Probe and guide assembly for testing printed circuit cards

Claim 1

An adapter for dynamically testing printed circuit cards without electrically disconnecting the card from its normal operating position comprising: a. a main frame element including an extender portion and a pair of side members arranged to attach the test adapter to a printed circuit card, b. a guide member having a plurality of equally spaced guide elements affixed to the side members and a Portion of the guide member overlying the extender portion at one end in a spaced relationship thereby forming a transversely located template holding pocket adapted to receive and hold a template interchangeably, c. a template having a plurality of holes therein according to a predetermined configuration conforming to the circuit pattern of a printed circuit card to be tested and adapted for insertion into the template holding pocket, d. at least one probe arm having a spring biased connecting element affixed to one end and slidably and selectively positionable within said guide member elements and arranged to make contact with a predetermined circuit of the printed circuit card through a hole in a template and the other end of the probe arm being adapted to receive an electrical lead wire of a test-indicating device, and e. retainer clips attached to the extender portion for retaining probe arms in the selected positions.