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US3832700A Expired / Lapsed US ⏱️ 0.0 years remaining

Ferroelectric memory device

Assignee: Westinghouse Electric Corp
•
Filing: 1973-04-24
•
Granted: 1974-08-27
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Expires: 1993-04-24
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Abstract

Abstract A ferroelectric memory device utilizing the remanent polarization of a thin, ferroelectric film to control the surface conductivity of a bulk semiconductor and perform the memory function. The structure of the device is similar to a conventional MIS field effect transistor with the exception that the gate insulating layer is replaced by a thin film of active ferroelectric material comprising a reversably polarizable dielectric exhibiting hysteresis.

Inventors

  • 👤 S Wu
  • 👤 M Francombe

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 03:10
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/22; G11C16/00; G11C16/02; G11C16/04; G11C16/0466; H; H10; H10B; H10B53/00; H10D; H10D30/00; H10D30/60; H10D30/701; G11C11/223

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 14 words
The memory device of claim 1 wherein said film is formed by sputtering techniques.
Claim 2
Dependent Claim 72 words
The memory device of claim 1, with no injection and extraction of carriers at the ferroelectric-semiconductor interface, wherein said substrate is formed from P-type semiconductive material, said spaced regions are N+-type, and wherein an inversion layer defining an N-type channel connecting said N+-type regions is formed when a potential is applied and then removed between said ferroelectric film and said substrate such that the film is positive with respect to the substrate.
Claim 3
Dependent Claim 73 words
The memory device of claim 1, with no injection and extraction of carriers at the ferroelectric-semiconductor interface, wherein said substrate is formed from N-type semiconductive material and said spaced regions are P+-type, and wherein an inversion layer forming a P-type channel between said P+-type regions is formed when a potential is applied and then removed between said ferroelectric film and said substrate such that the film is negative with respect to the substrate.
Claim 4
Dependent Claim 70 words
The memory device of claim 1, with injection and extraction of carriers at the ferroelectric-semiconductor interface, wherein said substrate is formed from P-type semiconductive material, said spaced regions and N+-type, and wherein an inversion layer defining an N-channel connecting said N+-type regions is formed when a potential is applied and then removed between said ferroelectric film and said substrate such that the film is negative with respect to the substrate.
Claim 5
Dependent Claim 72 words
The memory device of claim 1, with injection and extraction of carriers at the ferroelectric-semiconductor interface, wherein said substrate is formed from N-type semiconductive material and said spaced regions are P+-type, and wherein an inversion layer forming a P-type channel between said P+-type regions is formed when a potential is applied and then removed between said ferroelectric film and said substrate such that the film is positive with respect to the substrate.
Claim 6
Dependent Claim 61 words
The memory device of claim 1 including metallizations in contact with said spaced regions and a metallization overlying said film of ferroelectric material spanning the space between said regions, the metallization over said ferroelectric film acting as a gate electrode and the metallization in contact with said spaced regions forming the source and drain electrodes of a field effect transistor structure.
Claim 7
Dependent Claim 13 words
The memory device of claim 1 wherein said ferroelectric material comprises bismuth titanate.

References Cited (Backward Citations)

US2791761A Cited
US2791758A Cited
US3646527A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1977-08-26 1978-02-25 1978-08-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1981-08-26 1982-02-25 1982-08-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1985-08-26 1986-02-25 1986-08-27 $7700.00 Window Closed / Lapsed

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