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US3961219A Expired / Lapsed US ⏱️ 0.0 years remaining

Electron optical system with a magnetic focusing and electromagnetic deflection system of unit design

Assignee: Siemens AG
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Filing: 1974-10-15
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Granted: 1976-06-01
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Expires: 1994-10-15
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Abstract

Abstract An electron-optical system with a magnetic focusing and an electromagnetic deflection system of unit design in which a screening means in the form of a coil of magnetic wire or other conventional structure is arranged between the magnetic and electromagnetic units is employed in tubes, in particular high-resolution television camera tubes such as vidicons or the like, having a target for scanning by an electron beam and a fine-mesh field net arranged in front of the target. The focusing coil has an increasing winding density in the direction from the aperture diaphragm toward the target, and the deflection coils are of such short length and arranged either inside or outside of the focusing coil so that, in association with the increasing focusing field strength toward the target due to the use of a deflection field of less than about half the usual extent in the axial direction, the electron beam experiences a rotation of less than 90° in the deflection field while achieving magnification less than unity with low beam landing errors. The focusing coil has an internal and/or external diameter which increases in steps toward the target.

Inventors

  • 👤 Martin Bechteler
  • 👤 Rolf Stock
  • 👤 Wolfgang Welsch

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 16:44
CPC Classifications
H; H01; H01J; H01J29/00; H01J29/86; H01J29/867; H01J29/46; H01J31/00; H01J31/08; H01J31/26; H01J31/28

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 159 words
In an electron-optical system of the type having a magnetic focusing coil and an electromagnetic deflection system of unit design with a screening means between the focusing and deflection systems, and having a target for scanning by an electron beam and a fine-mesh field net arranged in front of the target and an aperture diaphragm spaced from the target adjacent the tube electron beam generating system, the improvement wherein: the focusing coil has an increasing winding density in the direction from the aperture diaphragm toward the target, the deflection coils are of a length shorter than the focusing coil and adapted to be energized to provide a deflection field of less than about half the usual extent in the axial direction, whereby in association with the increasing focusing field strength toward the target and the deflection field, the electron beam experiences a rotation of less than 90° in the deflection field while achieving reducing reproduction at low impact errors.
Claim 2
Dependent Claim 159 words
In an electron-optical system of the type having a magnetic focusing coil and an electromagnetic deflection system of unit design with a screening means between the focusing and deflection systems, and having a target for scanning by an electron beam and a fine-mesh field net arranged in front of the target and an aperture diaphragm spaced from the target adjacent the tube electron beam generating system, the improvement wherein: the focusing coil has an increasing winding density in the direction from the aperture diaphragm toward the target, the deflection coils are of a length shorter than the focusing coil and adapted to be energized to provide a deflection field of less than about half the usual extent in the axial direction, whereby in association with the increasing focusing field strength toward the target and the deflection field, the electron beam experiences a rotation of less than 90° in the deflection field while achieving reducing reproduction at low impact errors.
Claim 3
Dependent Claim 32 words
In an electron-optical system as claimed in claim 1, wherein the focusing coil has a diameter which increases stepwise in the direction of the target in accordance with the increasing winding density.
Claim 4
Dependent Claim 42 words
In an electron-optical system as claimed in claim 1, wherein the deflection coils are arranged in the main lens plane which is disposed nearer to the target than to the aperture diaphragm and corresponding with the reducing reproduction of the aperture diaphragm.
Claim 5
Dependent Claim 22 words
In an electron-optical system as claimed in claim 1, comprising a magnetic return for the deflection coils having a magnetically conductive ring.
Claim 6
Dependent Claim 31 words
In an electron-optical system as claimed in claim 1, wherein said deflection coils are arranged directly on the camera tube and the focusing coil is arranged to embrace the deflection coils.
Claim 7
Dependent Claim 45 words
In an electron-optical system as claimed in claim 1, wherein the focusing coil has internal and external diameters which increase in a step fashion toward the target and the deflection coils embrace the focusing coil intermediate its ends at a portion of substantially medium diameter.
Claim 8
Dependent Claim 25 words
In an electron-optical system as claimed in claim 6, comprising an axially slotted tube of non-magnetic, electrically conductive material between the focusing and deflection coils.
Claim 9
Dependent Claim 25 words
In an electron-optical system as claimed in claim 6, comprising an insulating tube having axial conductor paths thereon disposed between the focusing and deflection coils.
Claim 10
Dependent Claim 166 words
In an electron-optical system of the type having a magnetic focusing device and an electromagnetic deflection system of unit design with a screening means between the focusing and deflection systems, and having a target for scanning by an electron beam and a fine-mesh field net arranged in front of the target and an aperture diaphragm spaced from the target adjacent the tube electron beam generating system, the improvement wherein: the focusing device comprises a permanent magnet having a packing density which increases in the axial direction from the aperture diaphragm toward the target, the deflection coils are of a length shorter than the permanent magnet and adapted to be energized to provide a deflection field of less than about half the usual extent in the axial direction, whereby in association with the increasing focusing field strength toward the target and the deflection field, the electron beam experiences a rotation of less than 90° in the deflection field while achieving reducing reproduction at low beam landing errors.
Claim 11
Dependent Claim 166 words
In an electron-optical system of the type having a magnetic focusing device and an electromagnetic deflection system of unit design with a screening means between the focusing and deflection systems, and having a target for scanning by an electron beam and a fine-mesh field net arranged in front of the target and an aperture diaphragm spaced from the target adjacent the tube electron beam generating system, the improvement wherein: the focusing device comprises a permanent magnet having a packing density which increases in the axial direction from the aperture diaphragm toward the target, the deflection coils are of a length shorter than the permanent magnet and adapted to be energized to provide a deflection field of less than about half the usual extent in the axial direction, whereby in association with the increasing focusing field strength toward the target and the deflection field, the electron beam experiences a rotation of less than 90° in the deflection field while achieving reducing reproduction at low beam landing errors.

References Cited (Backward Citations)

US2433682A Cited
US3295010A Cited
US3743983A Cited
US3811066A Cited
US3774070A Cited
US3721931A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1979-06-01 1979-12-01 1980-06-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1983-06-01 1983-12-01 1984-06-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1987-06-01 1987-12-01 1988-06-01 $7700.00 Window Closed / Lapsed

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