-doped.

Claim 9

A semiconductor temperature switch in accordance with claim 1 wherein said first layer is n-type germanium, said second and fourth layers are p-type germanium and said third layer is ν -type germanium.

Claim 10

A semiconductor temperature switch in accordance with claim 8 wherein said first n-type germanium layer is arsenic-doped and said p-type germanium is gallium-doped.

Claim 11

A semiconductor temperature switch in accordance with claim 1 including circuit means for varying said predetermined temperature within said range.

Claim 12

A semiconductor temperature switch in accordance with claim 1 including circuit means, incorporating variable resistance means, providing an electrical connection between said first layer through said first electrode and said second layer through a third current-carrying electrode attached to said second layer, whereby said predetermined switching temperature may be varied within a preselected range by varying the resistance in said circuit means.

Claim 13

A semiconductor temperature switch in accordance with claim 1 including circuit means, incorporating variable resistance means, providing an electrical connection between said fourth layer through said second electrode and said third layer through a third current-carrying electrode attached to said third layer, whereby said predetermined switching temperature may be varied within a preselected range by varying the resistance in said circuit means.

Claim 14

A semiconductor temperature switch in accordance with claim 1 including a third current-carrying electrode attached to said third layer for controlling said switching temperature within a preselected range.

Claim 15

A semiconductor temperature switch in accordance with claim 13 wherein said second electrode is also attached to said third layer.

Claim 16

A semiconductor temperature switch in accordance with claim 1 including a third current-carrying electrode attached to said second layer for controlling said switching temperature within a preselected range.

Claim 17

A semiconductor temperature switch in accordance with claim 15 wherein said first electrode is also attached to said second layer.

Claim 18

A semiconductor temperature switch in accordance with claim 1 wherein said second electrode is also attached to said third layer and including a fifth layer of the same conductivity type as said fourth layer and defining a fourth junction with said third layer, and a third current-carrying electrode attached to said fifth layer, whereby said predetermined switching temperature may be adjusted.

Claim 19

A semiconductor temperature switch in accordance with claim 17 having circuit means, including switch means, voltage source means and variable resistor means, connecting said second and third electrodes whereby said adjusted predetermined switching temperature may be varied within a preselected range by varying the resistance in said circuit means.

Claim 20

A semiconductor temperature switch in accordance with claim 1 wherein said first electrode is also attached to said second layer and including a fifth layer of the same conductivity type as said first layer and defining a fourth junction with said second layer, and a third current-carrying electrode attached to said fifth layer, whereby said predetermined switching temperature may be adjusted.

Claim 21

A semiconductor temperature switch in accordance with claim 19 having circuit means, including switch means, voltage source means and variable resistor means connecting said first and third electrodes, whereby said adjusted predetermined switching temperature may be varied within a preselected range by varying the resistance in said circuit means.

Claim 22

A semiconductor temperature switch in accordance with claim 1 including a fifth layer of the same conductivity type as said first layer and defining a fourth junction with said second layer and a third current-carrying electrode attached to said fifth layer whereby said predetermined switching temperature may be adjusted.

Claim 23

A semiconductor temperature switch in accordance with claim 21 having circuit means, including switch means, voltage source means, and variable resistor means, connecting said first and third electrodes whereby said adjusted predetermined switching temperature may be varied within a preselected range by varying the resistance in said circuit means.

Claim 24

A semiconductor temperature switch in accordance with claim 1 including a fifth layer of the same conductivity type as said fourth layer and defining a fourth junction with said third layer and third current-carrying electrode attached to said fifth layer whereby said predetermined switching temperature may be adjusted.

Claim 25

A semiconductor temperature switch in accordance with claim 23 having circuit means, including switch means, voltage source means and variable resistor means, connecting said second and third electrodes whereby said adjusted predetermined switching temperature may be varied with a predetermined range by varying the resistance in said circuit means.

Claim 26

A semiconductor temperature switch in accordance with claim 1 including a fifth layer of the opposite conductivity type as said first layer and defining with said first layer a fourth junction, and third current-carrying electrode attached to said fifth layer whereby said predetermined switching temperature may be adjusted.

