US3705755A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Microscopy apparatus
Assignee: Individual
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Filing: 1970-08-24
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Granted: 1972-12-12
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Expires: 1990-08-24
Abstract
Abstract Images of areas of selected planes of an object or field to be viewed are provided by apparatus including means for focusing an incident beam of radiation onto a point in the selected plane, a pinhole aperture, means directing radiation emanating from the irradiated point onto said aperture, means synchronously scanning the incident and emanating beams in a raster pattern across said selected plane, means producing a third beam of radiation with an intensity proportional to the intensity of the radiation from said emanating beam directed onto said pinhole aperture, means focusing said third beam upon a point in an image plane, and means scanning said third beam across said image plane in synchronization with the scanning of said irradiated point across said selected plane, to produce an image of said selected plane at said image plane.
Inventors
- 👤 Stephen Charles Baer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 11:24
CPC Classifications
G; G02; G02B; G02B21/00; G02B21/0004; G02B21/002; G02B21/0024; G02B21/0036; G02B21/0048
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
170 words
In an image producing microscope wherein an entrance beam of radiation is focused to a small spot in a selected plane of a specimen and an exit beam formed from a portion of the radiation emanating from such small spot is focused to an exit pinhole aperture, the intensity of such exit beam varying in accordance with variations in characteristics of the specimen, and focusing means are provided for focusing a beam of radiation, the intensity thereof being a function of the intensity of the radiation focused to the exit pinhole aperture, to a point in an image plane, the improvement comprising: a. means for maintaining the speciMen stationary; and, b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture, and, synchronously therewith for scanning the beam of radiation focused to the point in the image plane to move such point over such image plane.
Claim 2
Dependent Claim
170 words
In an image producing microscope wherein an entrance beam of radiation is focused to a small spot in a selected plane of a specimen and an exit beam formed from a portion of the radiation emanating from such small spot is focused to an exit pinhole aperture, the intensity of such exit beam varying in accordance with variations in characteristics of the specimen, and focusing means are provided for focusing a beam of radiation, the intensity thereof being a function of the intensity of the radiation focused to the exit pinhole aperture, to a point in an image plane, the improvement comprising: a. means for maintaining the speciMen stationary; and, b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture, and, synchronously therewith for scanning the beam of radiation focused to the point in the image plane to move such point over such image plane.
Claim 3
Dependent Claim
36 words
The improvement recited in claim 1, having, additionally, beam splitting means for causing the entrance beam and the exit beam to be coincident as each one thereof passes between the scanning means and the stationary specimen.
Claim 4
Dependent Claim
38 words
The improvement recited in claim 1 including additionally a spatial filter disposed at a point along an optical path, such optical path being defined by the path of the entrance beam and the path of the exit beam.
Claim 5
Dependent Claim
38 words
The improvement recited in claim 1 wherein the said focusing means includes means for causing the beam of radiation focused to the point in the image plane to be coincident with the entrance beam at the scanning means.
Claim 6
Dependent Claim
39 words
The improvement recited in claim 1 wherein the scanning means includes a reflecting element, such reflecting element being disposed in the path of the entrance beam and the beam of radiation focused to the point in the image plane.
Claim 7
Dependent Claim
40 words
The improvement recited in claim 1 wherein the said focusing means includes means for causing the beam of radiation focused to the point in the image plane to be formed from a portion of the radiation of the entrance beam.
Claim 8
Dependent Claim
205 words
In an image producing microscope wherein an entrance beam of radiation is focused to a small spot in a selected plane of a specimen and an exit beam, having a central axis, formed from a portion of the radiation emanating from such small spot is focused by an objective lens having an optical axis to an exit pinhole aperture, the intensity of such exit beam varying in accordance with variations in characteristics of the specimen, and, means are provided for focusing a beam of radiation, the intensity thereof being a function of the intensity of radiation focused to the exit pinhole aperture, to a point in an image plane, the improvement comprising: a. means for maintaining the specimen stationary; and, b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture in a manner that the central axis of such exit beam passes through the objective lens at varying angles with respect to the optical axis, and synchronously therewith, for scanning the beam of radiation focused to the point in the image plane to move such point over such image plane.
