US3848190A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Signal conditioner test set
Assignee: National Aeronautics and Space Administration
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Filing: 1973-03-30
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Granted: 1974-11-12
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Expires: 1993-03-30
Abstract
Abstract A system for testing components contained in a signal conditioning module having a transistor and capacitor included in a circuit. The system includes a housing with a socket provided therein, into which the module to be tested is plugged. A test switch is provided for selectively connecting a variable load to either a transistor or capacitor in the circuit for testing the operation of such. A signal generating circuit is provided for generating signals for use in testing the components of the module.
Inventors
- 👤 W Houck
- 👤 J Stigberg
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 10:37
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2832; G01R31/2836; G01R31/2839
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
286 words
A system for testing components contained in a signal producing module having a transistor with base, emitter and collector electrodes, first, secoNd and third pins coupled to said electrodes respectively, a fourth pin coupled to one side of a capacitor while the other side of said capacitor is connected to said base electrode of said transistor, said system comprising: A. a housing having a front panel, B. first, second, third and fourth sockets adapted for receiving a correspondingly numbered pin of said module for testing said module, C. a variable resistance load having a first terminal connected to ground, D. switch means having a first and second operable position, E. said switch means when in said first operable position coupling a second terminal of said variable resistance load to said emitter electrode of said transistor by means of the second socket, F. a signal generating circuit coupled between a reference terminal connected to ground and said third socket for applying a signal to said collector electrode of said transistor, said signal generator also having means for applying a second signal between said first terminal and said reference terminal, G. an oscilloscope having a reference terminal connected to ground and a testing terminal, H. means for connecting said testing terminal of said oscilloscope to said second socket when said switch means is in said first operable position for producing a picture of the wave form appearing at said emitter electrode, and I. said switch means when in said second operable position connecting said second terminal of variable resistance load to said one side of said capacitor by means of the fourth socket and to said testing terminal of said oscilloscope for testing the operability of said capacitor.
Claim 2
Independent Claim
286 words
A system for testing components contained in a signal producing module having a transistor with base, emitter and collector electrodes, first, secoNd and third pins coupled to said electrodes respectively, a fourth pin coupled to one side of a capacitor while the other side of said capacitor is connected to said base electrode of said transistor, said system comprising: A. a housing having a front panel, B. first, second, third and fourth sockets adapted for receiving a correspondingly numbered pin of said module for testing said module, C. a variable resistance load having a first terminal connected to ground, D. switch means having a first and second operable position, E. said switch means when in said first operable position coupling a second terminal of said variable resistance load to said emitter electrode of said transistor by means of the second socket, F. a signal generating circuit coupled between a reference terminal connected to ground and said third socket for applying a signal to said collector electrode of said transistor, said signal generator also having means for applying a second signal between said first terminal and said reference terminal, G. an oscilloscope having a reference terminal connected to ground and a testing terminal, H. means for connecting said testing terminal of said oscilloscope to said second socket when said switch means is in said first operable position for producing a picture of the wave form appearing at said emitter electrode, and I. said switch means when in said second operable position connecting said second terminal of variable resistance load to said one side of said capacitor by means of the fourth socket and to said testing terminal of said oscilloscope for testing the operability of said capacitor.
Claim 3
Dependent Claim
46 words
The systems as set forth in claim 1, wherein said signal generating means includes, A. a D.C. power supply, B. a pulse producing means, and C. switch means for selectively coupling either said D.C. power supply or said pulse producing means to said module being tested.
Claim 4
Dependent Claim
43 words
The system as set forth in claim 1, wherein said variable resistance load includes, A. a plurality of resistors of different resistance values, and B. a selective switch means for selecting one of said resistors for determining the value of said resistance load.
Claim 5
Dependent Claim
54 words
The system as set forth in claim 1, wherein said signal generating circuit includes, A. an A.C. power supply, B. a circuit including a full wave recitifer coupled to said A.C. power supply generating a D.C. voltage, and C. an oscillator means coupled to said full wave rectifier for generating a chain of pulses.
References Cited (Backward Citations)
US3363178A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-11-11 | 1978-05-13 | 1978-11-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-11-11 | 1982-05-13 | 1982-11-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-11-11 | 1986-05-13 | 1986-11-12 | $7700.00 | Window Closed / Lapsed |