US3800151A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for adjusting the ion beam height in a mass spectrometer
Assignee: EIDP Inc
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Filing: 1971-06-08
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Granted: 1974-03-26
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Expires: 1991-06-08
Abstract
Abstract An adjustable mass spectrometer aperture permitting the selection of either the portion of the ion beam with a minimal off mid-plane aberration or a larger portion of the beam when high resolution is not required. The location of the aperture may be adjusted with respect to the mid-plane. Additionally, the entire beam may be intercepted for metastable ion energy spectrometry.
Inventors
- 👤 C Hull
- 👤 R Whitley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 15:12
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
199 words
A method, for use with a mass spectrometer having a source for producing an ion beam; an ion collector; and an analyzer located between said source and said collector which bends the path of the ions to be analyzed, thereby locating an ion beam plane, for altering the sensitivity of mass spectrometer while simultaneously having an opposite effect upon the resolution of said spectrometer comprising: a. disposing first blocking means on one side of said ion beam plane; b. disposing second blocking means on the opposite side of said ion beam plane from said first blocking means, the distance between said first and second blocking means perpendicular to the ion beam plane being the ion beam height; and c. adjusting the ion beam height to any of at least two distinct values whereby an increase in resolution with consequent decrease in sensitivity can be achieved by decreasing the beam height to block out more ions which have been subjected to the fringing fields of the analyzer, and an increase in sensitivity with consequent decrease in resolution can be achieved by increasing the beam height to pass more ions which have been subjected to the fringing fields of the analyzer.
Claim 2
Independent Claim
199 words
A method, for use with a mass spectrometer having a source for producing an ion beam; an ion collector; and an analyzer located between said source and said collector which bends the path of the ions to be analyzed, thereby locating an ion beam plane, for altering the sensitivity of mass spectrometer while simultaneously having an opposite effect upon the resolution of said spectrometer comprising: a. disposing first blocking means on one side of said ion beam plane; b. disposing second blocking means on the opposite side of said ion beam plane from said first blocking means, the distance between said first and second blocking means perpendicular to the ion beam plane being the ion beam height; and c. adjusting the ion beam height to any of at least two distinct values whereby an increase in resolution with consequent decrease in sensitivity can be achieved by decreasing the beam height to block out more ions which have been subjected to the fringing fields of the analyzer, and an increase in sensitivity with consequent decrease in resolution can be achieved by increasing the beam height to pass more ions which have been subjected to the fringing fields of the analyzer.
Claim 3
Dependent Claim
41 words
The method of claim 1 wherein the adjusting of said ion beam is accomplished by replacing said first and second blocking means with alternate first and second blocking means having a different distance between them perpendicular to said ion beam plane.
Claim 4
Dependent Claim
31 words
The method of claim 1 further comprising the step of adjusting said first and second blocking means with respect to said ion beam plane while maintaining said ion beam height constant.
Claim 5
Dependent Claim
45 words
The method of claim 1 wherein said analyzer comprises an electric sector followed by a magnetic sector and wherein the steps of disposing said first and second blocking means comprises locating said means for adjusting said ion beam height between said magnetic and electric sectors.
Claim 6
Dependent Claim
42 words
The method of claim 1 wherein said first and second blocking means are rigidly and permanently affixed to one another and wherein the step of adjusting said ion beam height comprises replacing said first and second blocking means with alternate blocking means.
Claim 7
Dependent Claim
35 words
The method of claim 5 wherein the step of replacing said first and second blocking means with alternate blocking means comprises replacing said first and second blocking means with alternate first and second blocking means.
Claim 8
Dependent Claim
44 words
The method of claim 5 wherein the step of replacing said first and second blocking means with alternate blocking means comprises replacing said first and second blocking means with means for blocking the total ion beam whereby metastable ion energy spectra may be obtained.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-03-25 | 1977-09-24 | 1978-03-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-03-25 | 1981-09-24 | 1982-03-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-03-25 | 1985-09-24 | 1986-03-26 | $7700.00 | Window Closed / Lapsed |