US3887281A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Spectrophotometric measurement system
Assignee: Shimadzu Corp
•
Filing: 1971-03-31
•
Granted: 1975-06-03
•
Expires: 1991-03-31
Abstract
Abstract A spectrophotometric measurement system which comprises an optical illuminator device and photometric device for giving the difference or ratio of reduced intensities of rays of light of different wavelengths which has been transmitted through a sample to be spectroanalyzed. According to the present invention, any sample, liquid or solid, may be subjected to the spectrophotometric measurement. In addition, the base line in an absorption curve can be easily determined without being affected by the background of the sample.
Inventors
- 👤 Takashi Kurita
- 👤 Hiroshi Yamamoto
- 👤 Hideki Makabe
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 19:40
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/25; G01N21/31; G01N21/314
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
398 words
A spectrophotometric measurement system comprising: first means for scanning a first beam of light having first and second wavelength components over a sample of a material, the constituents of which occupy a substantially fixed position within said material, to be spectroanalyzed, said first and second wavelength components impinging upon said sample along the same light path; second means, disposed relative to said sample upon which said first beam of light has impinged, for receiving said first beam of light after it has impinged upon said sample and for generating first and second electrical signals representative of the intensities of said first and second wavelength components, said second means comprising means for separating said first beam of light, after it has impinged upon said sample, into first and second portions, a first filter disposed in alignment with the direction of said first portion of the separated beam of light and adapted to pass a beam of said first wavelength therethrough, a second filter disposed in alignment with the direction of said second portion of the separated beam of light and adapted to pass a beam of said second wavelength therethrough, a first image receiving unit for receiving an image of the sample to be analyzed, said image being carried by said first separated beam portion, and a second image receiving unit adapted to receive an image of the sample which is carried by said second separated beam portion; third means, responsive to said first and second electrical signals generated by said second means, for producing a third signal representative of the ratio of said first and second signals, said third means including first and second amplifier means, respectively disposed to amplify the outputs of said first and second image receiving units, an arithmetic amplifier coupled to the output of said first amplifier means and a reference signal input, for comparing the output of said first amplifier means with said reference signal, to thereby control said first amplifier means in response to variations in the output of said first amplifier means, and for supplying the output from said arithmetic amplifier to said second amplifier means as a gain control signal; and fourth means, responsive to the output of said third means, for recording variations in the ratio of the intensities of said first and second wavelengths, said fourth means comprising means for displaying the signal output of said second amplifier.
Claim 2
Dependent Claim
398 words
A spectrophotometric measurement system comprising: first means for scanning a first beam of light having first and second wavelength components over a sample of a material, the constituents of which occupy a substantially fixed position within said material, to be spectroanalyzed, said first and second wavelength components impinging upon said sample along the same light path; second means, disposed relative to said sample upon which said first beam of light has impinged, for receiving said first beam of light after it has impinged upon said sample and for generating first and second electrical signals representative of the intensities of said first and second wavelength components, said second means comprising means for separating said first beam of light, after it has impinged upon said sample, into first and second portions, a first filter disposed in alignment with the direction of said first portion of the separated beam of light and adapted to pass a beam of said first wavelength therethrough, a second filter disposed in alignment with the direction of said second portion of the separated beam of light and adapted to pass a beam of said second wavelength therethrough, a first image receiving unit for receiving an image of the sample to be analyzed, said image being carried by said first separated beam portion, and a second image receiving unit adapted to receive an image of the sample which is carried by said second separated beam portion; third means, responsive to said first and second electrical signals generated by said second means, for producing a third signal representative of the ratio of said first and second signals, said third means including first and second amplifier means, respectively disposed to amplify the outputs of said first and second image receiving units, an arithmetic amplifier coupled to the output of said first amplifier means and a reference signal input, for comparing the output of said first amplifier means with said reference signal, to thereby control said first amplifier means in response to variations in the output of said first amplifier means, and for supplying the output from said arithmetic amplifier to said second amplifier means as a gain control signal; and fourth means, responsive to the output of said third means, for recording variations in the ratio of the intensities of said first and second wavelengths, said fourth means comprising means for displaying the signal output of said second amplifier.