Claim 27

A semiconductor temperature switch in accordance with claim 1 including a fifth layer of the opposite conductivity type as said fourth layer and defining with said fourth layer a fourth junction, and a third current-carrying electrode attached to said fifth layer whereby said predetermined switching temperature may be adjusted.

Claim 28

A bilateral semiconductor temperature switch comprising first and second switches constructed in accordance with claim 1, said first and second switches being connected in anti-parallel by circuit means such that the direction of said first switch is opposite to that of said second switch, whereby when one of said switches is in a forward conductivity state the other of said switches is in a reverse conducting state.

Claim 29

A bilateral semiconductor temperature switch actuatable at a predetermined temperature up to about 55°C and adapted for operating with voltages of alternating polarity up to about 400 volts, comprising two semiconductor assemblies, each of which is formed of first, second, third and fourth layers defining therebetween first, second and third junctions; said assemblies being arranged to form an integrated device wherein said third layer is common to both of said assemblies and said second layer of one of said assemblies and said fourth layer of said other of said assemblies are contiguous to one side of said common third layer and said fourth layer of said one of said assemblies and said second layer of said other of said assemblies are contiguous to the other side of said third common layer; said first layer of each of said assemblies being of one conductivity type of germanium and having a first current-carrying electrode attached thereto; said second layer of each of said assemblies being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least about 50%; said third common layer of said assemblies being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10 L d ; said fourth layer of each of said assemblies being of said opposite conductivity type germanium and having a second current-carrying electrode attached thereto; said first junction of each of said assemblies having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction of each of said assemblies having a breakover voltage essentially equal to said operating voltage at said predetermined switching temperature within said temperature range when a voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction of each of said assemblies having an injection efficiency of charge carriers into said common third layer of at least 80%; said first electrode of said one assembly and said second electrode of said other assembly being connected to a first common lead and said second electrode of said one assembly and said first electrode of said other assembly being connected to a second common lead; whereby when said switch reaches said predetermined temperature, said second junctions alternately change from reversed biased to forward biased junctions to permit a marked increase in the flow of current therethrough.

Claim 30

A bilateral semiconductor temperature switch actuatable at a predetermined temperature up to about 55°C and adapted for operating with voltages of alternating polarity up to about 400 volts, comprising two semiconductor assemblies, each of which is formed of first, second, third and fourth layers defining therebetween first, second and third junctions; said assemblies being arranged to form an integrated device wherein said third layer is common to both of said assemblies and said second layer of one of said assemblies and said fourth layer of said other of said assemblies are contiguous to one side of said common third layer and said fourth layer of said one of said assemblies and said second layer of said other of said assemblies are contiguous to the other side of said third common layer; said first layer of each of said assemblies being of one conductivity type of germanium and having a first current-carrying electrode attached thereto; said second layer of each of said assemblies being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least about 50%; said third common layer of said assemblies being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10 L d ; said fourth layer of each of said assemblies being of said opposite conductivity type germanium and having a second current-carrying electrode attached thereto; said first junction of each of said assemblies having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction of each of said assemblies having a breakover voltage essentially equal to said operating voltage at said predetermined switching temperature within said temperature range when a voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction of each of said assemblies having an injection efficiency of charge carriers into said common third layer of at least 80%; said first electrode of said one assembly and said second electrode of said other assembly being connected to a first common lead and said second electrode of said one assembly and said first electrode of said other assembly being connected to a second common lead; whereby when said switch reaches said predetermined temperature, said second junctions alternately change from reversed biased to forward biased junctions to permit a marked increase in the flow of current therethrough.

Claim 31

A bilateral semiconductor temperature switch in accordance with claim 28 wherein said first layers are p-type germanium, said second and fourth layers are n-type germanium, and said third common layer is high purity p-type germanium having a resistivity of at least 20 ohm-centimeters.

Claim 32

A bilateral semiconductor temperature switch in accordance with claim 29 wherein said first p-type germanium layer is gallium-doped and said n-type germanium is arsenic-doped.

Claim 33

A bilateral semiconductor temperature switch in accordance with claim 28 wherein said first layers are p-type germanium, and said third common layer is π-type germanium.

Claim 34

A bilateral semiconductor temperature switch in accordance with claim 31 wherein said first p-type germanium layer is gallium-doped and said n-type germanium is arsenic-doped.