Claim 9
Dependent Claim
205 words
In an image producing microscope wherein an entrance beam of radiation is focused to a small spot in a selected plane of a specimen and an exit beam, having a central axis, formed from a portion of the radiation emanating from such small spot is focused by an objective lens having an optical axis to an exit pinhole aperture, the intensity of such exit beam varying in accordance with variations in characteristics of the specimen, and, means are provided for focusing a beam of radiation, the intensity thereof being a function of the intensity of radiation focused to the exit pinhole aperture, to a point in an image plane, the improvement comprising: a. means for maintaining the specimen stationary; and, b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture in a manner that the central axis of such exit beam passes through the objective lens at varying angles with respect to the optical axis, and synchronously therewith, for scanning the beam of radiation focused to the point in the image plane to move such point over such image plane.
Claim 10
Dependent Claim
36 words
The improvement recited in claim 7 having additionally beam splitting means for causing the entrance beam and the exit beam to be coincident as each one thereof passes between the scanning means and the stationary specimen.
Claim 11
Dependent Claim
123 words
In an incident illumination microscope wherein an entrance beam of illuminating radiation is focused to a small spot in a selected plane of a specimen and an exit beam formed from a portion of the radiation emanating from the small spot is focused to an exit pinhole aperture, the improvement comprising: a. means for maintaining the specimen stationary; b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture; and c. beam splitting means for causing the entrance beam and the exit beam to be coincident as each one thereof passes between the scanning means and the stationary specimen.
Claim 12
Dependent Claim
123 words
In an incident illumination microscope wherein an entrance beam of illuminating radiation is focused to a small spot in a selected plane of a specimen and an exit beam formed from a portion of the radiation emanating from the small spot is focused to an exit pinhole aperture, the improvement comprising: a. means for maintaining the specimen stationary; b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture; and c. beam splitting means for causing the entrance beam and the exit beam to be coincident as each one thereof passes between the scanning means and the stationary specimen.
Claim 13
Dependent Claim
38 words
The improvement recited in claim 9 including additionally a spatial filter disposed at a point along an optical path, such optical path being defined by the path of the entrance beam and the path of the exit beam.
Claim 14
Dependent Claim
159 words
In an incident illumination microscope wherein an entrance beam of illuminating radiation is focused to a small spot in a selected plane of a specimen and an exit beam, having a central axis, formed from a portion of the radiation emanating from such small spot, is focused by an objective lens having an optical axis to an exit pinhole aperture, the improvement comprising: a. means for maintaining the specimen stationary; b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture in a manner that the central axis of such exit beam passes through the objective lens at varying angles with respect to the optical axis; and c. beam splitting means for causing the entrance beam and the exit beam to be coincident as each one thereof passes between the scanning means and the specimen.
Claim 15
Dependent Claim
159 words
In an incident illumination microscope wherein an entrance beam of illuminating radiation is focused to a small spot in a selected plane of a specimen and an exit beam, having a central axis, formed from a portion of the radiation emanating from such small spot, is focused by an objective lens having an optical axis to an exit pinhole aperture, the improvement comprising: a. means for maintaining the specimen stationary; b. means for scanning the entrance beam and the exit beam to move the small spot over the stationary specimen in the selected plane while the exit beam remains focused to the exit pinhole aperture in a manner that the central axis of such exit beam passes through the objective lens at varying angles with respect to the optical axis; and c. beam splitting means for causing the entrance beam and the exit beam to be coincident as each one thereof passes between the scanning means and the specimen.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-12-12 | 1976-06-12 | 1976-12-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-12-12 | 1980-06-12 | 1980-12-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-12-12 | 1984-06-12 | 1984-12-12 | $7700.00 | Window Closed / Lapsed |