Flip chip module with non-uniform solder wettable areas on the substrate

Claim 2

In a semiconductor module formed of a chip mounted to a substrate each having first and second major surfaces the improvement comprising a plurality of solder wettable metal regions on the first major face of said chip, a first plurality of solder wettable metal regions of a first size on the first major face of said substrate, a second plurality of solder wettable metal regions of another size substantially different from the first size on said first major face of said substrate, and plural stress resistant solder means for connecting respective ones of the metal regions on said chip and substrate, whereby said connection means have a first stress resistivity or a second stress resistivity different from the first dependent on whether connection is made to one of said first or second pluralities of wettable regions on said substrate.

Claim 3

In a semiconductor module formed of a chip mounted to a substrate each having first and second major surfaces the improvement comprising a plurality of solder wettable metal regions on the first major face of said chip, a first plurality of solder wettable metal regions of a first size on the first major face of said substrate, a second plurality of solder wettable metal regions of another size substantially different from the first size on said first major face of said substrate, and plural stress resistant solder means for connecting respective ones of the metal regions on said chip and substrate, whereby said connection means have a first stress resistivity or a second stress resistivity different from the first dependent on whether connection is made to one of said first or second pluralities of wettable regions on said substrate.

Claim 4

In a semiconductor module formed of a chip mounted to a substrate each having first and second major surfaces the improvement comprising a plurality of solder wettable metal regions on the first major face of said chip, a first plurality of solder wettable metal regions of a first size on the first major face of said substrate, a second plurality of solder wettable metal regions of another size substantially different from the first size on said first major face of said substrate, and plural stress resistant solder means for connecting respective ones of the metal regions on said chip and substrate, whereby said connection means have a first stress resistivity or a second stress resistivity different from the first dependent on whether connection is made to one of said first or second pluralities of wettable regions on said substrate.

Claim 5

In the module as claimed in claim 1 wherein the first plurality of said solder wettable metal regions on said substrate are smaller in area than the second plurality of solder wettable metal regions on said substrate.

Claim 6

In the module as claimed in claim 2 wherein said second plurality of solder wettable metal regions are positioned near the corners of said module.

Claim 7

In the module as claimed in claim 2 wherein said first plurality of solder wettable metal regions are nearer the center of said chip than said second plurality of solder wettable metal regions.

Claim 8

In the module as claimed in claim 1 further comprising conductive metal fingers on said substrate in contact with said solder wettable regions and glass dams overlying said conductive fingers to block solder on said solder wettable regions from flowing onto said conductive fingers.

Claim 9

A semiconductor module comprising a first member having first and second major faces thereof, an electrically conductive material on portions of said first major face thereof, a second member having first and second major faces thereof, an electrically conductive pattern on said first major face of said second member including regions of wettable with solder conductive material differing in size and surrounded by non-wettable with solder material, and a plurality of stress resistant solder means for interconnecting and separating said electrically conductive material on said first member with respective ones of said surrounded solder wettable regions on said second member, whereby said solder means have differing stress resistivities dependent on which ones of said surrounded solder wettable regions connection is made to on said second member.

Claim 10

A semiconductor module comprising a first member having first and second major faces thereof, an electrically conductive material on portions of said first major face thereof, a second member having first and second major faces thereof, an electrically conductive pattern on said first major face of said second member including regions of wettable with solder conductive material differing in size and surrounded by non-wettable with solder material, and a plurality of stress resistant solder means for interconnecting and separating said electrically conductive material on said first member with respective ones of said surrounded solder wettable regions on said second member, whereby said solder means have differing stress resistivities dependent on which ones of said surrounded solder wettable regions connection is made to on said second member.

Claim 11

The module as claimed in claim 6 wherein said surrounded solder wettable regions further from the center of said first member are larger than said other surrounded solder wettable regions.