Claim 35

A bilateral semiconductor temperature switch in accordance with claim 28 wherein said first layers are n-type germanium, said second and fourth layers are p-type germanium and said third common layer is n-type germanium with a resistivity of at least 20 ohm-centimeters.

Claim 36

A bilateral semiconductor temperature switch in accordance with claim 33 wherein said first n-type germanium layer is arsenic-doped and said p-type germanium is gallium-doped.

Claim 37

A bilateral semiconductor temperature switch in accordance with claim 28 wherein said first layers are n-type germanium, said second and fourth layers are p-type germanium and said third common layer is ν-type germanium.

Claim 38

A bilateral semiconductor temperature switch in accordance with claim 35 wherein said first n-type germanium layer is arsenic-doped and said p-type germanium is gallium-doped.

Claim 39

A bilateral semiconductor temperature switch in accordance with claim 28 including circuit means for varying said predetermined switching temperature within said range.

Claim 40

A bilateral semiconductor temperature switch in accordance with claim 28 wherein said second layer of said one of said assemblies and said fourth layer of said other of said assemblies are contiguous; and said fourth layer of said one of said assemblies are said second layer of said other of said assemblies are contiguous.

Claim 41

A bilateral semiconductor temperature switch in accordance with claim 28 wherein said second layer of said one of said assemblies and said fourth layer of said other of said assemblies define a first spacing therebetween; and said fourth layer of said one of said assemblies and said second layer of said other of said assemblies define a second spacing therebetween.

Claim 42

A bilateral semiconductor temperature switch in accordance with claim 39 wherein said third layer extends into at least a portion of said first and second spacings.

Claim 43

A bilateral semiconductor temperature switch in accordance with claim 28 including first circuit means, incorporating first variable resistor means, providing an electrical connection between said first and second layers of said one of said assemblies through said first electrode and a third current carrying electrode attached to said second layer of said one of said assemblies; second circuit means, incorporating second variable resistor means, providing an electrical connection between said first and second layers of said other of said assemblies through said first electrode and a fourth current carrying elctrode attached to said second layer of said other of said assemblies; and means linking said first and second variable resistors such that the resistances in said first and second circuits may be varied simultaneously, whereby said predetermined switching temperature of said bilateral switch may be varied within a preselected range by varying the resistances in said first and second circuit means.

Claim 44

A temperature-controlled electrical circuit operable at temperatures up to about 55°C, comprising in combination a. d.c. voltage source means; b. d.c. motor means; c. semiconductor temperature switch means responsive to the temperature of an associated environment and arranged to actuate said motor means at a predetermined switching temperature within said range, said switch means comprising a semiconductor device formed of first, second, third and fourth layers defining therebetween first, second and third junctions; said first layer being of one conductivity type of germanium and having a first current-carrying electrode attached thereto for connection to one side of said voltage source means; said second layer being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least 50%; said third layer being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10L d ; said fourth layer being of said opposite conductivity type and having a second current-carrying electrode attached thereto for connection to the other side of said voltage source means through said motor means; said first junction having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction having a breakover voltage essentially equal to the voltage across said switch at said predetermined switching temperature when said voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction having an injection efficiency of charge carriers into said third layer of at least about 80%; whereby when said switch means reaches said predetermined temperature said motor means is actuated.

Claim 45

A temperature-controlled electrical circuit operable at temperatures up to about 55°C, comprising in combination a. d.c. voltage source means; b. d.c. motor means; c. semiconductor temperature switch means responsive to the temperature of an associated environment and arranged to actuate said motor means at a predetermined switching temperature within said range, said switch means comprising a semiconductor device formed of first, second, third and fourth layers defining therebetween first, second and third junctions; said first layer being of one conductivity type of germanium and having a first current-carrying electrode attached thereto for connection to one side of said voltage source means; said second layer being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least 50%; said third layer being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10L d ; said fourth layer being of said opposite conductivity type and having a second current-carrying electrode attached thereto for connection to the other side of said voltage source means through said motor means; said first junction having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction having a breakover voltage essentially equal to the voltage across said switch at said predetermined switching temperature when said voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction having an injection efficiency of charge carriers into said third layer of at least about 80%; whereby when said switch means reaches said predetermined temperature said motor means is actuated.

