US3673860A
Expired / Lapsed
US
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Non-destructive testing system having pattern recognition means
Assignee: Magnaflux Corp
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Filing: 1969-11-10
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Granted: 1972-07-04
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Expires: 1989-11-10
Abstract
Abstract Non-destructive testing system in which patterns of defects indications, having one or more predetermined configurations, can be indicated rapidly and automatically. Defect indications are registered, preferably in a shift register matrix, and the registered indications are scanned to detect a pattern having a particular configuration, preferably by shifting the indications to a second shift register matrix to which scanning signals are applied. The system is operative to detect any pattern having a particular configuration regardless of its position in the registered indication and the pattern scanning can be carried out simultaneously with scanning of a part. The system may include ultrasonic test means operative in a B-scan mode or a C-scan mode, but other types of non-destructive testing means can be used.
Inventors
- 👤 John J Flaherty
- 👤 Henry N Nerwin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 08:31
CPC Classifications
G; G01; G01N; G01N29/00; G01N29/04; G01N29/06; G01N29/0609; G01N29/0618
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
183 words
In a system for non-destructive testing of a test piece for inhomogeneities therein, scanning means arranged to effect scanning of a region of the part in first and second directions generally transverse to each other to develop signals indicating inhomogeneities therein, said scanning being performed in successive generally parallel scans in said first direction with each scan in said first direction being displaced in said second direction from the preceding scan in said first direction, a matrix of shift register stages arranged electrically in rows and columns, information entering means operable in synchronism with said scanning means for entering said inhomogeneities indicating signals into said matrix to be stored in patterns having configurations and positions corresponding to the configurations and positions of inhomogeneities in said region of the test piece, each of said columns corresponding to a scan in said first direction, and the row positioned within each column corresponding to the position of the inhomogeneities in the corresponding scan in said first direction, and pattern sensing means for sensing coincidence of storage of information in predetermined ones of said shift register stages.
Claim 2
Dependent Claim
183 words
In a system for non-destructive testing of a test piece for inhomogeneities therein, scanning means arranged to effect scanning of a region of the part in first and second directions generally transverse to each other to develop signals indicating inhomogeneities therein, said scanning being performed in successive generally parallel scans in said first direction with each scan in said first direction being displaced in said second direction from the preceding scan in said first direction, a matrix of shift register stages arranged electrically in rows and columns, information entering means operable in synchronism with said scanning means for entering said inhomogeneities indicating signals into said matrix to be stored in patterns having configurations and positions corresponding to the configurations and positions of inhomogeneities in said region of the test piece, each of said columns corresponding to a scan in said first direction, and the row positioned within each column corresponding to the position of the inhomogeneities in the corresponding scan in said first direction, and pattern sensing means for sensing coincidence of storage of information in predetermined ones of said shift register stages.
Claim 3
Dependent Claim
41 words
In a system as defined in claim 1, said pattern sensing means comprising lamps associated with said predetermined ones of shift register stages to be energized in accordance with information stored therein, and photo-electric cells for detecting energization of said lamps.
Claim 4
Dependent Claim
17 words
In a system as defined in claim 1, said pattern sensing means comprising an AND logic circuit.
Claim 5
Dependent Claim
66 words
In a system as defined in claim 1, said information entering means comprising means operative during each scan in said one direction for entering information into the shift register stages of an input column of said matrix, and means operative between scans in said one direction for shifting information from the stages of each column into the stages of a next column in corresponding row positions.
Claim 6
Dependent Claim
56 words
In a system as defined in claim 1, said scanning means comprising ultrasonic transducer means, first means for effecting relative movement between said transducer means and the part to effect scanning in said first direction, and second means for effecting relative movement between said transducer means and the part to effect scanning in said second direction.
Claim 7
Dependent Claim
80 words
In a system as defined in claim 1, said scanning means comprising ultrasonic transducer means for transmitting bursts of ultrasonic energy into the part and foR developing echo signals from energy reflected from inhomogeneities in the part with the scanning in said first direction being effected by measuring the timing of echo signals relative to the transmission of said bursts, and means for effecting relative movement between said transducer means and the part to effect scanning in said second direction.
Claim 8
Dependent Claim
242 words
In a system for non-destructive testing of a test piece for inhomogeneities therein, scanning means arranged to effect scanning of a region of the part in first and second directions generally transverse to each other to develop signals indicating inhomogeneities therein, said scanning being performed in successive generally parallel scans in said first direction with each scan in said first direction being displaced in said second direction from the preceding scan in said first direction, a first matrix of shift register stages arranged electrically in rows and columns, information entering means operable in synchronism with said scanning means for entering said inhomogeneity indicating signals into said matrix to be stored in patterns having configurations and positions corresponding to the configurations and positions of inhomogeneities in said region of the test piece, each of said rows corresponding to a scan in said first direction, and the row positioned within each column corresponding to the position of the inhomogeneities in the corresponding scan in said first direction, a second matrix of shift register stages arranged electrically in rows and columns corresponding to rows and columns of said first matrix, parallel transfer means operable in synchronism with said scanning means for transferring information stored in said shift register stages of said first matrix to corresponding shift register stages of said second matrix, and pattern sensing means for sensing coincidence of storage of information in predetermined ones of said shift register stages of said second matrix.
Claim 9
Dependent Claim
242 words
In a system for non-destructive testing of a test piece for inhomogeneities therein, scanning means arranged to effect scanning of a region of the part in first and second directions generally transverse to each other to develop signals indicating inhomogeneities therein, said scanning being performed in successive generally parallel scans in said first direction with each scan in said first direction being displaced in said second direction from the preceding scan in said first direction, a first matrix of shift register stages arranged electrically in rows and columns, information entering means operable in synchronism with said scanning means for entering said inhomogeneity indicating signals into said matrix to be stored in patterns having configurations and positions corresponding to the configurations and positions of inhomogeneities in said region of the test piece, each of said rows corresponding to a scan in said first direction, and the row positioned within each column corresponding to the position of the inhomogeneities in the corresponding scan in said first direction, a second matrix of shift register stages arranged electrically in rows and columns corresponding to rows and columns of said first matrix, parallel transfer means operable in synchronism with said scanning means for transferring information stored in said shift register stages of said first matrix to corresponding shift register stages of said second matrix, and pattern sensing means for sensing coincidence of storage of information in predetermined ones of said shift register stages of said second matrix.
Claim 10
Dependent Claim
21 words
In a system as defined in claim 7, means for transferring information from one row to another in said second matrix.
Claim 11
Dependent Claim
38 words
In a system as defined in claim 8, said transfer of information from one row to another in said second matrix being effected in synchronism with the entry of information into said input column of said first matrix.
Claim 12
Dependent Claim
46 words
In a system as defined in claim 7, said pattern sensing means comprising lamps associated with said predetermined ones of said shift register stages of said second matrix to be energized in accordance with information stored therein, and photoelectric cell for detecting energization of said lamps.
Claim 13
Dependent Claim
30 words
In a system as defined in claim 7, said pattern sensing means comprising AND logic circuitry connected to said predetermined ones of said shift register stages of said second matrix.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-07-04 | 1976-01-03 | 1976-07-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-07-04 | 1980-01-03 | 1980-07-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-07-04 | 1984-01-03 | 1984-07-04 | $7700.00 | Window Closed / Lapsed |