US3845401A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Sense amplifier threshold tester
Assignee: Bull HN Information Systems Italia SpA
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Filing: 1973-02-05
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Granted: 1974-10-29
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Expires: 1993-02-05
Abstract
Abstract The complement digital output of a memory sense amplifier circuit under test is integrated and fed back as the input signal of the circuit. When the input signal exceeds a predetermined reference signal by a small increment which is characteristic of the sense amplifier under test, the binary output of the sense amplifier changes state. The difference between the input signal level and the reference voltage level is detected, amplified, and compared with a predetermined error reference voltage. If the amplified difference voltage exceeds the predetermined error voltage, the device is rejected.
Inventors
- 👤 C Troiani
- 👤 G Tolzman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 20:08
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
94 words
A method for dynamically testing the threshold characteristics of a sense amplifier circuit, comprising the steps of: applying a predetermined reference voltage to the sense amplifier being tested; integrating a complement digital output signal of the sense amplifier being tested; applying the integrated output signal to the sense amplifier circuit being tested as an input voltage; detecting the difference between the predetermined reference voltage and the input voltage; comparing the detected difference voltage with a predetermined error voltage; rejecting the sense amplifier circuit being tested when the difference voltage exceeds the predetermined error voltage.
Claim 2
Independent Claim
94 words
A method for dynamically testing the threshold characteristics of a sense amplifier circuit, comprising the steps of: applying a predetermined reference voltage to the sense amplifier being tested; integrating a complement digital output signal of the sense amplifier being tested; applying the integrated output signal to the sense amplifier circuit being tested as an input voltage; detecting the difference between the predetermined reference voltage and the input voltage; comparing the detected difference voltage with a predetermined error voltage; rejecting the sense amplifier circuit being tested when the difference voltage exceeds the predetermined error voltage.
Claim 3
Independent Claim
172 words
A method of dynamically testing the threshold characteristics of a sense amplifier circuit of the type having an input stage comparing an input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said method comprising the steps of: applying a predetermined reference voltage to the sense amplifier circuit being tested; integrating a complement digital output signal of the sense amplifier being tested to remove the high frequency component thereof; attenuating the integrated output signal such that the average voltage about which the attenuated signal varies approaches the reference voltage; applying the integrated and attenuated output signal to the input stage of the sense amplifier circuit being tested as the input voltage; detecting the difference between the reference voltage and the input voltage; comparing the detected difference voltage with a predetermined error voltage; and rejecting the sense amplifier circuit being tested when the difference voltage exceeds the predetermined error voltage.
Claim 4
Independent Claim
172 words
A method of dynamically testing the threshold characteristics of a sense amplifier circuit of the type having an input stage comparing an input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said method comprising the steps of: applying a predetermined reference voltage to the sense amplifier circuit being tested; integrating a complement digital output signal of the sense amplifier being tested to remove the high frequency component thereof; attenuating the integrated output signal such that the average voltage about which the attenuated signal varies approaches the reference voltage; applying the integrated and attenuated output signal to the input stage of the sense amplifier circuit being tested as the input voltage; detecting the difference between the reference voltage and the input voltage; comparing the detected difference voltage with a predetermined error voltage; and rejecting the sense amplifier circuit being tested when the difference voltage exceeds the predetermined error voltage.
Claim 5
Independent Claim
189 words
A method for dynamically testing the threshold characteristics of a sense amplifier circuit of the type having an input stage comparing an input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said method comprising the steps of: applying a predetermined reference voltage to a reference amplifier of the input stage of the sense amplifier circuit being tested; converting the complement digital output signal of the sense amplifier being tested to the integrated voltage analog of the digital output signal; attenuating the converted output signal such that the average voltage about which the attenuated signal varies approaches the predetermined reference voltage; feeding back the converted and attenuated output signal to the input stage of the sense amplifier as the input voltage; detecting the difference between the predetermined reference voltage and the input voltage; amplifying the detected difference voltage; comparing the amplified difference voltage with a predetermined reference error voltage; rejecting the sense amplifier being tested when the amplified difference voltage exceeds the predetermined reference error voltage.
Claim 6
Independent Claim
189 words
A method for dynamically testing the threshold characteristics of a sense amplifier circuit of the type having an input stage comparing an input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said method comprising the steps of: applying a predetermined reference voltage to a reference amplifier of the input stage of the sense amplifier circuit being tested; converting the complement digital output signal of the sense amplifier being tested to the integrated voltage analog of the digital output signal; attenuating the converted output signal such that the average voltage about which the attenuated signal varies approaches the predetermined reference voltage; feeding back the converted and attenuated output signal to the input stage of the sense amplifier as the input voltage; detecting the difference between the predetermined reference voltage and the input voltage; amplifying the detected difference voltage; comparing the amplified difference voltage with a predetermined reference error voltage; rejecting the sense amplifier being tested when the amplified difference voltage exceeds the predetermined reference error voltage.
