US3949295A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for retaining articles in an array for testing
Assignee: AT&T Inc
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Filing: 1974-03-20
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Granted: 1976-04-06
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Expires: 1994-03-20
Abstract
Abstract Discrete semiconductor chips, such as sheet-diffused diodes are mass-tested after separation from a wafer. A carrier for retaining the chips in a predetermined array for testing has a plurality of cavities located in a planar surface and arranged in accordance with the predetermined array. The devices are loaded into the cavities and retained therein by a vacuum connected to each of the cavities. Electrical contact is made through the bases of the cavities to the bottom surfaces of the chips, while insulating walls of the cavities prevent leakage paths around the chips. The carrier is indexed in steps corresponding to the increments of the array to permit the top surface of each of the loaded chips to be contacted in sequence by a probe to establish electrical connection through such chip to a test set to test the chip.
Inventors
- 👤 George G. Moorshead
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 15:56
CPC Classifications
B; B25; B25B; B25B11/00; B25B11/005; G; G01; G01R; G01R31/00; G01R31/50
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
213 words
An apparatus for electrically testing a plurality of articles under controlled humidity conditions, which comprises: an enclosure for controlling humidity conditions of an atmosphere within the confines of the enclosure; a device for retaining a plurality of the articles in an array, the device being positioned within the enclosure and including a conductive base having a plurality of apertures in a surface thereof, the apertures being positioned to correspond to the array, and an insulating sheet covering the apertured surface of the base, the sheet having a plurality of apertures located coaxially with respect to the apertures in the base, each of the apertures in the sheet being of a size so as to accept one of the articles to permit a surface of the article to cover the respective aperture in the base; means for producing a vacuum, connected through the base to each of the apertures, whereby the articles loaded into the apertures of the insulating sheet are brought into contact with the conductive base; and means for contacting the top surfaces of the articles in contact with the base with an electronic test probe to complete a test circuit through the articles whereby the articles are tested while being located in the array within the enclosure under controlled humidity conditions.
Claim 2
Independent Claim
213 words
An apparatus for electrically testing a plurality of articles under controlled humidity conditions, which comprises: an enclosure for controlling humidity conditions of an atmosphere within the confines of the enclosure; a device for retaining a plurality of the articles in an array, the device being positioned within the enclosure and including a conductive base having a plurality of apertures in a surface thereof, the apertures being positioned to correspond to the array, and an insulating sheet covering the apertured surface of the base, the sheet having a plurality of apertures located coaxially with respect to the apertures in the base, each of the apertures in the sheet being of a size so as to accept one of the articles to permit a surface of the article to cover the respective aperture in the base; means for producing a vacuum, connected through the base to each of the apertures, whereby the articles loaded into the apertures of the insulating sheet are brought into contact with the conductive base; and means for contacting the top surfaces of the articles in contact with the base with an electronic test probe to complete a test circuit through the articles whereby the articles are tested while being located in the array within the enclosure under controlled humidity conditions.
Claim 3
Dependent Claim
155 words
Apparatus for handling and testing electronic articles, which comprises: an enclosure for controlling predetermined atmospheric conditions therein; means, positioned within the enclosure, for locating the articles in an array, the locating means including a base having a base member with a planar, conductive top surface, and a nonconductive top layer of uniform thickness located on the top surface of the base member, an array of open cavities located in the top layer and extending therethrough, each of the cavities having a conductive base formed by a corresponding portion of the top surface of the base member and nonconductive sides formed by the top layer, and an aperture in the base portion of each of the cavities, such apertures connected to a vacuum source; a test apparatus having probe means located within the enclosure; and means for positioning the locating means with respect to the probe means for probing any such articles located in the array.
Claim 4
Dependent Claim
155 words
Apparatus for handling and testing electronic articles, which comprises: an enclosure for controlling predetermined atmospheric conditions therein; means, positioned within the enclosure, for locating the articles in an array, the locating means including a base having a base member with a planar, conductive top surface, and a nonconductive top layer of uniform thickness located on the top surface of the base member, an array of open cavities located in the top layer and extending therethrough, each of the cavities having a conductive base formed by a corresponding portion of the top surface of the base member and nonconductive sides formed by the top layer, and an aperture in the base portion of each of the cavities, such apertures connected to a vacuum source; a test apparatus having probe means located within the enclosure; and means for positioning the locating means with respect to the probe means for probing any such articles located in the array.
Claim 5
Dependent Claim
56 words
An apparatus according to claim 2, wherein: the depth of the cavities is substantially equal to the height of the articles to be retained therein; the cavities are cylindrical; and the lateral extent of the openings of the cavities in the top layer exceed the greatest lateral dimension of the articles by 5 to 15 percent.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-04-06 | 1979-10-06 | 1980-04-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-04-06 | 1983-10-06 | 1984-04-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-04-06 | 1987-10-06 | 1988-04-06 | $7700.00 | Window Closed / Lapsed |