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US3716425A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making semiconductor devices through overlapping diffusions

Assignee: Motorola Solutions Inc
•
Filing: 1970-08-24
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Granted: 1973-02-13
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Expires: 1990-08-24
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Abstract

Abstract An integrated device and/or circuit and the method for making such is disclosed employing a plurality of fully insulated islands having plane walls. Selected diffusion steps are made overlapping certain of the islands and certain of the other diffusion steps.

Inventors

  • 👤 U Davidsohn

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 13:07
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/60; H10D84/611; H10D84/613; H10D84/617; H10D62/00; H10D62/10; H10D62/13; H10D62/137; H10D84/01; H10D84/0112; H10D84/02; H10D84/03; H10D84/038; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/019; H10W10/10; Y; Y10; Y10S; Y10S148/00; Y10S148/031; Y10S148/036; Y10S148/085; Y10S148/106; Y10S148/122; Y10S148/151

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 238 words
The method of making semiconductor devices comprising the steps of: providing a silicon semiconductor body of a first conductivity type having at least an upper surface and a lower surface and having its atomic structure crystallographically oriented to exhibit its (100) surface nOrmal to said upper surface; anisotropically etching selected portions of said body and thereby forming a groove extending vertically into said body and terminating at a first end and extending transversely across said upper surface forming a plurality of closed members for enclosing a plurality of islands formed in said body and arranging said islands in rows and columns; coating said upper surface and said groove with an insulating layer; filling said coated groove and forming a second layer of polycrystalline silicon on said insulating layer; removing in a substantially uniform manner equal thicknesses of said body for exposing said polycrystalline silicon formed in each groove and for forming a plurality of islands of said first conductivity type and each having a planar surface and each island being separated from each other island by a plurality of insulating layers and a polycrystalline layer; forming a first diffusion mask having a first opening exposing portions of adjacent columns of islands; and diffusing a dopant material through said opening for alternating said first conductivity type material to opposite conductivity type material and simultaneously forming in a plurality of said islands an equal plurality of separate PN junctions respectively.
Claim 2
Independent Claim 238 words
The method of making semiconductor devices comprising the steps of: providing a silicon semiconductor body of a first conductivity type having at least an upper surface and a lower surface and having its atomic structure crystallographically oriented to exhibit its (100) surface nOrmal to said upper surface; anisotropically etching selected portions of said body and thereby forming a groove extending vertically into said body and terminating at a first end and extending transversely across said upper surface forming a plurality of closed members for enclosing a plurality of islands formed in said body and arranging said islands in rows and columns; coating said upper surface and said groove with an insulating layer; filling said coated groove and forming a second layer of polycrystalline silicon on said insulating layer; removing in a substantially uniform manner equal thicknesses of said body for exposing said polycrystalline silicon formed in each groove and for forming a plurality of islands of said first conductivity type and each having a planar surface and each island being separated from each other island by a plurality of insulating layers and a polycrystalline layer; forming a first diffusion mask having a first opening exposing portions of adjacent columns of islands; and diffusing a dopant material through said opening for alternating said first conductivity type material to opposite conductivity type material and simultaneously forming in a plurality of said islands an equal plurality of separate PN junctions respectively.
Claim 3
Dependent Claim 101 words
The method of fabricating semiconductor devices as recited in claim 1 and further including the steps of: forming a second diffusion mask on said composite structure having said first diffusion an integral part thereof and exposing a portion of said diffused area of adjacent columns of said islands and said insulating layers and said polycrystalline silicon layer separating said islands; and diffusing a material through said opening for altering a portion of said previously diffused portion of said body to a first conductivity type and simultaneously forming in a plurality of said islands an equal plurality of separate PN junctions respectively.
Claim 4
Dependent Claim 91 words
The method of fabricating semiconductor devices as recited in claim 2 and further including the steps of: forming a third diffusion mask on said composite structure having first and second diffusion areas and exposing a portion of said body of said first conductivity type of a different pair of adjacent columns of islands and said insulating layers and said polycrystalline silicon separating said islands; and diffusing a material through said openings for altering a portion of said body to a first conductivity type of lower resistivity for forming an enhancement region.
Claim 5
Dependent Claim 34 words
The method of fabricating a semiconductor device as recited in claim 2 and further including the step of: providing an electrical contact to said body, said first diffusion area and said second diffusion area.

References Cited (Backward Citations)

US3411051A Cited
US3411200A Cited
US3575646A Cited
US3432919A Cited
US3534234A Cited
US3575741A Cited
US3566219A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-02-13 1976-08-14 1977-02-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-02-13 1980-08-14 1981-02-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-02-13 1984-08-14 1985-02-13 $7700.00 Window Closed / Lapsed

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