US3882597A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for making a test probe for semiconductor devices
Assignee: AT&T Inc
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Filing: 1974-01-31
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Granted: 1975-05-13
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Expires: 1994-01-31
Abstract
Abstract An intricate micro-probe for testing beam-lead semiconductor devices such as integrated circuits is formed from a molded insulator, a die-cut compensating member and photo-etched contact elements. The configuration of the various elements of the probe is such that mechanized fabrication and assembly of the small probe are possible. The contact elements are photo-etched from a blank which also yields a connected frame having a unique expansion feature permitting three-dimensional shaping of the elements without stretching the elements. The contact elements are thermally embedded into the plastic insulator. A shaping of the contact elements is accomplished with a pyramidal shaping tool and a cut-off blade which trims the contact elements against the pyramidal shaping tool.
Inventors
- 👤 George A Chayka
- 👤 Eric J Persson
- 👤 Norbert M Ziobro
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 22:45
CPC Classifications
H; H05; H05K; H05K7/00; H05K7/02; H05K7/12; G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; G01R1/07342; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49121; Y10T29/53; Y10T29/53022
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
99 words
A method of producing a test probe having a plurality of cantilevered contact elements supported on an insulator in a desired array with the free ends of the elements adapted to contact individual leads of an article to be tested, which comprises the steps of: forming the contact elements by photo-etching a planar metallic member to produce a frame portion and an expandable portion connecting the contact elements with the frame portion; and shaping the contact elements into a non-planar configuration while holding the frame portion, said shaping being facilitated by an increase in length of the expandable portion.
Claim 2
Independent Claim
99 words
A method of producing a test probe having a plurality of cantilevered contact elements supported on an insulator in a desired array with the free ends of the elements adapted to contact individual leads of an article to be tested, which comprises the steps of: forming the contact elements by photo-etching a planar metallic member to produce a frame portion and an expandable portion connecting the contact elements with the frame portion; and shaping the contact elements into a non-planar configuration while holding the frame portion, said shaping being facilitated by an increase in length of the expandable portion.
Claim 3
Independent Claim
170 words
A method of producing a test probe wherein a plurality of cantilevered contact elements are supported on an insulator in a desired array with the free ends of the elements adapted to contact individual leads of an article to be tested and the fixed ends of the elements are adapted to contact a planar test-set input connector, comprising the steps of: clamping the insulator while permitting a portion of the cantilevered elements to extend out of the clamp arrangement; bending the unclamped portions of the cantilevered elements by sliding a member, having an inclined bearing face, perpendicularly to the plane on which the cantilevered elements are clamped so that the unclamped portions of the elements are held by the slidable member; and moving a cut-off blade against the slidable member in the plane of the clamped elements to cut-away excess portions of the free ends of the elements which have been bent by the said member, whereby a desired shaping of the free ends of the contact elements is achieved.
Claim 4
Independent Claim
170 words
A method of producing a test probe wherein a plurality of cantilevered contact elements are supported on an insulator in a desired array with the free ends of the elements adapted to contact individual leads of an article to be tested and the fixed ends of the elements are adapted to contact a planar test-set input connector, comprising the steps of: clamping the insulator while permitting a portion of the cantilevered elements to extend out of the clamp arrangement; bending the unclamped portions of the cantilevered elements by sliding a member, having an inclined bearing face, perpendicularly to the plane on which the cantilevered elements are clamped so that the unclamped portions of the elements are held by the slidable member; and moving a cut-off blade against the slidable member in the plane of the clamped elements to cut-away excess portions of the free ends of the elements which have been bent by the said member, whereby a desired shaping of the free ends of the contact elements is achieved.
Claim 5
Dependent Claim
71 words
The method of producing test probes of claim 2 wherein the insulator has a picture-frame configuration with an open center portion and all of the free ends of the contact elements extend into the open center portion; wherein the slidable member has a pyramidal configuration and is inserted through the center of the insulator member; and wherein cut-off blades are operated against all of the inclined faces of the sliding member.
Claim 6
Independent Claim
238 words
A method of producing a test probe having a plurality of cantilevered contact elements supported on an insulator in a desired array with the free ends of the elements adapted to contact individual leads of an article to be tested, which comprises the steps of: forming the contact elements by photo-etching a planAr metallic member to produce a frame portion and an expansion portion connecting the contact elements with the frame portion; shaping the contact elements into a non-planar configuration while holding the frame portion, said shaping being facilitated by an increase in length of the expansion portion; heating at least localized portions of the insulator; pressing portions of the contact elements against the heated portions of the insulator to embed the elements into the surface of the insulator; clamping the insulator while permitting a portion of the cantilevered elements to extend out of the clamp arrangement; bending the unclamped portions of the cantilevered elements by sliding a member, having an inclined bearing face, perpendicularly to the plane on which the cantilevered elements are clamped so that the unclamped portions of the elements are held by the slidable member; and moving a cut-off blade against the slidable member in the plane of the clamped elements to cut-away excess portions of the free ends of the elements which have been bent by the said member, whereby a desired shaping of the free ends of the contact elements is achieved.
