US3945031A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Charge effects in doped silicon dioxide
Assignee: AT&T Inc
•
Filing: 1975-07-07
•
Granted: 1976-03-16
•
Expires: 1995-07-07
Abstract
Abstract Charge conditions are modified in a wafer including a silicon dioxide layer on a silicon substrate by introducing a distribution of tantalum into the silicon dioxide layer. The distribution of tantalum can be adapted to store negative charge, to getter sodium or to produce nonannealable fast surface states. A distribution of tantalum at the silicon-silicon dioxide interface produces nonannealable fast surface states. A distribution of tantalum in the silicon dioxide subjected to electrical and temperature stress can store negative charge and getter sodium. An n-channel insulated gate field effect transistor utilizes a silicon dioxide gate insulator which includes centrally located therein a region which is rich in treated tantalum.
Inventors
- 👤 Dawon Kahng
- 👤 Joseph Raymond Ligenza
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 07:16
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/40; H10W74/43; H10D; H10D99/00; H10P; H10P95/00
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
107 words
A semiconductor device comprising a silicon semiconductor substrate of a first conductivity type, a pair of spaced impurity zones of a second conductivity type formed into the substrate, a layer of silicon dioxide contacting the substrate and overlying the space between the impurity zones, a layer of metal contacting the silicon dioxide layer, and having a distribution of tantalum in one of its oxidation states in the silicon dioxide layer, said distribution characterized by a peak in the silicon dioxide layer and by a concentration of tantalum in the silicon dioxide layer in the range between about 10 13 and 1.5 × 10 15 per square centimeter.
Claim 2
Dependent Claim
107 words
A semiconductor device comprising a silicon semiconductor substrate of a first conductivity type, a pair of spaced impurity zones of a second conductivity type formed into the substrate, a layer of silicon dioxide contacting the substrate and overlying the space between the impurity zones, a layer of metal contacting the silicon dioxide layer, and having a distribution of tantalum in one of its oxidation states in the silicon dioxide layer, said distribution characterized by a peak in the silicon dioxide layer and by a concentration of tantalum in the silicon dioxide layer in the range between about 10 13 and 1.5 × 10 15 per square centimeter.
Claim 3
Dependent Claim
27 words
The device of claim 1 in which the concentration of tantalum is in the range of about 10 14 to 1.5 × 10 15 per square centimeter.
Claim 4
Dependent Claim
41 words
A device as recited in claim 1 wherein the distribution of tantalum is confined in the bulk of the silicon dioxide layer such that the peak is located at a distance greater than about 100 A. from the semiconductor-silicon dioxide interface.
Claim 5
Dependent Claim
39 words
A device as recited in claim 1 wherein more than 75 percent of the tantalum is confined in the silicon dioxide within less than about 100 A. of the interface between the metal and the layer of silicon dioxide.
Claim 6
Dependent Claim
94 words
An insulated gate field effect transistor device comprising a silicon wafer which includes n-type source and drain zones separated by a p-type gate region characterized in that the gate insulator overlying the gate region consists of a silicon dioxide layer having within its bulk a sub-region which is rich in tantalum, said tantalum being in a distribution, substantially confined to the sub-region, which has a peak in said silicon dioxide layer, said distribution characterized by a concentration of tantalum in the range of about 10 13 to 1.5 × 10 15 per square centimeter.
Claim 7
Dependent Claim
94 words
An insulated gate field effect transistor device comprising a silicon wafer which includes n-type source and drain zones separated by a p-type gate region characterized in that the gate insulator overlying the gate region consists of a silicon dioxide layer having within its bulk a sub-region which is rich in tantalum, said tantalum being in a distribution, substantially confined to the sub-region, which has a peak in said silicon dioxide layer, said distribution characterized by a concentration of tantalum in the range of about 10 13 to 1.5 × 10 15 per square centimeter.
Claim 8
Dependent Claim
26 words
The device of claim 5 in which the concentration of tantalum is in the range of 10 14 to 1.5 × 10 15 per square centimeter.
