US3836393A
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Process for applying stress-balanced coating composite to dielectric surface of gas discharge device
Assignee: OI Glass Inc
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Filing: 1971-07-14
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Granted: 1974-09-17
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Expires: 1991-07-14
Abstract
Abstract There is disclosed a process for applying a stress-balanced coating composite to each dielectric surface of a multiple gaseous discharge display/memory panel having an electrical memory and capable of producing a visual display, the panel being characterized by an ionizable gaseous medium in a gas chamber formed by a pair of opposed dielectric material charge storage members, each of which is respectively backed by an array of electrodes, the electrodes behind each dielectric material member being oriented with respect to the electrodes behind the opposing dielectric material member so as to define a plurality of discrete discharge volumes constituting a discharge unit. The surface of each dielectric material charge storage member is selectively coated with a first layer of at least one compound of Group IIA, Al, Si, Ti, Zr, Hf, or mixtures thereof; a second layer of at least one compound of Group IIA, Al, Si, Ti, Zr, Hf, or mixtures thereof which is chemically different from the first layer; and a third layer of an electron-emissive material; the combination of the first and second layers being sufficient to prevent ion migration from the dielectric to the third layer and sufficient to provide a thermally and structurally stable base for the third layer; and the second layer being chemically inert relative to the third layer.
Inventors
- 👤 R Ernsthausen
- 👤 B Emch
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 15:01
CPC Classifications
H; H01; H01J; H01J11/00; H01J11/10; H01J11/12
Claims Analysis
Total Claims: 38
Claim 1
Independent Claim
16 words
The process of claim 1 wherein each layer is applied by means of electron beam evaporation.
Claim 2
Dependent Claim
26 words
The process of claim 1 wherein each dielectric member is heated to a temperature of about 150*F to about 600*F and the three-layer composite applied thereto.
Claim 3
Dependent Claim
21 words
The process of claim 1 wherein the thickness of each layer is about 200 angstrom units to about 10,000 angstrom units.
Claim 4
Dependent Claim
21 words
The process of claim 1 wherein the third layer is selected from GaAs, GaP, InAs, InSb, InP, NiO, AgOCs, and AuOCs.
Claim 5
Dependent Claim
11 words
The process of claim 1 wherein all three layers are oxides.
Claim 6
Dependent Claim
17 words
The process of claim 6 wherein the third layer is selected from magnesium oxide and lead oxide.
Claim 7
Dependent Claim
18 words
The process of claim 1, wherein the compounds of the first and second layers are selected from oxides.
Claim 8
Dependent Claim
19 words
The process of claim 8, wherein the third layer is selected from CsF, CsI, lead oxide and magnesium oxide.
Claim 9
Dependent Claim
17 words
The process of claim 1 wherein the thickness of each layer is at least 100 angstrom units.
Claim 10
Dependent Claim
20 words
The process of claim 10, wherein said first, second, and third layers are silica, aluminum oxide and lead oxide respectively.
Claim 11
Dependent Claim
20 words
The process of claim 10, wherein said first, second, and third layers are silica, zirconium oxide, and lead oxide respectively.
Claim 12
Dependent Claim
21 words
The process of claim 10, wherein said first, second, and third layers are magnesium oxide, zirconium oxide, and lead oxide respectively.
Claim 13
Dependent Claim
19 words
The process of claim 10, wherein said first, second, and third layers are Si3N4, silica, and lead oxide respectively.
Claim 14
Dependent Claim
21 words
The process of claim 10, wherein said first, second, and third layers are magnesium oxide, aluminum oxide, and lead oxide respectively.
Claim 15
Dependent Claim
20 words
The process of claim 10, wherein said first, second, and third layers are silica, aluminum oxide, and magnesium oxide respectively.
Claim 16
Dependent Claim
20 words
The process of claim 10 wherein said first, second, and third layers are silica, zirconium oxide, and magnesium oxide respectively.
Claim 17
Dependent Claim
21 words
The process of claim 10 wherein said first, second, and third layers are magnesium oxide, zirconium oxide, and magnesium oxide respectively.
Claim 18
Dependent Claim
19 words
The process of claim 10 wherein said first, second, and third layers are Si3N4, silica, and magnesium oxide respectively.
