US3956741A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Bi-directional zero radius auto-fire probe and amplifier
Assignee: Kraus Instruments Inc
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Filing: 1973-06-14
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Granted: 1976-05-11
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Expires: 1993-06-14
Abstract
Abstract Disclosed is a unique probe and amplifier circuit for use with a digital height gauge or other measuring device. Fundamentally, the invention utilizes a probe tip operatively connected to the primary and secondary windings of an LVDT; the core of the LVDT being fixedly positioned between the windings. Deflection of the probe in either direction along the axis of the core results in an output signal from the LVDT, the amplitude of the signal being indicative of the magnitude of the deflection. The signal is translated into a varying DC level, the value of the DC level being linearly related to the deflection of the probe. The DC voltage is applied to an operational amplifier having selective feedback networks associated therewith which prescribe the gain of the amplifier and hence its subsequent effect upon a calibrated meter connected to the output thereof. The meter provides visual readings indicative of the deflection of the probe. The operational amplifier has a DC bias associated therewith to compensate for the diameter of the probe tip such that measurements may be taken in a bi-directional manner without compensation having to be made for the probe tip diameter. Also connected to the output of the operational amplifier is circuitry for producing a binary state DC signal at that time at which the meter indicates that a measurement should be taken.
Inventors
- 👤 Ronald G. Kraus
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 02:37
CPC Classifications
G; G01; G01B; G01B7/00; G01B7/001; G01D; G01D5/00; G01D5/12; G01D5/14; G01D5/20; G01D5/22; G01D5/225; G01D5/2258; G01D5/2266; G01D5/2291
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
168 words
A probe circuit for utilization with a digital height gauge for creating signals indicating such contacting engagement between the probe and a work piece that a measurement should be taken, comprising: an LVDT having primary and secondary coils and a core positioned therebetween; a probe having a tip thereon operatively connected to and movable with the coils; rectifier circuit means connected to the LVDT for receiving electrical signals therefrom indicative of the positional relationship between the coils and the core and producing a DC output signal proportional to said positional relationship, said rectifier circuit means including bias means for producing a bias voltage related to the radius of the probe tip; and a first operational amplifier connected to said rectifier circuit means and receiving the DC output signal therefrom, the first operational amplifier creating a binary change output signal which occurs upon said DC output signal reaching a particular level, which binary change indicates probe deflection relating to such contacting engagement between the probe and the work piece.
Claim 2
Dependent Claim
168 words
A probe circuit for utilization with a digital height gauge for creating signals indicating such contacting engagement between the probe and a work piece that a measurement should be taken, comprising: an LVDT having primary and secondary coils and a core positioned therebetween; a probe having a tip thereon operatively connected to and movable with the coils; rectifier circuit means connected to the LVDT for receiving electrical signals therefrom indicative of the positional relationship between the coils and the core and producing a DC output signal proportional to said positional relationship, said rectifier circuit means including bias means for producing a bias voltage related to the radius of the probe tip; and a first operational amplifier connected to said rectifier circuit means and receiving the DC output signal therefrom, the first operational amplifier creating a binary change output signal which occurs upon said DC output signal reaching a particular level, which binary change indicates probe deflection relating to such contacting engagement between the probe and the work piece.
Claim 3
Dependent Claim
60 words
The probe circuit as recited in claim 1 wherein the rectifier circuit means comprises a second operational amplifier connected to the LVDT and a half-wave rectifier connected to the second operational amplifier, the second operational amplifier linearly amplifying any voltage differential existing between the secondary coils and the half-wave rectifier converting the amplified voltage differential into said DC output signal.
Claim 4
Dependent Claim
35 words
The probe circuit as recited in claim 1 which further includes a meter connected to the rectifier circuit means and creating a visual signal from the output thereof correlated with the deflection of the probe.
Claim 5
Dependent Claim
43 words
The probe circuit as recited in claim 1 which further includes a housing wherein the primary and secondary coils are contained and spring means fixedly secured to said housing and said coils for allowing relative linear movement between the coils and the core.
Claim 6
Dependent Claim
27 words
The probe circuit as recited in claim 1 wherein said bias means comprises a potentionmeter, adjustment of the potentionmeter providing for compensation of various probe tip radii.
Claim 7
Dependent Claim
157 words
A probe circuit for use with electronic digital height gauges comprising: a probe mechanically connected to the primary and secondary coils of an LVDT, and having a physical neutral position with relation to the LVDT core; a first operation amplifier circuit differentially connected to the secondary coils and receiving therefrom signals indicative of the positional relationship between the coils and the core of the LVDT and including means for converting said signals into varying DC levels, a second operational amplifier circuit connected to the first operational amplifier circuit for receiving the varying DC levels and creating signals therefrom indicative of the deflection of the probe from the neutral position and including bias means for producing a bias voltage related to the radius of the probe; and a third operational amplifier circuit connected to the second operational amplifier circuit and biased that the output thereof changes when the output of the second operational amplifier exceeds a particular level.
Claim 8
Dependent Claim
157 words
A probe circuit for use with electronic digital height gauges comprising: a probe mechanically connected to the primary and secondary coils of an LVDT, and having a physical neutral position with relation to the LVDT core; a first operation amplifier circuit differentially connected to the secondary coils and receiving therefrom signals indicative of the positional relationship between the coils and the core of the LVDT and including means for converting said signals into varying DC levels, a second operational amplifier circuit connected to the first operational amplifier circuit for receiving the varying DC levels and creating signals therefrom indicative of the deflection of the probe from the neutral position and including bias means for producing a bias voltage related to the radius of the probe; and a third operational amplifier circuit connected to the second operational amplifier circuit and biased that the output thereof changes when the output of the second operational amplifier exceeds a particular level.
Claim 9
Dependent Claim
29 words
The probe circuit as recited in claim 6 which includes adjustment means connected to the core for adjusting the neutral position to compensate for the weight of the probe.
Claim 10
Dependent Claim
37 words
The probe circuit as recited in claim 6 which further includes a meter connected to the second operational amplifier circuit, the meter being calibrated so as to indicate linear deflection of the probe from the neutral position.
Claim 11
Dependent Claim
55 words
The probe circuit as recited in claim 8 wherein the second operational amplifier circuit has two resistive feedback networks controlling the gain thereof, each feedback network having an adjustable potentionmeter for calibrating the meter, the feedback networks being mutually exclusively connected to the output of the second operational amplifier by means of a selector switch.
Claim 12
Dependent Claim
16 words
The probe circuit as recited in claim 6 wherein the bias means comprises an adjustable potentionmeter.
Claim 13
Dependent Claim
81 words
The probe circuit as recited in claim 6 wherein the LVDT is contained within a housing, the coils of the LVDT being connected to the housing by flexible connecting means to allow relative movement between the coils and the core, the core of the LVDT being fixedly connected to the housing with a threaded member, the positioning of the coil on said threaded member being adjustable, and the probe extending from the housing in a manner substantially perpendicular to the core.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-05-11 | 1979-11-10 | 1980-05-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-05-11 | 1983-11-10 | 1984-05-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-05-11 | 1987-11-10 | 1988-05-11 | $7700.00 | Window Closed / Lapsed |