Claim 7
Independent Claim
186 words
A method for dynamically testing the threshold characteristics of an integrated circuit sense amplifier module of the type having an input stage comparing a differential input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said method comprising the steps of: applying a predetermined reference voltagE to reference amplifier of the input stage of the sense amplifier module being tested; complementing the digital output signal; integrating the complemented digital output signal to remove the high-frequency component therefrom; attenuating the integrated output signal such that the average voltage about which the attenuated signal varies approaches the predetermined reference voltage; applying the attenuated signal to the input stage of the sense amplifier module being tested as the differential input voltage; detecting the difference between the predetermined reference voltage and the differential input voltage; amplifying the detected difference voltage; comparing the amplified difference voltage with a predetermined error voltage; rejecting the sense amplifier module being tested when the amplified difference voltage exceeds the predetermined error voltage.
Claim 8
Independent Claim
186 words
A method for dynamically testing the threshold characteristics of an integrated circuit sense amplifier module of the type having an input stage comparing a differential input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said method comprising the steps of: applying a predetermined reference voltagE to reference amplifier of the input stage of the sense amplifier module being tested; complementing the digital output signal; integrating the complemented digital output signal to remove the high-frequency component therefrom; attenuating the integrated output signal such that the average voltage about which the attenuated signal varies approaches the predetermined reference voltage; applying the attenuated signal to the input stage of the sense amplifier module being tested as the differential input voltage; detecting the difference between the predetermined reference voltage and the differential input voltage; amplifying the detected difference voltage; comparing the amplified difference voltage with a predetermined error voltage; rejecting the sense amplifier module being tested when the amplified difference voltage exceeds the predetermined error voltage.
Claim 9
Dependent Claim
265 words
Apparatus for dynamically testing the threshold characteristics of an integrated circuit memory sense amplifier module of the type having an input stage comparing a differential input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said apparatus comprising: an integrator circuit having an input terminal connected to the output stage of the sense amplifier module being tested; an attenuator comprising first and second voltage divider resistors connected in series between an output terminal of the integrator circuit and ground, the junction point of said first and second resistors connected to the input stage of the sense amplifier module under test; a reference voltage source connected to a reference voltage amplifier of the input stage of the sense amplifier module under test; a difference amplifier circuit having a difference voltage output terminal and first and second input terminals, the junction point of said first and second resistors connected to the first input terminal, the reference voltage source connected to the second input terminal; an error reference voltage source; a comparator circuit having an error output terminal and signal and reference input terminals, the reference input terminal connected to the error reference voltage source, the signal input terminal connected to the difference voltage output terminal of the difference amplifier; and an indicator connected to the error output terminal of the comparator circuit and actuated in response to an error signal produced by the comparator circuit when the difference voltage exceeds the error reference voltage.
Claim 10
Dependent Claim
265 words
Apparatus for dynamically testing the threshold characteristics of an integrated circuit memory sense amplifier module of the type having an input stage comparing a differential input voltage with a reference voltage, and an output stage responsive to the difference between the input and reference voltages to produce a digital output signal representative of the polarity of the difference, said apparatus comprising: an integrator circuit having an input terminal connected to the output stage of the sense amplifier module being tested; an attenuator comprising first and second voltage divider resistors connected in series between an output terminal of the integrator circuit and ground, the junction point of said first and second resistors connected to the input stage of the sense amplifier module under test; a reference voltage source connected to a reference voltage amplifier of the input stage of the sense amplifier module under test; a difference amplifier circuit having a difference voltage output terminal and first and second input terminals, the junction point of said first and second resistors connected to the first input terminal, the reference voltage source connected to the second input terminal; an error reference voltage source; a comparator circuit having an error output terminal and signal and reference input terminals, the reference input terminal connected to the error reference voltage source, the signal input terminal connected to the difference voltage output terminal of the difference amplifier; and an indicator connected to the error output terminal of the comparator circuit and actuated in response to an error signal produced by the comparator circuit when the difference voltage exceeds the error reference voltage.
References Cited (Backward Citations)
US3581198A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-10-28 | 1978-04-29 | 1978-10-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-10-28 | 1982-04-29 | 1982-10-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-10-28 | 1986-04-29 | 1986-10-29 | $7700.00 | Window Closed / Lapsed |