← Back to Patent Explorer
US3949131A Expired / Lapsed US ⏱️ 0.0 years remaining

Photomasks with antistatic control

Assignee: AT&T Inc
•
Filing: 1974-06-19
•
Granted: 1976-04-06
•
Expires: 1994-06-19
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract In high resolution lithography, resolution impairment sometimes occurs due to dust collecting on the mask. The dust is often attracted to the mask by static electricity. The solution proposed is to coat the entire photomask with a transparent, electrically conductive coating. The coating is electrically grounded to drain static charge. Conductive materials are often used for lithographic masks, but the patterns cannot be grounded effectively because there are island regions in the pattern. If the pattern is itself conducting, there is the added option of applying the antistatic layer under the pattern. If the pattern is formed of a photographic emulsion of a patterned photoresist, it is protected from damage and wear in handling by the harder conductive coating.

Inventors

  • 👤 David Bruce Fraser

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 11:29
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/38; G03F1/40; G03F1/48; Y; Y10; Y10T; Y10T428/00; Y10T428/24; Y10T428/24802; Y10T428/24851

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 64 words
A photomask for use in photolithographic processing of semiconductor microcircuits comprising a rigid, transparent plate, a patterned photomask coating on the plate, the coating having void spaces representing a positive or negative image of at least partial features of said microcircuit, a continuous, transparent, electrically conductive film covering the photomask pattern and the void spaces, and electrical contact means for electrically grounding the film.
Claim 2
Dependent Claim 64 words
A photomask for use in photolithographic processing of semiconductor microcircuits comprising a rigid, transparent plate, a patterned photomask coating on the plate, the coating having void spaces representing a positive or negative image of at least partial features of said microcircuit, a continuous, transparent, electrically conductive film covering the photomask pattern and the void spaces, and electrical contact means for electrically grounding the film.
Claim 3
Dependent Claim 13 words
The photomask of claim 1 in which the coating is an emulsion resist.
Claim 4
Dependent Claim 14 words
The photomask of claim 1 in which the coating is chromium or iron oxide.
Claim 5
Dependent Claim 17 words
The photomask of claim 1 in which the coating is an organic layer darkened by sputter deposition.
Claim 6
Dependent Claim 42 words
The photomask of claim 1 in which the transparent, electrically conductive film comprises a material represented by the formula In 2 -x Sn x O 3 -y , where x can vary from zero to two and y from zero to 0.02.
Claim 7
Dependent Claim 12 words
The photomask of claim 5 in which x is a finite number.

References Cited (Backward Citations)

US2894858A Cited
US2887412A Cited
US3210214A Cited
US3443915A Cited
US3681227A Cited
US3686028A Cited
US3801418A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1979-04-06 1979-10-06 1980-04-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1983-04-06 1983-10-06 1984-04-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1987-04-06 1987-10-06 1988-04-06 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag