One-probe method and apparatus for detecting, correlating, and classifying defects in test members

Claim 2

Method of detecting and locating defects in a member, comprising: a. scanning a surface of said member for defects by means of a probe that produces electrical signals representing true and randomly occurring false defects detected in said member, b. generating scanning position pulses in synchronism with said scanning, said pulses having correspondence with the location of adjacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce true and randomly occurring false defect pulses whenever any of said electrical signals differ from at least one predetermined waveform, d. processing the true and false defect pulses through circuit means in response to said scanning position pulses to pass only recurring true defect pulses and reject said randomly occurring false defect pulses, and e. utilizing only the true defect pulses ad the scanning position pulses to locate only true defects detected in said member.

Claim 3

Method of detecting and locating defects in a member, comprising: a. scanning a surface of said member cyclically for defects by means of a probe that produces electrical defect pulses representing defects detected in said member, b. generating a cyclic sequence of scanning position pulses in synchronism with said scanning, said pulses having correspondence with the locations of adJacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce defect pulses whenever any of said electrical signals differ from at least one predetermined waveform, d. processing said defect pulses through circuit means in response to the scanning position pulses to correlate the coincidence of an instantaneous defect pulse with a stored defect pulse from one or more previous scanning cycles in order to pass said defect pulses, said stored pulse occurring in either the same, a leading or a lagging incremental surface position in the previous scanning cycle; and e. utilizing the processed defect pulses and the scanning position pulses to locate either a straight or a skewed defect detected in said member.

Claim 4

Method of detecting and locating defects in a member, comprising: a. scanning a surface of said member cyclically for defects by means of a probe that produces electrical defect pulses representing defects detected in said member, b. generating a cyclic sequence of scanning position pulses in synchronism with said scanning, said pulses having correspondence with the locations of adJacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce defect pulses whenever any of said electrical signals differ from at least one predetermined waveform, d. processing said defect pulses through circuit means in response to the scanning position pulses to correlate the coincidence of an instantaneous defect pulse with a stored defect pulse from one or more previous scanning cycles in order to pass said defect pulses, said stored pulse occurring in either the same, a leading or a lagging incremental surface position in the previous scanning cycle; and e. utilizing the processed defect pulses and the scanning position pulses to locate either a straight or a skewed defect detected in said member.

Claim 5

The method of claim 2 wherein the defect pulses are processed through correlating circuitry in order to be passed on for subsequent usage.

Claim 6

Method of detecting defects in a member and classifying said defects according to location and length, comprising: a. scanning a surface of said member cyclically for defects using a probe that produces electrical defect pulses representing defects detected in said member, b. generating a cyclic sequence of scanning position pulses in synchronism with said scanning, said pulses having correspondence with the locations of adjacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce defect pulses whenever any of said electrical signals differs from at least one predetermined waveform, d. processing the defect pulses through circuit means in response to the scanning position pulses to pass said defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. utilizing the processed defect pulses and the scanning position pulses to classify defects detected in said member according to severity and length, the latter being based on reoccurrence of said defect in a plurality of scanning cycles.

Claim 7

Method of detecting defects in a member and classifying said defects according to location and length, comprising: a. scanning a surface of said member cyclically for defects using a probe that produces electrical defect pulses representing defects detected in said member, b. generating a cyclic sequence of scanning position pulses in synchronism with said scanning, said pulses having correspondence with the locations of adjacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce defect pulses whenever any of said electrical signals differs from at least one predetermined waveform, d. processing the defect pulses through circuit means in response to the scanning position pulses to pass said defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. utilizing the processed defect pulses and the scanning position pulses to classify defects detected in said member according to severity and length, the latter being based on reoccurrence of said defect in a plurality of scanning cycles.

Claim 8

Method of detecting defects in a member and classifying said defects according to severity, location and length, comprising: a. scanning a surface of said member for defects using a probe that produces electrical defect pulses representing defects detected in said member, b. generating a cyclic sequence of scanning position pulses in synchronism with said scanning, said pulses having correspondence with the locations of adjacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce a plurality of different kinds of defect pulses, each kind representing a different defect severity, whenever any of said electrical signals differs from at least one predetermined waveform associated with each kind of defect severity, d. processing at least one of the kinds of defect pulses through circuit means in response to the scanning position pulses to pass said defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. utilizing the processed and unprocessed defect pulses and the scanning position pulses to classify the defects detected in one or more portions of said member according to severity, location and length, the latter being based on reoccurrence of said defect in a plurality of scanning cycles.

