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US3760182A Expired / Lapsed US ⏱️ 0.0 years remaining

Semi conductor heat-fault detector

Assignee: Individual
•
Filing: 1972-02-29
•
Granted: 1973-09-18
•
Expires: 1992-02-29
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Abstract

Abstract The semiconductor heat-fault detector of this invention comprises a barrel, an infrared generator, and lens means. The infrared generator is disposed at the terminal end of the body portion at its end opposite the lens portion with the infrared generator directed into the barrel. The infrared generator is powered from a suitable source, and has a preselected intensity. The lens means is disposed in the lens portion of the barrel, and is operable to condense and focus energy emitted from the generator.

Inventors

  • 👤 C Poole

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 12:53
CPC Classifications
G; G01; G01N; G01N25/00; G01N25/72; G01N21/00; G01N21/84; G01N21/88; G01N21/89; G01N21/8901; H; H05; H05B; H05B3/00; H05B3/0033; H05B3/0038; H05B3/0047

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 27 words
A method for testing semiconductors and semiconductor electronic components, comprising the steps of: generating a focused beam of infrared energy; and directing said beam onto said semiconductor.
Claim 2
Independent Claim 27 words
A method for testing semiconductors and semiconductor electronic components, comprising the steps of: generating a focused beam of infrared energy; and directing said beam onto said semiconductor.
Claim 3
Dependent Claim 20 words
The method of claim 1 including the step of adjusting said beam to selectively control the focus of said beam.
Claim 4
Dependent Claim 27 words
The method of claim 1 wherein said beam is generated by a generator having intensity and focusing characteristics required for a preselected size and type of semiconductor.
Claim 5
Dependent Claim 20 words
The method of claim 1 including the step of directing said beam onto successive semiconductors to identify a defective semiconductor.

References Cited (Backward Citations)

US2677106A Cited
US2790141A Cited
US2920485A Cited
US3056106A Cited
US3277303A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-09-17 1977-03-19 1977-09-18 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-09-17 1981-03-19 1981-09-18 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-09-17 1985-03-19 1985-09-18 $7700.00 Window Closed / Lapsed

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