US3740147A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Microspectrophotometer with two fields of view
Assignee: Farrand Optical Co Inc
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Filing: 1972-01-10
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Granted: 1973-06-19
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Expires: 1992-01-10
Abstract
Abstract The present invention is the combination of an instrument for viewing a specimen in combination with an analyzer for analyzing a targeted area of the specimen wherein the spectral bandwidth, the size, and the location of the targeted area are controlled by a common element.
Inventors
- 👤 E Kallet
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 17:54
CPC Classifications
G; G02; G02B; G02B21/00; G02B21/0096
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
190 words
An apparatus for analyzing a specimen including, first means for imaging a first field of view representing a portion of the specimen to be analyzed, said first means including an imaging lens having an object plane, said apparatus further including second means for receiving a second field of view representing a portion of said specimen to be analyzed, the improvement comprising, transmitting means located at the object plane of said imaging lens for transmitting said first and second fields of view simultaneously along first and second optical paths and wherein said second field of view is simultaneously included within said first field of view, said second imaging means including a spectrum analyzer having an entrance opening for defining said second field of view along said second optical path and controlling the spectral bandwidth, the size, and location of said second field of view, a light source included in said second imaging means for radiating through said entrance opening along said second optical path to said transmitting means whereby a representation of the size and location of said second field of view forms an entrance opening image at said transmitting means.
Claim 2
Independent Claim
190 words
An apparatus for analyzing a specimen including, first means for imaging a first field of view representing a portion of the specimen to be analyzed, said first means including an imaging lens having an object plane, said apparatus further including second means for receiving a second field of view representing a portion of said specimen to be analyzed, the improvement comprising, transmitting means located at the object plane of said imaging lens for transmitting said first and second fields of view simultaneously along first and second optical paths and wherein said second field of view is simultaneously included within said first field of view, said second imaging means including a spectrum analyzer having an entrance opening for defining said second field of view along said second optical path and controlling the spectral bandwidth, the size, and location of said second field of view, a light source included in said second imaging means for radiating through said entrance opening along said second optical path to said transmitting means whereby a representation of the size and location of said second field of view forms an entrance opening image at said transmitting means.
Claim 3
Dependent Claim
32 words
The apparatus of claim 1 wherein said first means comprises a microscope, wherein said imaging lens is the eye lens of said microscope, and wherein said transmitting means is a beam splitter.
Claim 4
Dependent Claim
52 words
The apparatus of claim 1 further including, a relay lens and a mirror coaxial with said second optical path for re-imaging said entrance image at said transmitting means whereby said imaging lens forms an image representing the size and location of said second field of view superposed with said field of view.
Claim 5
Dependent Claim
46 words
The apparatus of claim 1 wherein said spectrum analyzer includes a ruled grating for receiving the radiation through said entrance opening and further including means for translating said entrance opening while simultaneously rotating said grating to thereby scan said second field of view across said specimen.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-06-18 | 1976-12-18 | 1977-06-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-06-18 | 1980-12-18 | 1981-06-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-06-18 | 1984-12-18 | 1985-06-19 | $7700.00 | Window Closed / Lapsed |