Electrical component testing apparatus

Claim 2

In test apparatus for capacitors having a pair of spaced external terminals, a plurality of said capacitors being provided one at a time at a loading station, a conveyor having a plurality of separate conveyor heads for picking up said capacitors at said loading station and conveying them along a definite path through a test station and subsequently through a plurality of discharge stations, the improvement comprising: separate mechanical memory means carried by said conveyor, one such means for each conveyor head, having a plurality of memory elements rotatably mounted on said conveyor; each said memory element having first and second angularly spaced arms, said memory element being rotatable from a first position where said first arm is extended and said second arm is withdrawn and a second position where said second arm is extended and said first arm is withdrawn; means mounted in said test station selectively actuatable to engage an extended memory element first arm, rotating said engaged memory element to the second position extending the second arm thereof; and means located in each discharge station actuated by respectively different extended memory element second arms for releasing the capacitor from its conveyor head and resetting said memory element to the first position.

Claim 3

In apparatus as in claim 1, in which said selectively actuatable means in said test station includes a plurality of solenoids, each solenoid having an armature that on energization of the associated solenoid is moving into obstructing relation with a memory element first arm as it is moved through said test station thereby rotating said memory element to the second position.

Claim 4

Apparatus for electrically testing and sorting according to test results a plurality of chiplike capacitors having a pair of conductive electrodes provided on opposite edges thereof, comprising: a conveyor frame mounted for rotative indexing movement about a generally vertical axis; a plurality of conveyor head means, each such means having vacuum retention parts; individual spring blade support means mounting each conveyor head means to the conveyor frame such that the vacuum retention parts extend downwardly from the frame; separate valve means interconnecting each conveyor head means with a vacuum pump, said valve means being selectively controllable to connect and disconnect the respective head means with said pump; means for locating the capacitors at a pick-up point in registry with and below the vacuum retention parts of the conveyor heads at end of one of the indexing movements; means for moving the conveyor head means vertically down and up at the conclusion of an indexing movement an amount sufficient to bring the vacuum parts of the conveyor head means at the pick-up point into operative contact with the capacitor located at said pick-up point; means located beyond the pick-up point along the path of indexing rotation brought into electrical contact with electrodes of capacitors carried by the conveyor head means during vertical movement of said conveyor head means for accomplishing electrical test thereof; and means for controlling said valve means to disconnect the head means from the vacuum pump after electrical test thereby discharging the tested capacitor from the conveyor head means.

Claim 5

Apparatus for electrically testing and sorting according to test results a plurality of chiplike capacitors having a pair of conductive electrodes provided on opposite edges thereof, comprising: a conveyor frame mounted for rotative indexing movement about a generally vertical axis; a plurality of conveyor head means, each such means having vacuum retention parts; individual spring blade support means mounting each conveyor head means to the conveyor frame such that the vacuum retention parts extend downwardly from the frame; separate valve means interconnecting each conveyor head means with a vacuum pump, said valve means being selectively controllable to connect and disconnect the respective head means with said pump; means for locating the capacitors at a pick-up point in registry with and below the vacuum retention parts of the conveyor heads at end of one of the indexing movements; means for moving the conveyor head means vertically down and up at the conclusion of an indexing movement an amount sufficient to bring the vacuum parts of the conveyor head means at the pick-up point into operative contact with the capacitor located at said pick-up point; means located beyond the pick-up point along the path of indexing rotation brought into electrical contact with electrodes of capacitors carried by the conveyor head means during vertical movement of said conveyor head means for accomplishing electrical test thereof; and means for controlling said valve means to disconnect the head means from the vacuum pump after electrical test thereby discharging the tested capacitor from the conveyor head means.

