US3783372A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electrical test apparatus including high gain amplifier circuit
Assignee: NCR Voyix Corp
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Filing: 1972-05-19
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Granted: 1974-01-01
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Expires: 1992-05-19
Abstract
Abstract A test apparatus comprising an amplifier circuit including a high gain or operational amplifier and readout means connected to an output means or lead of the amplifier circuit. The amplifier circuit is adapted to produce a first value output (current or voltage) in the readout means with the input means or leads of the amplifier circuit connected in an open circuit. The amplifier circuit includes amplifier offset producing means which causes a second value output (current or voltage), distinctively different from the first value output in the readout means with the input means of the amplifier circuit connected in a short circuit.
Inventors
- 👤 J Boyd
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 11:03
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2644; G01R31/50
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
111 words
A test apparatus for testing electrical circuits comprising a high gain amplifier circuit having input means and output means; and readout means connected to said output means; said amplifier circuit including amplifier offset producing means coupled to said input means for producing offset therefor; said amplifier circuit adapted to produce a first output in said readout means with said input means connected either in an open circuit or in a short circuit in the absence of said amplifier offset producing means; said amplifier circuit operable with said amplifier offset producing means to produce a second substantially different output in said readout means with said input means connected in a short circuit.
Claim 2
Dependent Claim
111 words
A test apparatus for testing electrical circuits comprising a high gain amplifier circuit having input means and output means; and readout means connected to said output means; said amplifier circuit including amplifier offset producing means coupled to said input means for producing offset therefor; said amplifier circuit adapted to produce a first output in said readout means with said input means connected either in an open circuit or in a short circuit in the absence of said amplifier offset producing means; said amplifier circuit operable with said amplifier offset producing means to produce a second substantially different output in said readout means with said input means connected in a short circuit.
Claim 3
Dependent Claim
16 words
A test apparatus as defined in claim 1 wherein said amplifier circuit includes an operational amplifier.
Claim 4
Dependent Claim
131 words
A test apparatus for testing electrical circuits including integrated circuits containing MOS devices comprising: a high gain, direct current amplifier circuit having input means and output means; said amplifier circuIt including an integrated circuit operational amplifier; and readout means connected to said output means; said amplifier circuit including amplifier offset producing means coupled to said input means for producing offset for said operational amplifier; said amplifier circuit adapted to produce a first output in said readout means with said input means connected either in an open circuit or in a short circuit in the absence of said amplifier offset producing means; said amplifier circuit operable with said amplifier offset producing means to produce a second substantially different output in said readout means with said input means connected in a short circuit.
Claim 5
Dependent Claim
131 words
A test apparatus for testing electrical circuits including integrated circuits containing MOS devices comprising: a high gain, direct current amplifier circuit having input means and output means; said amplifier circuIt including an integrated circuit operational amplifier; and readout means connected to said output means; said amplifier circuit including amplifier offset producing means coupled to said input means for producing offset for said operational amplifier; said amplifier circuit adapted to produce a first output in said readout means with said input means connected either in an open circuit or in a short circuit in the absence of said amplifier offset producing means; said amplifier circuit operable with said amplifier offset producing means to produce a second substantially different output in said readout means with said input means connected in a short circuit.
Claim 6
Dependent Claim
136 words
A test apparatus for testing electrical circuits including integrated circuits containing MOS devices comprising: a high gain, direct current amplifier circuit having input means and output means; said amplifier circuit including an integrated circuit operational amplifier; and current readout means connected to said output means; said amplifier circuit including input-offset voltage producing means connected to said input means for producing offset voltage for said operational amplifier; said amplifier circuit adapted to produce a first output current in said readout means with said input means connected either in an open circuit or in a short circuit in the absence of said input-offset voltage producing means; said amplifier circuit operable with said input-offset voltage producing means to produce a second substantially different output current in said current readout means with said input means connected in a short circuit.
Claim 7
Dependent Claim
136 words
A test apparatus for testing electrical circuits including integrated circuits containing MOS devices comprising: a high gain, direct current amplifier circuit having input means and output means; said amplifier circuit including an integrated circuit operational amplifier; and current readout means connected to said output means; said amplifier circuit including input-offset voltage producing means connected to said input means for producing offset voltage for said operational amplifier; said amplifier circuit adapted to produce a first output current in said readout means with said input means connected either in an open circuit or in a short circuit in the absence of said input-offset voltage producing means; said amplifier circuit operable with said input-offset voltage producing means to produce a second substantially different output current in said current readout means with said input means connected in a short circuit.
Claim 8
Dependent Claim
19 words
The test apparatus as defined in claim 4 wherein said current readout means comprises an isolated current indicating device.
Claim 9
Dependent Claim
19 words
The test apparatus as defined in claim 5 wherein said first output current has a value of substantially zero.
Claim 10
Dependent Claim
40 words
The test apparatus as defined in claim 6 wherein said input means comprises an inverting input means and a non-inverting input means and said offset voltage produced by said input-offset voltage producing means is applied to said non-inverting input means.
Claim 11
Dependent Claim
52 words
The test apparatus as defined in claim 5 further comprising first and second metallic contact means for electrical contact with an electrical circuit to be tested, said first contact means being connected to one of said input means and said second contact means being connected to the other of said input means.
References Cited (Backward Citations)
US3566266A
Cited
US3617881A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-12-31 | 1977-07-02 | 1978-01-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-12-31 | 1981-07-02 | 1982-01-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-12-31 | 1985-07-02 | 1986-01-01 | $7700.00 | Window Closed / Lapsed |