Testing of semi-conductor devices

Claim 1

Apparatus for testing a plurality of semi-conductor devices simultaneously, comprising a rotatable support incorporating a loading station for receiving successively first, second and third sets of devices, each set constituting a plurality of devices disposed in a given position, a testing station angularly spaced from the loading station on said support and including a test head Having a plurality of probes, one probe for each device in a given set, for simultaneously testing respective devices in said given set, a memory unit associated with the test head for storing information derived therefrom, a control station separate and angularly spaced from the testing station on said support so that in use while a first set of devices are situated at the control station, a second set of devices can be tested at the testing station, and a third set of devices can be loaded on said support at said loading station, and an optical display unit disposed at the control station and operable by the memory unit for generating a spot of light on each faulty device in said given set, whereby any faulty devices are indicated.