US3948696A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of diffusion into semiconductor wafers
Assignee: Hitachi Ltd
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Filing: 1974-02-28
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Granted: 1976-04-06
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Expires: 1994-02-28
Abstract
Abstract In diffusing an impurity into semiconductor wafers within a silica tube by the use of a heating furnace, a method of diffusion involves the following steps: the semiconductor wafers are inserted into the tube from an inlet thereof, the inlet is sealed by a cap, the interior of the tube is placed under vacuum, and an atmosphere of the impurity is formed. Since, at heating, the tube is closed and no inert gas is fed thereinto, the temperature distribution within the tube is held uniform, and hence the quantities of impurity introduction into the semiconductor wafers are not varied.
Inventors
- 👤 Keizo Inaniwa
- 👤 Noboru Ryugo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 04:55
CPC Classifications
C; C30; C30B; C30B31/00; C30B31/02; H; H10; H10P; H10P95/00
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
98 words
A method for diffusing an impurity into a semiconductor wafer comprising preparing a diffusion furnace composed of a furnace core tube having an inlet with a releasable closure means and a heater, inserting said semiconductor wafer into said furnace core tube through said inlet, closing said inlet by said closure means, creating a vacuum in the interior of said furnace core tube, forming an atmosphere of an impurity within said tube, depositing the impurity on a surface portion of said semiconductor wafer, and diffusing the impurity into said surface portion of said semiconductor wafer in an oxidizing atmosphere.
Claim 2
Independent Claim
98 words
A method for diffusing an impurity into a semiconductor wafer comprising preparing a diffusion furnace composed of a furnace core tube having an inlet with a releasable closure means and a heater, inserting said semiconductor wafer into said furnace core tube through said inlet, closing said inlet by said closure means, creating a vacuum in the interior of said furnace core tube, forming an atmosphere of an impurity within said tube, depositing the impurity on a surface portion of said semiconductor wafer, and diffusing the impurity into said surface portion of said semiconductor wafer in an oxidizing atmosphere.
Claim 3
Dependent Claim
21 words
The method of claim 1, wherein the impurity includes boron, phosphorus and antimony, and said semiconductor wafers are made of silicon.
Claim 4
Dependent Claim
44 words
The method of claim 1, wherein the atmosphere of an impurity is formed within said tube by initially placing an impurity source with said tube before making said vacuum and then heating said tube to an elevated temperature sufficient to vaporize said impurity source.
Claim 5
Dependent Claim
29 words
The method of claim 1, wherein the vacuum is made in said tube by attaching a vacuum pump to an opening in said tube and by operating said pump.
Claim 6
Dependent Claim
25 words
The method of claim 1, wherein the atmosphere of an impurity is formed within said tube by passing vapors of said impurity into said furnace.
Claim 7
Dependent Claim
30 words
The method of claim 1, wherein the atmosphere in said furnace core tube is replaced with an inert gas prior to creation of a vacuum in said furnace core tube.
Claim 8
Dependent Claim
28 words
The method of claim 1, wherein the pressure in the furnace core tube during deposition of the impurity on said surface portion is not more than 100 Torr.
Claim 9
Dependent Claim
30 words
The method of claim 7, wherein the atmosphere in said furnace core tube is replaced with an inert gas prior to creation of a vacuum in said furnace core tube.
Claim 10
Dependent Claim
23 words
The method of claim 7, wherein the furnace temperature during deposition of said impurity on said semiconductor wafer is from 850° to 1150°C.
Claim 11
Dependent Claim
30 words
The method of claim 9, wherein the atmosphere in said furnace core tube is replaced with an inert gas prior to creation of a vacuum in said furnace core tube.
Claim 12
Dependent Claim
11 words
The method of claim 9, wherein said impurity is boron nitride.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-04-06 | 1979-10-06 | 1980-04-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-04-06 | 1983-10-06 | 1984-04-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-04-06 | 1987-10-06 | 1988-04-06 | $7700.00 | Window Closed / Lapsed |