Claim 7
Independent Claim
238 words
A method of producing a test probe having a plurality of cantilevered contact elements supported on an insulator in a desired array with the free ends of the elements adapted to contact individual leads of an article to be tested, which comprises the steps of: forming the contact elements by photo-etching a planAr metallic member to produce a frame portion and an expansion portion connecting the contact elements with the frame portion; shaping the contact elements into a non-planar configuration while holding the frame portion, said shaping being facilitated by an increase in length of the expansion portion; heating at least localized portions of the insulator; pressing portions of the contact elements against the heated portions of the insulator to embed the elements into the surface of the insulator; clamping the insulator while permitting a portion of the cantilevered elements to extend out of the clamp arrangement; bending the unclamped portions of the cantilevered elements by sliding a member, having an inclined bearing face, perpendicularly to the plane on which the cantilevered elements are clamped so that the unclamped portions of the elements are held by the slidable member; and moving a cut-off blade against the slidable member in the plane of the clamped elements to cut-away excess portions of the free ends of the elements which have been bent by the said member, whereby a desired shaping of the free ends of the contact elements is achieved.
Claim 8
Independent Claim
98 words
A method of producing a test probe having a plurality of cantilevered contact elements supported on an insulator in a desired array with the ends of the elements adapted to contact individual leads of an article to be tested, comprising the steps of: selectively removing portions of a planar conductive member to produce the contact elements, a frame portion and an expandable portion connecting the contact elements with the frame portion; and shaping the contact elements into a non-planar configuration while holding the frame portion, said shaping being facilitated by an increase in length of the expandable portion.
Claim 9
Independent Claim
98 words
A method of producing a test probe having a plurality of cantilevered contact elements supported on an insulator in a desired array with the ends of the elements adapted to contact individual leads of an article to be tested, comprising the steps of: selectively removing portions of a planar conductive member to produce the contact elements, a frame portion and an expandable portion connecting the contact elements with the frame portion; and shaping the contact elements into a non-planar configuration while holding the frame portion, said shaping being facilitated by an increase in length of the expandable portion.
Claim 10
Dependent Claim
20 words
A method as recited in claim 5 wherein the portions of the planar conductive member are selectively removed by photo-etching.
Claim 11
Dependent Claim
33 words
A method as recited in claim 5 further comprising: affixing the contact elements to an insulating frame while said elements are held in fixed relative position by the frame portion and expandable portion.
Claim 12
Dependent Claim
76 words
The method of producing a test probe of claim 7 wherein: a resilient member is disposed between the insulator, the contact elements, and portions of the contact elements adjacent the resilient member are embedded in the insulator material to hold the resilient member captive, whereby, when the test probe is connected to the planar test-set input connector, low impedance electrical contact is assured between all of the contact elements and the corresponding portions of the connector.
Claim 13
Dependent Claim
22 words
A method as recited in claim 7 further comprising the step of severing the elements from the frame portion and expandable portion.
Claim 14
Dependent Claim
54 words
A method as recited in claim 5 further comprising: heating at least localized portions of the insulator; and pressing portions of the contact elements against the heated portions of the insulator to embed the portions into the surface of the insulator such that other portions of the contact elements are cantilevered from the insulator.
Claim 15
Dependent Claim
27 words
A method as recited in claim 10 wherein the heating is accomplished by pressing the portions of the contact elements against the insulator with a heated member.
Claim 16
Dependent Claim
81 words
A method as recited in claim 10 further comprising: bending the cantilevered portions of the contact elements by sliding a member having an inclined bearing face perpendicularly to the plane in which the cantilevered elements are embedded; moving a cut-off blade against the slidable member in a plane parallel to the plane of the embedded elements to cut away excess portions of the ends of the cantilevered elements, whereby a desired shaping of the ends of the contact elements is achieved.
Claim 17
Dependent Claim
25 words
A method as recited in claim 12 wherein the slidable member has a pyramidal configuration and is inserted through a central opening in the insulator.
Claim 18
Dependent Claim
20 words
A method as recited in claim 13 wherein tHe cut-off blades are operated simultaneously against all of the cantilevered elements.
Claim 19
Dependent Claim
73 words
A method as recited in claim 5 wherein the insulator is annular in shape with a central opening and a pair of opposed surfaces generally parallel to each other and wherein one of said opposed surfaces has two generally concentric levels, the inner concentric level protruding relative to the outer concentric level, and comprising the additional step of: embedding a portion of each of the contact elements in both levels of said insulator.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-05-12 | 1978-11-11 | 1979-05-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-05-12 | 1982-11-11 | 1983-05-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-05-12 | 1986-11-11 | 1987-05-13 | $7700.00 | Window Closed / Lapsed |