US3944822A
Expired / Lapsed
US
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Polarization excitation device for X-ray fluorescence analysis
Assignee: Environmental Protection Agency
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Filing: 1974-09-30
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Granted: 1976-03-16
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Expires: 1994-09-30
Abstract
Abstract Samples are analyzed for their trace elemental composition by irradiating the samples with a beam of nearly monochromatic and polarized photons and detecting the fluorescent photons with an energy dispersive solid-state detector. The polarized photon source consists of an X-ray tube which emits characteristic X-rays and whose output is scattered at a right angle by a polarizing disc.
Inventors
- 👤 Thomas G. Dzubay
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 11:05
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/223; G21; G21K; G21K1/00; G01N2223/00; G01N2223/07; G01N2223/076
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
44 words
A system for analyzing the trace elemental composition of a sample, said system comprising: a source of monochromatic and polarized X-ray photons, a housing for mounting a sample of the material to be analyzed and means for detecting the X-ray emanating from the sample.
Claim 2
Independent Claim
44 words
A system for analyzing the trace elemental composition of a sample, said system comprising: a source of monochromatic and polarized X-ray photons, a housing for mounting a sample of the material to be analyzed and means for detecting the X-ray emanating from the sample.
Claim 3
Dependent Claim
36 words
A system for analyzing the trace elemental composition of a sample as described in claim 1 wherein said source of monochromatic and polarized X-ray photons comprises a source of X-ray photons, a filter, and a polarizer.
Claim 4
Dependent Claim
50 words
A system for analyzing the trace elemental composition of a sample as described in claim 2 wherein the paths of the X-rays from the source to the polarizer, from the polarizer to the sample being analyzed, and from the sample being analyzed to the detecting means are mutually orthogonally oriented.
Claim 5
Dependent Claim
38 words
A system for analyzing the trace elemental composition of a sample as described in claim 1 wherein said means for detecting the X-rays emanating from the sample resolves the various groups of X-rays and records the resulting spectrum.
Claim 6
Dependent Claim
31 words
A system for analyzing the trace elemental composition of a sample as claimed in claim 4 wherein said means for detecting the X-rays comprises a lithium drifted silicon energy dispersive detector.
Claim 7
Dependent Claim
120 words
A system for analyzing the trace elemental composition of a sample as described in claim 1 wherein said housing for mounting said sample to be analyzed contains a filter and a polarizer positioned within said housing, said source of monochromatic and polarized X-ray photons consisting of said filter and said polarizer and a source of X-ray radiation, said housing having a first path for said X-ray radiation between said source of said X-ray radiation and said polarizer, a second path for said X-ray radiation between said polarizer and said sample being analyzed and a third path for said X-ray radiation between said sample being analyzed and said detector, each of said first, second and third paths being mutually orthogonally oriented.
Claim 8
Independent Claim
94 words
A system utilizing a source of X-ray radiation for analyzing the trace elemental composition of a sample by means of a detector which resolves various groups of X-rays and records the resulting spectrum, said system comprising a housing for mounting said sample, a polarizer and a filter positioned within said housing, a first passage between said polarizer and said source of X-ray radiation, a second passage, containing said filter, between said polarizer and said sample, a third passage between said sample and said detector, said first, second and third passages being mutually orthogonally oriented.
Claim 9
Independent Claim
94 words
A system utilizing a source of X-ray radiation for analyzing the trace elemental composition of a sample by means of a detector which resolves various groups of X-rays and records the resulting spectrum, said system comprising a housing for mounting said sample, a polarizer and a filter positioned within said housing, a first passage between said polarizer and said source of X-ray radiation, a second passage, containing said filter, between said polarizer and said sample, a third passage between said sample and said detector, said first, second and third passages being mutually orthogonally oriented.
Claim 10
Independent Claim
43 words
A method of analyzing the composition of a sample of material for trace elements comprising the steps of irradiating the sample with a beam of monochromatic and polarized X-ray photons, resolving and detecting the various groups of X-rays, and recording the resulting spectrum.
Claim 11
Independent Claim
43 words
A method of analyzing the composition of a sample of material for trace elements comprising the steps of irradiating the sample with a beam of monochromatic and polarized X-ray photons, resolving and detecting the various groups of X-rays, and recording the resulting spectrum.
Claim 12
Dependent Claim
66 words
A method of analyzing the composition of a sample of material for trace elements as described in claim 8 wherein said step of irradiating the sample with a beam of monochromatic and polarized X-ray photons comprise passing a beam of X-rays from a source of X-ray radiation through an X-ray filter and through an X-ray polarizer to produce said beam of monochromatic and polarized X-ray photons.
Claim 13
Dependent Claim
68 words
A method of analyzing the composition of a sample of material for trace elements as described in claim 9 wherein the path of the X-ray beam from said source to said polarizer, the path of the X-ray beam from said polarizer to said sample of material, and the path of the X-ray beam from said sample of material to a resolving and detecting means are mutually orthogonally oriented.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-03-16 | 1979-09-15 | 1980-03-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-03-16 | 1983-09-15 | 1984-03-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-03-16 | 1987-09-15 | 1988-03-16 | $7700.00 | Window Closed / Lapsed |