Claim 3
Dependent Claim
398 words
A spectrophotometric measurement system comprising: first means for scanning a first beam of light having first and second wavelength components over a sample of a material, the constituents of which occupy a substantially fixed position within said material, to be spectroanalyzed, said first and second wavelength components impinging upon said sample along the same light path; second means, disposed relative to said sample upon which said first beam of light has impinged, for receiving said first beam of light after it has impinged upon said sample and for generating first and second electrical signals representative of the intensities of said first and second wavelength components, said second means comprising means for separating said first beam of light, after it has impinged upon said sample, into first and second portions, a first filter disposed in alignment with the direction of said first portion of the separated beam of light and adapted to pass a beam of said first wavelength therethrough, a second filter disposed in alignment with the direction of said second portion of the separated beam of light and adapted to pass a beam of said second wavelength therethrough, a first image receiving unit for receiving an image of the sample to be analyzed, said image being carried by said first separated beam portion, and a second image receiving unit adapted to receive an image of the sample which is carried by said second separated beam portion; third means, responsive to said first and second electrical signals generated by said second means, for producing a third signal representative of the ratio of said first and second signals, said third means including first and second amplifier means, respectively disposed to amplify the outputs of said first and second image receiving units, an arithmetic amplifier coupled to the output of said first amplifier means and a reference signal input, for comparing the output of said first amplifier means with said reference signal, to thereby control said first amplifier means in response to variations in the output of said first amplifier means, and for supplying the output from said arithmetic amplifier to said second amplifier means as a gain control signal; and fourth means, responsive to the output of said third means, for recording variations in the ratio of the intensities of said first and second wavelengths, said fourth means comprising means for displaying the signal output of said second amplifier.
Claim 4
Dependent Claim
398 words
A spectrophotometric measurement system comprising: first means for scanning a first beam of light having first and second wavelength components over a sample of a material, the constituents of which occupy a substantially fixed position within said material, to be spectroanalyzed, said first and second wavelength components impinging upon said sample along the same light path; second means, disposed relative to said sample upon which said first beam of light has impinged, for receiving said first beam of light after it has impinged upon said sample and for generating first and second electrical signals representative of the intensities of said first and second wavelength components, said second means comprising means for separating said first beam of light, after it has impinged upon said sample, into first and second portions, a first filter disposed in alignment with the direction of said first portion of the separated beam of light and adapted to pass a beam of said first wavelength therethrough, a second filter disposed in alignment with the direction of said second portion of the separated beam of light and adapted to pass a beam of said second wavelength therethrough, a first image receiving unit for receiving an image of the sample to be analyzed, said image being carried by said first separated beam portion, and a second image receiving unit adapted to receive an image of the sample which is carried by said second separated beam portion; third means, responsive to said first and second electrical signals generated by said second means, for producing a third signal representative of the ratio of said first and second signals, said third means including first and second amplifier means, respectively disposed to amplify the outputs of said first and second image receiving units, an arithmetic amplifier coupled to the output of said first amplifier means and a reference signal input, for comparing the output of said first amplifier means with said reference signal, to thereby control said first amplifier means in response to variations in the output of said first amplifier means, and for supplying the output from said arithmetic amplifier to said second amplifier means as a gain control signal; and fourth means, responsive to the output of said third means, for recording variations in the ratio of the intensities of said first and second wavelengths, said fourth means comprising means for displaying the signal output of said second amplifier.
References Cited (Backward Citations)
US2803161A
Cited
US3306156A
Cited
US3089382A
Cited
US3428401A
Cited
US3518014A
Cited
US3413482A
Cited
US3586441A
Cited
US3547542A
Cited
US3522739A
Cited
US3588253A
Cited
US3633012A
Cited
US3600099A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-06-02 | 1978-12-02 | 1979-06-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-06-02 | 1982-12-02 | 1983-06-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-06-02 | 1986-12-02 | 1987-06-03 | $7700.00 | Window Closed / Lapsed |