Claim 19
Dependent Claim
21 words
The process of claim 10 wherein said first, second, and third layers are magnesium oxide, aluminum oxide, and magnesium oxide respectively.
Claim 20
Dependent Claim
175 words
In a process for manufacturing a gaseous discharge display/memory device wherein an array of electrodes is applied to a glass substrate and a dielectric layer is applied over the electrodes, and wherein a pair of glass substrates are sealed, dielectric to dielectric, to form a chamber which is filled with an ionizable gas, the improvement which comprises electron beam evaporating and depositing upon the surface of each dielectric a three-layer composite; the first layer consisting of at least one compound of Group IIA, Al, Si, Ti, Zr, Hf, or mixtures thereof; the second layer consisting of at least one compound of Group IIA, Al, Si, Ti, Zr, Hf, or mixtures thereof which is chemically different fRom the first layer; and the third layer consisting of an electron-emissive material; the combination of the first and second layers being sufficient to prevent ion migration from the dielectric to the third layer and sufficient to provide a thermally and structurally stable base for the third layer; and the second layer being chemically inert relative to the third layer.
Claim 21
Dependent Claim
24 words
The process of claim 21 wherein a sealing composition is applied to the perimeter of each substrate prior to the applying of the composite.
Claim 22
Dependent Claim
17 words
The process of claim 21 wherein the thickness of each layer is at least 100 angstrom units.
Claim 23
Dependent Claim
21 words
The process of claim 21 wherein the thickness of each layer is about 200 angstrom units to about 10,000 angstrom units.
Claim 24
Dependent Claim
21 words
The process of claim 21 wherein the third layer is selected from GaAs, GaP, InAs, InSb, InP, NiO, AgOCs, and AuOCs.
Claim 25
Dependent Claim
20 words
The process of claim 21 wherein said first, second, and third layers are silica, aluminum oxide and lead oxide respectively.
Claim 26
Dependent Claim
20 words
The process of claim 21 wherein said first, second, and third layers are silica, zirconium oxide, and lead oxide respectively.
Claim 27
Dependent Claim
21 words
The process of claim 21 wherein said first, second, and third layers are magnesium oxide, zirconium oxide, and lead oxide respectively.
Claim 28
Dependent Claim
19 words
The process of claim 21 wherein said first, second, and third layers are Si3N4, silica, and lead oxide respectively.
Claim 29
Dependent Claim
21 words
The process of claim 21 wherein said first, second, and third layers are magnesium oxide, aluminum oxide, and lead oxide respectively.
Claim 30
Dependent Claim
20 words
The process of claim 21 wherein said first, second and third layers are silica, aluminum oxide, and magnesium oxide respectively.
Claim 31
Dependent Claim
20 words
The process of claim 21 wherein said first, second and third layers are silica, zirconium oxide, and magnesium oxide respectively.
Claim 32
Dependent Claim
21 words
The process of claim 21 wherein said first, second, and third layers are magnesium oxide, zirconium oxide, and magnesium oxide respectively.
Claim 33
Dependent Claim
18 words
The process of claim 21 wherein said first, second, and third layers are Si3N4, silica, and magnesium oxide.
Claim 34
Dependent Claim
21 words
The process of claim 21 wherein said first, second, and third layers are magnesium oxide, aluminum oxide, and magnesium oxide respectively.
Claim 35
Dependent Claim
24 words
The process of claim 22 wherein each layer is applied while each substrate is at a temperature of about 150*F to about 600* F.
Claim 36
Dependent Claim
30 words
The process of claim 36 wherein the first layer is magnesium oxide, the second layer is aluminum oxide, and the third layer is selected from magnesium oxide or lead oxide.
Claim 37
Dependent Claim
18 words
The process of claim 21 wherein the compounds of the first and second layers are selected from oxides.
Claim 38
Dependent Claim
19 words
The process of claim 38 wherein the third layer is selected from CsF, CsI, lead oxide and magnesium oxide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-09-16 | 1978-03-18 | 1978-09-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-09-16 | 1982-03-18 | 1982-09-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-09-16 | 1986-03-18 | 1986-09-17 | $7700.00 | Window Closed / Lapsed |