Claim 46

An electrical circuit in accordance with claim 42 including circuit means associated with said semiconductor temperature switch means for varying said predetermined switching temperature within a preselected range.

Claim 47

A temperature-controlled electrical circuit operable at temperatures up to about 55°C, comprising in combination a. a.c. voltage source means; b. a.c. motor means c. bilateral semiconductor temperature switch means responsive to the temperature of an associated environment and arranged to actuate said motor means at a predetermined switching temperature within said range, said switch means comprising two semiconductor assemblies, each of which is formed of first, second, third and fourth layers defining therebetween first, second and third junctions; said assemblies being arranged to form an integrated device wherein said third layer is common to both of said assemblies and said second layer of one of said assemblies and said fourth layer of said other of said assemblies are contiguous to one side of said common third layer and said fourth layer of said one of said assemblies and said second layer of said other of said assemblies are contiguous to the other side of said third common layer; said first layer of each of said assemblies being of one conductivity type of germanium and having a first current-carrying electrode attached thereto; said second layer of each of said assemblies being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least about 50%; said third common layer of said assemblies being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10 L d ; said fourth layer of each of said assemblies being of said opposite conductivity type germanium and having a second current-carrying electrode attached thereto; said first junction of each of said assemblies having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction of each of said assemblies having a breakover voltage essentially equal to the voltage across said switch means at said predetermined switching temperature when a voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction of each of said assemblies having an injection efficiency of charge carriers into said common third layer of at least 80%; said first electrode of said one assembly and said second electrode of said other assembly being connected to a first common lead connected to one side of said voltage source means and said second electrode of said one assembly and said first electrode of said other assembly being connected to a second common lead connected to the other side of said voltage source means through said motor means; whereby when said switch reaches said predetermined temperature, said motor means is actuated.

Claim 48

A temperature-controlled electrical circuit operable at temperatures up to about 55°C, comprising in combination a. a.c. voltage source means; b. a.c. motor means c. bilateral semiconductor temperature switch means responsive to the temperature of an associated environment and arranged to actuate said motor means at a predetermined switching temperature within said range, said switch means comprising two semiconductor assemblies, each of which is formed of first, second, third and fourth layers defining therebetween first, second and third junctions; said assemblies being arranged to form an integrated device wherein said third layer is common to both of said assemblies and said second layer of one of said assemblies and said fourth layer of said other of said assemblies are contiguous to one side of said common third layer and said fourth layer of said one of said assemblies and said second layer of said other of said assemblies are contiguous to the other side of said third common layer; said first layer of each of said assemblies being of one conductivity type of germanium and having a first current-carrying electrode attached thereto; said second layer of each of said assemblies being a thin stratum of opposite conductivity type of germanium with a transfer efficiency of minority charge carriers thereacross of at least about 50%; said third common layer of said assemblies being of said one conductivity type of germanium and having a resistivity greater than 0.01 ohm-centimeter and a minority carrier diffusion length, L d , between about 0.5 mils and about 5 mils, and a thickness equal to between about 0.1 L d and about 10 L d ; said fourth layer of each of said assemblies being of said opposite conductivity type germanium and having a second current-carrying electrode attached thereto; said first junction of each of said assemblies having an injection efficiency of charge carriers into said second layer between about 50% and about 90%; said second junction of each of said assemblies having a breakover voltage essentially equal to the voltage across said switch means at said predetermined switching temperature when a voltage is applied to said electrode on said first layer with respect to said electrode on said fourth layer of such polarity as to reverse bias said second junction, and a low impedance subsequent to said switching at said predetermined temperature when said second junction becomes forward biased; and said third junction of each of said assemblies having an injection efficiency of charge carriers into said common third layer of at least 80%; said first electrode of said one assembly and said second electrode of said other assembly being connected to a first common lead connected to one side of said voltage source means and said second electrode of said one assembly and said first electrode of said other assembly being connected to a second common lead connected to the other side of said voltage source means through said motor means; whereby when said switch reaches said predetermined temperature, said motor means is actuated.

Claim 49

An electrical circuit in accordance with claim 44 including circuit means associated with said semiconductor temperature switch means for varying said predetermined switching temperature within a preselected range.