US3696245A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Viewing screen mechanism for electron microscope
Assignee: Associated Electrical Industries Ltd
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Filing: 1970-04-28
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Granted: 1972-10-03
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Expires: 1990-04-28
Abstract
Abstract An electron microscope comprising a microscope chamber having a viewing screen positioned within the chamber and mounted for movement to at least a first position away from a beam of electrons or a second position in which electrons passing through an object or specimen are intercepted by the viewing screen to thereby produce an image. A drive motor is coupled to the viewing screen for moving the screen to either the first or the second position.
Inventors
- 👤 George William Browning
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 23:38
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/22; H01J37/224; H01J37/16
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
266 words
In an electron microscope comprising a microscope column having an evacuatable chamber therein and a source of electrons for directing electrons into said chamber: a. structure defining a specimen positioning station; b. focusing means for directing electrons from said source into a beam of electrons and directing said electrons along a path toward said station; c. the structure including specimen positioning means for positioning a specimen at the station and in such beam of electrons so that at least some of the electrons pass through said specimen; d. support means positioned within said chamber and mounted for rotation in a plane substantially perpendicular to said path of electrons; e. arm means mounted on said support means for rotation therewith, said arm means being pivotally mounted for movement between a first position generally parallel to said plane of rotation and a second position generally perpendicular to said plane; f. electron stimulated means carried by said arm means for movement therewith, said electron stimulated means being positioned in the path of said beam of electrons when said arm means is positioned in said first position, and being positioned generally outside the path of said beam of electrons when said arm means is positioned in said second position; g. cam means carried by said chamber and adapted to engage said arm means during rotation of said support means to selectively position said arm means to move said electron stimulated means into and out of said beam of electrons; and, h. drive means connected to said support means for rotating said support means to selectively position said electron stimulated means.
Claim 2
Dependent Claim
266 words
In an electron microscope comprising a microscope column having an evacuatable chamber therein and a source of electrons for directing electrons into said chamber: a. structure defining a specimen positioning station; b. focusing means for directing electrons from said source into a beam of electrons and directing said electrons along a path toward said station; c. the structure including specimen positioning means for positioning a specimen at the station and in such beam of electrons so that at least some of the electrons pass through said specimen; d. support means positioned within said chamber and mounted for rotation in a plane substantially perpendicular to said path of electrons; e. arm means mounted on said support means for rotation therewith, said arm means being pivotally mounted for movement between a first position generally parallel to said plane of rotation and a second position generally perpendicular to said plane; f. electron stimulated means carried by said arm means for movement therewith, said electron stimulated means being positioned in the path of said beam of electrons when said arm means is positioned in said first position, and being positioned generally outside the path of said beam of electrons when said arm means is positioned in said second position; g. cam means carried by said chamber and adapted to engage said arm means during rotation of said support means to selectively position said arm means to move said electron stimulated means into and out of said beam of electrons; and, h. drive means connected to said support means for rotating said support means to selectively position said electron stimulated means.
Claim 3
Dependent Claim
52 words
The electron microscope of claiM 1 wherein a plurality of arm means are mounted on said support means, each of said arm means carrying a separate electron stimulated means and being adapted to engage said cam means to move any selected one of said electron stimulated means into said beam of electrons.
Claim 4
Dependent Claim
25 words
The electron microscope of claim 1 wherein said drive means comprises an electric motor responsive to electric signals applied thereto to rotate said support means.
Claim 5
Dependent Claim
31 words
The electron microscope of claim 3 wherein said drive means additionally comprises indexing means interposed between said motor and said support means to rotate said support means between predetermined angular positions.
Claim 6
Dependent Claim
51 words
The electron microscope of claim 4 wherein said cam means is so configured as to position said arm means at at least one intermediate position between said first and second positions, as well as at said first and second positions, when said support means is positioned at said predetermined angular positions.
Claim 7
Dependent Claim
237 words
In an electron microscope comprising a microscope column having an evacuatable chamber therein and a source of electrons for directing electrons into said chamber: a. focusing means for directing electrons from said source into a beam of electrons and directing said electrons along a path toward an object to be irradiated; b. object positioning means for positioning a said object in a said beam of electrons so that at least come of the electrons pass through a said object; c. electron stimulated means for presenting an image of said object; d. annular support means mounted for rotation in a plane substantially perpendicular to said beam of electrons; e. a support arm pivotally mounted on said annular support means for supporting said electron stimulated means and including a projection extending therefrom; f. cam means mounted on said chamber adjacent said annular support means for cooperation with said projection on said support arm; and, g. drive means including an electric motor responsive to electric signals applied thereto to rotate said annular support means relative to said cam means to selectively move said electron stimulated means between a first position generally in the plane of said annular support means in the path of said beam of electrons and a second position generally perpendicular to said plane out of the path of said beam of electrons depending on the interaction between said cam means and said projection on said support arm.
Claim 8
Dependent Claim
237 words
In an electron microscope comprising a microscope column having an evacuatable chamber therein and a source of electrons for directing electrons into said chamber: a. focusing means for directing electrons from said source into a beam of electrons and directing said electrons along a path toward an object to be irradiated; b. object positioning means for positioning a said object in a said beam of electrons so that at least come of the electrons pass through a said object; c. electron stimulated means for presenting an image of said object; d. annular support means mounted for rotation in a plane substantially perpendicular to said beam of electrons; e. a support arm pivotally mounted on said annular support means for supporting said electron stimulated means and including a projection extending therefrom; f. cam means mounted on said chamber adjacent said annular support means for cooperation with said projection on said support arm; and, g. drive means including an electric motor responsive to electric signals applied thereto to rotate said annular support means relative to said cam means to selectively move said electron stimulated means between a first position generally in the plane of said annular support means in the path of said beam of electrons and a second position generally perpendicular to said plane out of the path of said beam of electrons depending on the interaction between said cam means and said projection on said support arm.
Claim 9
Dependent Claim
35 words
An electron microscope in accordance with claim 6 comprising a plurality of electron stimulated means and a like plurality of support arms pivotally mounted on said annular support means for supporting said electron stimulated means.
Claim 10
Dependent Claim
35 words
An electron microscope in accordance with claim 6 wherein said drive means comprises an indexing mechanism coupling said electric motor to said annular support means for rotating said annular support means between predetermined angular positions.
Claim 11
Dependent Claim
48 words
An electron microscope in accordance with claim 6 additionally including biasing means biasing said support arm to said second position, the interaction of said cam means and said projection being operative to overcome the action of said biasing means to move said support arm to said first position.
Claim 12
Dependent Claim
39 words
An electron microscope in accordance with claim 6 wherein said annular support means is mounted for rotation by means of its outer edge, and said cam means is secured radially outwardly from and substantially adjacent to said outer edge.
Claim 13
Dependent Claim
23 words
An electron microscope in accordance with claim 6 including electrical signal means to electrically signal predetermined angular positions of said annular support means.
Claim 14
Dependent Claim
70 words
An electron microscope in accordance with claim 11 additionally comprising: a. a control console in spaced relationship with the microscope column; b. actuator means mounted on said control console to transmit said electric signals to said electric motor; and, c. indicator means mounted on said control console and electrically Connected to said electrical signal means to indicate when said annular support means is in one of said predetermined angular positions.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-10-03 | 1976-04-03 | 1976-10-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-10-03 | 1980-04-03 | 1980-10-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-10-03 | 1984-04-03 | 1984-10-03 | $7700.00 | Window Closed / Lapsed |