US3710104A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for x-ray interrogation of a sample
Assignee: Republic Steel Corp
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Filing: 1969-11-04
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Granted: 1973-01-09
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Expires: 1989-11-04
Abstract
Abstract A system for and method of analyzing material by X-ray radiation techniques. Material under inspection is irradiated by primary Xrays; fluorescent X-rays emitted by the material are analyzed to determine the constituency of the material. Backscattered primary X-ray radiation is detected to determine the amount of material present to compensate for material loading. The primary X-ray radiation may include a component of the fluorescent X-ray radiation of an energy in the order of the energy of fluorescent X-ray emission in the sample so as to enhance fluorescent emission in the sample. The applied fluorescent X-ray radiation may be generated by a collimator used to house the primary source and which is stimulated by the source to fluoresce.
Inventors
- 👤 W Pavlik
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 06:56
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/20083
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
81 words
A system for X-ray interrogation of a sample under test, comprising: a. means for applying primary X-ray radiation to the sample; b. means for generating a signal representative of the presence of a material expected in the sample; c. means for detecting backscattered primary X-ray radiation from the sample; and d. means for detecting fluorescent X-ray radiation emitted by the sample and responsive to this detected radiation for generating an output signal when the sample material is different from that expected.
Claim 2
Independent Claim
81 words
A system for X-ray interrogation of a sample under test, comprising: a. means for applying primary X-ray radiation to the sample; b. means for generating a signal representative of the presence of a material expected in the sample; c. means for detecting backscattered primary X-ray radiation from the sample; and d. means for detecting fluorescent X-ray radiation emitted by the sample and responsive to this detected radiation for generating an output signal when the sample material is different from that expected.
Claim 3
Independent Claim
168 words
A system for X-ray interrogation of a sample under test, comprising: a. means for applying primary X-ray radiation to the sample; b. means for detecting fluorescent X-ray radiation emitted by the sample; and c. means for detecting backscattered primary X-ray radiation from the sample; in which the means (b) and (c) comprise means for sensing radiation from the sample, and means for classifying the sensed radiation in accordance with energy level; in which a plurality of channels are provided corresponding to different bands of radiant energies, each channel including a pulse generating means for generating a pulse signal in accordance with the radiation sensed from the sample coming within the energy band, means for counting pulses from the pulse generating means, and means responsive to the pulse counts in the different channels for providing an indication of the material in the sample; including means for establishing a predetermined count for each of the different channels, and means for detecting when one of the channels reaches its predetermined count.
Claim 4
Independent Claim
168 words
A system for X-ray interrogation of a sample under test, comprising: a. means for applying primary X-ray radiation to the sample; b. means for detecting fluorescent X-ray radiation emitted by the sample; and c. means for detecting backscattered primary X-ray radiation from the sample; in which the means (b) and (c) comprise means for sensing radiation from the sample, and means for classifying the sensed radiation in accordance with energy level; in which a plurality of channels are provided corresponding to different bands of radiant energies, each channel including a pulse generating means for generating a pulse signal in accordance with the radiation sensed from the sample coming within the energy band, means for counting pulses from the pulse generating means, and means responsive to the pulse counts in the different channels for providing an indication of the material in the sample; including means for establishing a predetermined count for each of the different channels, and means for detecting when one of the channels reaches its predetermined count.
Claim 5
Dependent Claim
38 words
A system in accordance with claim 2, in which the last-mentioned means includes means for detecting whether or not the other channels have reached their predetermined counts when said one channel is detected as reaching its predetermined count.
Claim 6
Independent Claim
177 words
A system for X-ray interrogation of a sample under test, specifically for the determination of chromium, manganese, iron or other material in a sample, comprising: a. means for applying primary X-ray radiation to the sample; b. means for detecting fluorescent X-ray radiation emitted by the sample; and c. means for detecting backscattered primary X-ray radiation from the sample; in which the means (b) and (c) comprise means for sensing radiation from the sample, and means for classifying the sensed radiation in accordance with energy level; including four channels corresponding to bands of energy representing X-ray radiation from the sample of the K and K 1 series of which chrome is 5.41 KEV, manganese is 5.898 KEV, iron is 6.403 KEV, and the backscatter level corresponding to other material is about 22 KEV, means for generating a pulse in each channel each time radiant energy is received from the sample within the energy band of the particular channel, means for counting the pulses in each channel, and means for providing an indication of the counts in the channels.
Claim 7
Independent Claim
177 words
A system for X-ray interrogation of a sample under test, specifically for the determination of chromium, manganese, iron or other material in a sample, comprising: a. means for applying primary X-ray radiation to the sample; b. means for detecting fluorescent X-ray radiation emitted by the sample; and c. means for detecting backscattered primary X-ray radiation from the sample; in which the means (b) and (c) comprise means for sensing radiation from the sample, and means for classifying the sensed radiation in accordance with energy level; including four channels corresponding to bands of energy representing X-ray radiation from the sample of the K and K 1 series of which chrome is 5.41 KEV, manganese is 5.898 KEV, iron is 6.403 KEV, and the backscatter level corresponding to other material is about 22 KEV, means for generating a pulse in each channel each time radiant energy is received from the sample within the energy band of the particular channel, means for counting the pulses in each channel, and means for providing an indication of the counts in the channels.
Claim 8
Dependent Claim
64 words
A system in accordance with claim 4 in which the last-named means classifies the sample as chromium or manganese or iron or other material depending respectively upon whether the count in the chromium or manganese or iron or backscatter channel has reached a predetermined level for the channel and the counts in the remaining channels have not reached corresponding predetermined levels for the channels.
Claim 9
Dependent Claim
18 words
A system in accordance with claim 5, in which the predetermined levels for all channels are the same.
Claim 10
Dependent Claim
42 words
A system in accordance with claim 5, including means for generating a signal representative of a material expected in the sample, and means responsive to the classified sample for generating an output signal when the sample material is different from that expected.
Claim 11
Dependent Claim
22 words
A system in accordance with claim 7, including enabling means sensing the presence of a sample for permitting operation of the system.
References Cited (Backward Citations)
US3567929A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-01-09 | 1976-07-10 | 1977-01-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-01-09 | 1980-07-10 | 1981-01-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-01-09 | 1984-07-10 | 1985-01-09 | $7700.00 | Window Closed / Lapsed |