US3887283A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Optical system for a microscope photometry attachment
Assignee: C Reichert Optische Werke AG
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Filing: 1974-04-01
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Granted: 1975-06-03
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Expires: 1994-04-01
Abstract
Abstract An optical relay system for a microscope photometry attachment permitting simultaneous viewing of the object and precise location of the object area being photometrically evaluated.
Inventors
- 👤 Kurt Merstallinger
- 👤 Klaus P Schindl
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 15:45
CPC Classifications
G; G02; G02B; G02B21/00; G02B21/0096
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
136 words
In a microscope having an objective, an inclined binocular eyepiece, and a beam deflector associated therewith aligned along an observation axis for viewing an object, the improvement comprising means to move said beam deflector out of the observation axis to provide an alternate observation axis, a positive reflective element aligned on said alternate observation axis, optical means to image said object on said positive reflecting element, said positive reflective element having an aperture axially located therein, means for performing photometric analysis located behind said aperture and permitting photometric evaluation of the corresponding portion of the object imaged on the positive reflecting element, and reflecting means to deflect the object image reflected by the positive reflective element along said alternate observation axis to said eyepiece to provide the observer simultaneous viewing of said object and said aperture.
Claim 2
Dependent Claim
136 words
In a microscope having an objective, an inclined binocular eyepiece, and a beam deflector associated therewith aligned along an observation axis for viewing an object, the improvement comprising means to move said beam deflector out of the observation axis to provide an alternate observation axis, a positive reflective element aligned on said alternate observation axis, optical means to image said object on said positive reflecting element, said positive reflective element having an aperture axially located therein, means for performing photometric analysis located behind said aperture and permitting photometric evaluation of the corresponding portion of the object imaged on the positive reflecting element, and reflecting means to deflect the object image reflected by the positive reflective element along said alternate observation axis to said eyepiece to provide the observer simultaneous viewing of said object and said aperture.
Claim 3
Dependent Claim
136 words
In a microscope having an objective, an inclined binocular eyepiece, and a beam deflector associated therewith aligned along an observation axis for viewing an object, the improvement comprising means to move said beam deflector out of the observation axis to provide an alternate observation axis, a positive reflective element aligned on said alternate observation axis, optical means to image said object on said positive reflecting element, said positive reflective element having an aperture axially located therein, means for performing photometric analysis located behind said aperture and permitting photometric evaluation of the corresponding portion of the object imaged on the positive reflecting element, and reflecting means to deflect the object image reflected by the positive reflective element along said alternate observation axis to said eyepiece to provide the observer simultaneous viewing of said object and said aperture.
Claim 4
Dependent Claim
136 words
In a microscope having an objective, an inclined binocular eyepiece, and a beam deflector associated therewith aligned along an observation axis for viewing an object, the improvement comprising means to move said beam deflector out of the observation axis to provide an alternate observation axis, a positive reflective element aligned on said alternate observation axis, optical means to image said object on said positive reflecting element, said positive reflective element having an aperture axially located therein, means for performing photometric analysis located behind said aperture and permitting photometric evaluation of the corresponding portion of the object imaged on the positive reflecting element, and reflecting means to deflect the object image reflected by the positive reflective element along said alternate observation axis to said eyepiece to provide the observer simultaneous viewing of said object and said aperture.
Claim 5
Dependent Claim
14 words
The improvement of claim 1 wherein said positive reflective element is a spherical mirror.
Claim 6
Dependent Claim
61 words
The improvement of claim 2 further including a reflecting element on said alternate observation axis thereby deflecting the alternate observation axis toward the spherical mirror, and a partially transmitting reflective element on said alternate observation axis, between said reflective element and said spherical mirror to deflect the optical path of the object image reflected by said spherical mirror toward said eyepiece.
Claim 7
Dependent Claim
29 words
The improvement of claim 3 wherein said optical means is a double concave doublet and further including an optical system to image said object and aperture in said eyepiece.
References Cited (Backward Citations)
US1958280A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-06-02 | 1978-12-02 | 1979-06-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-06-02 | 1982-12-02 | 1983-06-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-06-02 | 1986-12-02 | 1987-06-03 | $7700.00 | Window Closed / Lapsed |