Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
16 words
The switching device of claim 1 wherein the first and second switching circuits comprise unipolar devices.
Claim 2
Dependent Claim
16 words
The switching device of claim 1 wherein the first and second switching circuits comprise bipolar devices.
Claim 3
Dependent Claim
25 words
The switching device of claim 1 wherein the bistable switching element is an amorphous switching element comprising a chalcogenide glass film disposed between molybdenum electrodes.
Claim 4
Dependent Claim
20 words
The switching device of claim 4 wherein the amorphous switching element comprises a chalcogenide glass film disposed between aluminum electrodes.
Claim 5
Dependent Claim
22 words
The switching device of claim 4 wherein the amorphous switching element comprises a niobium oxide film disposed between niobium and bismuth electrodes.
Claim 6
Dependent Claim
22 words
The switching device of claim 4 wherein the amorphous switching element comprises a zirconium oxide film disposed between zirconium and gold electrodes.
Claim 7
Dependent Claim
35 words
The switching device of claim 4 wherein the means to operate the amorphous switching elements comprises electrical signals for controlling the application of voltage to the amorphous switching elements to change the electrical states thereof.
Claim 8
Dependent Claim
69 words
The switching device of claim 4 wherein the switching devices are unipolar devices and the amorphous switching elements are chalcogenide glass films disposed between metal electrodes responsive to electrical signals that switch the amorphous switching elements from a first permanent state to a second permanent state to inactivate the selected first and second switching circuit and programmably activate the first and second redundant switching circuit as a substitute thereof.
Claim 9
Dependent Claim
233 words
A repairable monolithic memory device comprising a. a semiconductor substrate, b. a plurality of personalized storage circuits disposed within the substrate in an active state, c. a plurality of personalized decoder circuits disposed within the substrate in an active state and connected to said storage circuits, said decoder circuits being adapted to receive electrical input signals, d. at least one first bistable switching element united to the substrate and having a low impedance state and a high impedance state, e. gating means connecting said one first bistable switching element to at least one of said decoder circuits, f. at least one spare personalized storage circuit disposed within the substrate in a passive state, g. at least one spare personalized and programmable decoder circuits disposed within the substrate in a passive state and connected to said spare storage circuit, h. at least one second bistable switching element united to the substrate and having a low impedance state and a high impedance state, i. gating means connecting said one second bistable switching element to at least one of said spare decoder circuits, j. and means to selectively operate said gating means to cause said first and second bistable switching elements to change input state to disable a decoder circuit and storage circuit and selectively activate a spare decoder and storage circuit as a substitute for the disabled circuits, respectively without alteration of the input signals.
Claim 10
Dependent Claim
29 words
The repairable monolithic memory device of claim 10 wherein the personalized decoder and storage circuits are greAter in number than the number of personalized spare decoder and storage circuits.