US3832631A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for measuring parameters of quartz crystal units and fixture for carrying out the same
Assignee: KDDI Corp
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Filing: 1973-06-21
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Granted: 1974-08-27
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Expires: 1993-06-21
Abstract
Abstract The present invention discloses a method and fixtures for measuring parameters of quartz crystal units in the very high frequency (VHF) range. A non-reactive frequency and resistance of the crystal unit are determined, a radio-frequency voltage is applied to a series circuit composed of said crystal unit and a circuit which is adjustable to non-reactive resistance, the phase of the terminal voltage across said circuit which is adjustable to non-reactive resistance is adjusted so as to coincide with the phase of the terminal voltage across said series circuit. Next, said crystal unit is replaced by another crystal unit, and the frequency of said radio-frequency voltage is adjusted so that the above-mentioned two phases coincide. Thus the non-reactive frequencies and or resistances of a plurality of crystal units are quickly determined.
Inventors
- 👤 I Koga
- 👤 S Kobayashi
- 👤 I Okamoto
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 17:52
CPC Classifications
G; G01; G01R; G01R29/00; G01R29/22
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
203 words
A method of measuring parameters of crystal units comprising, a. determining a non-reactive frequency of a crystal unit (say A) which may be freely selected from a plurality of crystal units to be tested, b. applying radio frequency voltage to the series circuit (say A + B) composed of the crystal unit (A) and a circuit (say B) which is adjustable to non-reactive resistance at the nonreactive frequency of the crystal unit (A), c. adjusting the reactance of the circuit (B) to be non-reactive with respect to said non-reactive frequency of the crystal unit (A) so that the phase of the voltage across the series circuit (A + B) and the phase of the voltage across the circuit (B) coincide, d. replacing the crystal unit (A) by a crystal (say C) which is selected from the remainder of said plurality of crystal units, e. applying radio frequency voltage to the series circuit (C + B) and adjusting the frequency of applied voltage so that the phase of voltage across the series circuit (C + B) coincides with the phase of voltage across the circuit (B), and f. adopting the reading of frequency thus adjusted as the nonreactive frequency of the crystal unit (C).
Claim 2
Independent Claim
203 words
A method of measuring parameters of crystal units comprising, a. determining a non-reactive frequency of a crystal unit (say A) which may be freely selected from a plurality of crystal units to be tested, b. applying radio frequency voltage to the series circuit (say A + B) composed of the crystal unit (A) and a circuit (say B) which is adjustable to non-reactive resistance at the nonreactive frequency of the crystal unit (A), c. adjusting the reactance of the circuit (B) to be non-reactive with respect to said non-reactive frequency of the crystal unit (A) so that the phase of the voltage across the series circuit (A + B) and the phase of the voltage across the circuit (B) coincide, d. replacing the crystal unit (A) by a crystal (say C) which is selected from the remainder of said plurality of crystal units, e. applying radio frequency voltage to the series circuit (C + B) and adjusting the frequency of applied voltage so that the phase of voltage across the series circuit (C + B) coincides with the phase of voltage across the circuit (B), and f. adopting the reading of frequency thus adjusted as the nonreactive frequency of the crystal unit (C).
Claim 3
Dependent Claim
85 words
A method of measuring parameters of crystal units (C) according to claim 1, comprising further determining the non-reactive resistance of the circuit (B) at said non-reactive frequency of the crystal unit (A), from the ratio of the voltage across the series circuit (A + B) and the circuit (B), and determining the non-reactive resistance of the crystal (C) from the ratio of the voltage across the series circuit (C + B) and the voltage across the circuit (B) and the resistance of the circuit (B).
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-08-26 | 1978-02-25 | 1978-08-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-08-26 | 1982-02-25 | 1982-08-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-08-26 | 1986-02-25 | 1986-08-27 | $7700.00 | Window Closed / Lapsed |