Claim 6

Apparatus for electrically testing and sorting according to test results of generally rectangular capacitors each having a pair of coated connection terminals on opposite edges, comprising: a carousel-type conveyor mounted for rotative movement in a generally horizontal plane and limiteD vertical motion; a plurality of vacuum retention heads mounted on said conveyor at equal angles about the axis of rotation, said heads having parts extending downwardly of said conveyor; a plurality of leaf spring means each having one end affixed to the conveyor and the other end secured to one vacuum retention head thereby providing a resilient cantilever mounting for said retention heads; separate selectively actuatable valve means for interconnecting each vacuum retention head with a low pressure air reservoir or with normal room air pressure; means for locating the capacitors one at a time at a loading station along the indexing path of movement; contact means located farther along the indexing path from said loading station interconnected with electrical test equipment; means for cyclically moving the vacuum retention heads into operative contact with the capacitors in said loading station and the capacitors carried by said retention heads into contact with said contact means; and means carried by said conveyor and cooperating with certain of a plurality of means located along the path of indexing movement beyond said contact means for actuating the associated valve means to interconnection with normal room air pressure for releasing the capacitor retained thereby.

Claim 7

Apparatus for electrically testing and sorting according to test results of generally rectangular capacitors each having a pair of coated connection terminals on opposite edges, comprising: a carousel-type conveyor mounted for rotative movement in a generally horizontal plane and limiteD vertical motion; a plurality of vacuum retention heads mounted on said conveyor at equal angles about the axis of rotation, said heads having parts extending downwardly of said conveyor; a plurality of leaf spring means each having one end affixed to the conveyor and the other end secured to one vacuum retention head thereby providing a resilient cantilever mounting for said retention heads; separate selectively actuatable valve means for interconnecting each vacuum retention head with a low pressure air reservoir or with normal room air pressure; means for locating the capacitors one at a time at a loading station along the indexing path of movement; contact means located farther along the indexing path from said loading station interconnected with electrical test equipment; means for cyclically moving the vacuum retention heads into operative contact with the capacitors in said loading station and the capacitors carried by said retention heads into contact with said contact means; and means carried by said conveyor and cooperating with certain of a plurality of means located along the path of indexing movement beyond said contact means for actuating the associated valve means to interconnection with normal room air pressure for releasing the capacitor retained thereby.

Claim 8

Apparatus for testing a plurality of chiplike electrical devices having external terminal electrodes arranged one at a time at a loading station, comprising: a circular conveyor frame mounted for movement about its axis in a generally horizontal plane; a plurality of vacuum conveyor heads, each having vacuum retention parts; spring blade support means cantilever mounting each conveyor head to said conveyor frame; means for rotatively indexing the conveyor frame and vacuum heads carried thereby predetermined angular amounts, the loading station being located below the marginal edge of said frame and in registry with a conveyor head at the conclusion of an indexing movement; contact means located under the frame marginal edge in registry with a conveyor head at the conclusion of an indexing movement beyond the loading station, said contact means being interconnected with testing circuitry; and means for providing a down and up motion to the conveyor frame generally vertically of said frame at the conclusion of each indexing rotation whereby the vacuum retention parts of a first conveyor head are brought into contact with a device in the loading station thereby retaining it, and a second conveyor head moving a retained device into contact with said contact means.

Claim 9

Apparatus for testing a plurality of chiplike electrical devices having external terminal electrodes arranged one at a time at a loading station, comprising: a circular conveyor frame mounted for movement about its axis in a generally horizontal plane; a plurality of vacuum conveyor heads, each having vacuum retention parts; spring blade support means cantilever mounting each conveyor head to said conveyor frame; means for rotatively indexing the conveyor frame and vacuum heads carried thereby predetermined angular amounts, the loading station being located below the marginal edge of said frame and in registry with a conveyor head at the conclusion of an indexing movement; contact means located under the frame marginal edge in registry with a conveyor head at the conclusion of an indexing movement beyond the loading station, said contact means being interconnected with testing circuitry; and means for providing a down and up motion to the conveyor frame generally vertically of said frame at the conclusion of each indexing rotation whereby the vacuum retention parts of a first conveyor head are brought into contact with a device in the loading station thereby retaining it, and a second conveyor head moving a retained device into contact with said contact means.

Claim 10

Apparatus as in claim 5, in which there are further provided separate valve means interconnected with each vacuum conveyor head, said valve means being controlled by signals from said test circuitry for releasing the vacuum on said conveyor head to release the retained device.

Claim 11

Apparatus as in claim 5, in which said contact means includes a pair of resilient contact plates cantilever mounted in edge opposed slightly spaced relation with the plates generally horizontal such that as a chiplike electrical device is moved vertically with respect to the conveyor frame one device electrode contacts one of said plates and another device electrode contacts another of said plates.