US3723258A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Use of anodized aluminum as electrical insulation and scratch protection for semiconductor devices
Assignee: Fairchild Semiconductor Corp
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Filing: 1970-12-14
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Granted: 1973-03-27
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Expires: 1990-12-14
Abstract
Abstract MULTIPLE LAYERS OF CONDUCTIVE INTERCONNECTS ARE FORMED ON AN INTEGRATED CIRCUIT BY DEPOSTING LAYERS OF A METAL (TYPICALLY ALUMINUM) ON THE SURFACE OF THE CIRCUIT AND THEN SELECTIVELY ANODIZING THESE LAYERS TO FORM INSULATION LAYERS OR LAYERS OF CONDUCTIVE INTERCONNECTS. MASKING MATERIAL IS USED TO PREVENT THE ANODIZATION OF AND THUS TO DEFINE, THE CONDUCTIVE LEAD PATTERNS.
Inventors
- 👤 J Podell
- 👤 R Whelton
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 08:35
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6324; C; C25; C25D; C25D11/00; C25D11/02; C25D11/022; C25D11/04; C25D11/06; C25D11/08; H10P14/69; H10P14/692; H10P14/6938; H10P14/6939; H10P14/69391; H10W; H10W20/00; H10W20/40; Y; Y10; Y10S; Y10S148/00; Y10S148/085; Y10S148/118
Claims Analysis
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References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-03-26 | 1976-09-25 | 1977-03-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-03-26 | 1980-09-25 | 1981-03-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-03-26 | 1984-09-25 | 1985-03-27 | $7700.00 | Window Closed / Lapsed |