Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
43 words
A field ionization source comprising a plate-like porous substrate pervious to flow of substantially all gases and a multiplicity of needle-like elements located on one surface of said substrate, said needle-like elements being highly uniform in space and uniformly spaced on said substrate.
Claim 2
Dependent Claim
43 words
A field ionization source comprising a plate-like porous substrate pervious to flow of substantially all gases and a multiplicity of needle-like elements located on one surface of said substrate, said needle-like elements being highly uniform in space and uniformly spaced on said substrate.
Claim 3
Dependent Claim
29 words
A field ionization source, as defined in claim 1, wherein both said substrate surface on which the needle-like elements are deposited and said needle-like elements consist of conductive material.
Claim 4
Dependent Claim
74 words
A field ionization source comprising a plate-like porous substrate pervious to flow of substantially all gases and a multiplicity of needle-like elements located on one surface of said substrate, said substrate having uniformly spaced land areas thereon defined by uniformly spaced apertures therethrough which provide the porosity, said needle-like elements being highly uniform in space, uniformly spaced oN said substrate, comprised of conductive material and located on the said land areas of said substrate.
Claim 5
Dependent Claim
74 words
A field ionization source comprising a plate-like porous substrate pervious to flow of substantially all gases and a multiplicity of needle-like elements located on one surface of said substrate, said substrate having uniformly spaced land areas thereon defined by uniformly spaced apertures therethrough which provide the porosity, said needle-like elements being highly uniform in space, uniformly spaced oN said substrate, comprised of conductive material and located on the said land areas of said substrate.
Claim 6
Dependent Claim
54 words
A field ionization source, as defined in claim 3, wherein said plate-like substrate is of a substantially nonconductive material with a plate-like conductive electrode at least on one surface thereof, said plate-like electrode having aperture therein in registry with the apertures in said nonconductive substrate and said conductive needles located on said conductive electrode.
Claim 7
Dependent Claim
111 words
A field ionization source for ionizing components of sample gases, including the structure defined in claim 1, and means to introduce a sample gas to be analyzed to the surface of said plate-like substrate opposite that occupied by said needle-like elements whereby sample gas flow is provided through said porous substrate and around said needle-like elements, grid means spaced from said needle-like elements and means for applying a potential between said grid and said needle-like elements thereby to provide an electric field therebetween whereby the said gas sample is exposed to the said electric field in the area of said needle-like elements and molecules of said gas sample are thereby ionized.
Claim 8
Dependent Claim
105 words
A field ionization source for ionizing components of sample gases, including the structure defined in claim 2, and means to introduce a sample gas to be analyzed to the surface of said plate-like substrate opposite that occupied by said needle-like elements whereby sample gas flow is provided through said porous substrate and around said needle-like elements, grid means spaced from said needle-like elements and means for applying a potential between said grid and said needle-like elements thereby to provide an electric field therebetween whereby substantially all of the said gas sample is exposed to the said electric field in the area of said needle-like elements.
Claim 9
Dependent Claim
104 words
A field ionization source for ionizing components of sample gases, including the structure defined in claim 3, and means to introduce a sample gas to be analyzed to the surface of said plate-like substrate opposite that occupied by said needle-like elements whereby sample gas flow is provided through said porous substrate and around said needle-like elements, grid means spaced from said needle-like elements and means for applying a potential between said grid and said needle-like elements thereby to provide an electric field therebetween whereby the said gas sample is substantially all exposed to the said electric field in the area of said needle-like elements.
Claim 10
Dependent Claim
104 words
A field ionization source for ionizing components of sample gases, including the structure defined in claim 4, and means to introduce a sample gas to be analyzed to the surface of said plate-like substrate opposite that occupied by said needle-like elements whereby sample gas flow is provided through said porous substrate and around said needle-like elements, grid means spaced from said needle-like elements and means for applying a potential between said grid and said needle-like elements thereby to provide an electric field therebetween whereby the said gas sample is substantially all exposed to the said electric field in the area of said needle-like elements.
Claim 11
Dependent Claim
38 words
A mass spectrometer, including the structure as defined in claim 5, including means to focus said ions into an ion beam and means to analyze ions in said beams whereby constituent components of said sample gas are determined.
Claim 12
Dependent Claim
38 words
A mass spectrometer, including the structure as defined in claim 6, including means to focus said ions into an ion beam and means to analyze ions in said beams whereby constituent components of said sample gas are determined.
Claim 13
Dependent Claim
38 words
A mass spectrometer, including the structure as defined in claim 7, including means to focus said ions into an ion beam and means to analyze ions in said beams whereby constituent components of said sample gas are determined.
Claim 14
Dependent Claim
38 words
A mass spectrometer, including the structure as defined in claim 8, including means to focus said ions into an ion beaM and means to analyze ions in said beams whereby constituent components of said sample gas are determined.