US3820077A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for testing units of a program controlled data processing system
Assignee: Individual
•
Filing: 1972-02-09
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Granted: 1974-06-25
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Expires: 1992-02-09
Abstract
Abstract A method for testing system units or modules in a modularly constructed data processing system wherein the testing is performed by changing the supply voltage to the system unit under test. After requesting and receiving assignment of a storage cycle in the system''s central memory, a program control generates and transmits a command signal. The command signal is evaluated, and a signal datum responsive thereto is formed and transmitted to a power supply connected to the system unit being tested. Depending on the information contained in the latter transmitted signal, the operating voltage of the system unit can be adjusted to approach the limits prescribed for the particular system unit. The operability of the system unit is determined from its response to operating voltages near the outer limits of its range.
Inventors
- 👤 B Schaffer
- 👤 H Moder
- 👤 J Rabold
- 👤 F Giebler
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 17:39
CPC Classifications
H; H04; H04L; H04L43/00; H04L43/50; G; G01; G01R; G01R31/00; G01R31/28; G01R31/30; H04Q; H04Q3/00; H04Q3/42; H04Q3/54; H04Q3/545; H04Q3/54575; H04Q3/54591
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
149 words
A method for testing system units in a data processing system by adjusting the power supply circuits connected to said system units for changing the supply voltage applied to the system units being tested said method comprising the steps of: requesting, through a program control unit, and receiving a storage cycle from a central memory, from which memory a command signal is received, forming from said command signal an information signal to which at least one of said power supply circuits is responsive, changing, responsive to said information signal, the voltage applied to at least one system unit connected to one of said power supply circuits being adjusted, said power supply circuit being adjusted to produce supply voltage for said system unit substantially at the limit of the supply voltage range prescribed for said system unit and determining said system unit''s operability from its response to the changed voltage.
Claim 2
Independent Claim
149 words
A method for testing system units in a data processing system by adjusting the power supply circuits connected to said system units for changing the supply voltage applied to the system units being tested said method comprising the steps of: requesting, through a program control unit, and receiving a storage cycle from a central memory, from which memory a command signal is received, forming from said command signal an information signal to which at least one of said power supply circuits is responsive, changing, responsive to said information signal, the voltage applied to at least one system unit connected to one of said power supply circuits being adjusted, said power supply circuit being adjusted to produce supply voltage for said system unit substantially at the limit of the supply voltage range prescribed for said system unit and determining said system unit''s operability from its response to the changed voltage.
Claim 3
Dependent Claim
29 words
The method defined in claim 1 wherein said changing step further comprises changing the voltage in the region of said limit in a stepwise manner and in predetermined increments.
Claim 4
Dependent Claim
20 words
The method defined in claim 1 wherein said forming step occurs within a central portion of said data processing system.
Claim 5
Dependent Claim
20 words
The method defined in claim 1 wherein said forming step occurs in a means peripheral to said data processing system.
Claim 6
Dependent Claim
40 words
The method defined in claim 1 comprising the further step of: transmitting a resetting signal to said power supply circuit to cause said power supply circuit to revert to the supply voltage at which the connected system unit normally operates.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-06-24 | 1977-12-24 | 1978-06-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-06-24 | 1981-12-24 | 1982-06-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-06-24 | 1985-12-24 | 1986-06-25 | $7700.00 | Window Closed / Lapsed |