Claim 9
Dependent Claim
78 words
An n-channel insulated gate field effect transistor device comprising a silicon wafer which includes source and drain zones separated by a gate region characterized by the improvement that the gate insulator overlying the gate region comprises a layer of genetic silicon dioxide which includes confined within its bulk a distribution of tantalum in a concentration of between about 10 13 and about 10 15 atoms per square centimeter forming a tantalum-rich region in the layer of silicon dioxide.
Claim 10
Dependent Claim
78 words
An n-channel insulated gate field effect transistor device comprising a silicon wafer which includes source and drain zones separated by a gate region characterized by the improvement that the gate insulator overlying the gate region comprises a layer of genetic silicon dioxide which includes confined within its bulk a distribution of tantalum in a concentration of between about 10 13 and about 10 15 atoms per square centimeter forming a tantalum-rich region in the layer of silicon dioxide.
Claim 11
Dependent Claim
28 words
The device of claim 7 in which the concentration of tantalum is in the range between 5 × 10 13 and 1.5 × 10 15 per square centimeter.
Claim 12
Dependent Claim
33 words
The device of claim 8 which is further characterized in that the peak of the tantalum concentration in said tantalum-rich region is located at least about 300 A. from the silicon-silicon dioxide interface.
Claim 13
Dependent Claim
35 words
The device of claim 8 in which more than 75 percent of the tantalum is confined within a sub-region of width in the silicon dioxide layer in the range between about 200 and 500 A.
Claim 14
Dependent Claim
48 words
The device of claim 7 further characterized in that said tantalum-rich region has a peak magnitude of tantalum concentration of the order of about 5 × 10 20 tantalum atoms per cubic centimeter and a total width at one-half the magnitude of the peak of about 300 A.
Claim 15
Dependent Claim
176 words
An insulated gate field effect transistor device comprising: a p-type silicon substrate, n-type source and drain zones formed into the silicon substrate and separated by a p-type gate region, a layer of genetic silicon dioxide about 1,000 A. thick overlying the p-type gate region, a layer of metal on the silicon dioxide layer, and a tantalum-rich region within the bulk of the silicon dioxide layer which includes tantalum in one of its oxidation states, said tantalum-rich region having a thickness, defined by inclusion of 75 percent of the tantalum in the oxide layer, of at least 100 A. in the direction normal to the interface of the layer of silicon dioxide and the silicon substrate, said tantalum-rich region being coextnsive with the gate region and having a peaked tantalum distribution, essentially Gaussian in shape, with a peak concentration in the range of about 5 × 10 20 to about 3 × 10 19 tantalum in one of its oxidation states per cubic centimeter, said peak being located at least 300 A. from the silicon-silicon dioxide interface.
Claim 16
Dependent Claim
176 words
An insulated gate field effect transistor device comprising: a p-type silicon substrate, n-type source and drain zones formed into the silicon substrate and separated by a p-type gate region, a layer of genetic silicon dioxide about 1,000 A. thick overlying the p-type gate region, a layer of metal on the silicon dioxide layer, and a tantalum-rich region within the bulk of the silicon dioxide layer which includes tantalum in one of its oxidation states, said tantalum-rich region having a thickness, defined by inclusion of 75 percent of the tantalum in the oxide layer, of at least 100 A. in the direction normal to the interface of the layer of silicon dioxide and the silicon substrate, said tantalum-rich region being coextnsive with the gate region and having a peaked tantalum distribution, essentially Gaussian in shape, with a peak concentration in the range of about 5 × 10 20 to about 3 × 10 19 tantalum in one of its oxidation states per cubic centimeter, said peak being located at least 300 A. from the silicon-silicon dioxide interface.
References Cited (Backward Citations)
US3882530A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-03-16 | 1979-09-15 | 1980-03-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-03-16 | 1983-09-15 | 1984-03-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-03-16 | 1987-09-15 | 1988-03-16 | $7700.00 | Window Closed / Lapsed |