Claim 9

Method of detecting defects in a member and classifying said defects according to severity, location and length, comprising: a. scanning a surface of said member for defects using a probe that produces electrical defect pulses representing defects detected in said member, b. generating a cyclic sequence of scanning position pulses in synchronism with said scanning, said pulses having correspondence with the locations of adjacent increments of the surface scanned, c. passing said electrical signals through circuit means to produce a plurality of different kinds of defect pulses, each kind representing a different defect severity, whenever any of said electrical signals differs from at least one predetermined waveform associated with each kind of defect severity, d. processing at least one of the kinds of defect pulses through circuit means in response to the scanning position pulses to pass said defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. utilizing the processed and unprocessed defect pulses and the scanning position pulses to classify the defects detected in one or more portions of said member according to severity, location and length, the latter being based on reoccurrence of said defect in a plurality of scanning cycles.

Claim 10

Apparatus for detecting and locating defects in a member comprising: a. defect detecting means including a probe adapted to scan a surface of said member for producing electrical signals representing true and randomly occurring false defects detected in said member, b. means including an encoder synchronized with probe scanning for generating scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to electrical signals for producing true and randomly occurring false defect pulses whenever any of said electrical signals differs from a predetermined waveform, d. circuit meAns for processing the true and false defect pulses in response to said scanning position pulses so as to pass only recurring true defect pulses and reject said randomly occurring false defect pulses, and e. circuit means for utilizing only the true defect pulses and the scanning position pulses to locate only true defects in said member.

Claim 11

Apparatus for detecting and locating defects in a member comprising: a. defect detecting means including a probe adapted to scan a surface of said member for producing electrical signals representing true and randomly occurring false defects detected in said member, b. means including an encoder synchronized with probe scanning for generating scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to electrical signals for producing true and randomly occurring false defect pulses whenever any of said electrical signals differs from a predetermined waveform, d. circuit meAns for processing the true and false defect pulses in response to said scanning position pulses so as to pass only recurring true defect pulses and reject said randomly occurring false defect pulses, and e. circuit means for utilizing only the true defect pulses and the scanning position pulses to locate only true defects in said member.

Claim 12

Apparatus for detecting and locating defects in a member, comprising: a. defect detecting means including a probe adapted to scan a surface of said member cyclically for producing electrical signals representing defects detected in said member, b. means including an encoder synchronized with probe scanning for generating a cyclic sequence of scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to said electrical signals for producing defect pulses whenever any of said electrical signals differs from at least one predetermined waveform, d. circuit means for processing the defect pulses in response to the scanning pulses, said means correlating the coincidence of an instantaneous defect pulse with a stored defect pulse from one or more previous scanning cycles in order to pass said defect pulses, said stored pulse occurring in either the same, a leading or a lagging incremental surface position in the previous scanning cycles, and e. circuit means for utilizing the processed defect pulses and the scanning position pulses to locate either a straight or a skewed defect detected in said member.

Claim 13

Apparatus for detecting and locating defects in a member, comprising: a. defect detecting means including a probe adapted to scan a surface of said member cyclically for producing electrical signals representing defects detected in said member, b. means including an encoder synchronized with probe scanning for generating a cyclic sequence of scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to said electrical signals for producing defect pulses whenever any of said electrical signals differs from at least one predetermined waveform, d. circuit means for processing the defect pulses in response to the scanning pulses, said means correlating the coincidence of an instantaneous defect pulse with a stored defect pulse from one or more previous scanning cycles in order to pass said defect pulses, said stored pulse occurring in either the same, a leading or a lagging incremental surface position in the previous scanning cycles, and e. circuit means for utilizing the processed defect pulses and the scanning position pulses to locate either a straight or a skewed defect detected in said member.

Claim 14

The apparatus of claim 7 wherein said circuit means (d) includes:

Claim 15

Apparatus for detecting defects in a member and classifying said defects according to location and length, comprising: a. defect detecting means including a probe adapted to scan a surface of said member cyclically for producing electrical signals representing defects in said member, b. means including an encoder synchronized with probe scanning for generating a cyclic sequence of scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to said electrical signals for producing defect pulses whenever any of said electrical signals differs from at least one predetermined waveform, d. circuit means for processing said defect pulses in response to the scanning position pulses so as to pass said defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. circuit means for utilizing the processed defect pulses and the scanning position pulses to classify the defects detected in said member according to severity and length.

Claim 16

Apparatus for detecting defects in a member and classifying said defects according to location and length, comprising: a. defect detecting means including a probe adapted to scan a surface of said member cyclically for producing electrical signals representing defects in said member, b. means including an encoder synchronized with probe scanning for generating a cyclic sequence of scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to said electrical signals for producing defect pulses whenever any of said electrical signals differs from at least one predetermined waveform, d. circuit means for processing said defect pulses in response to the scanning position pulses so as to pass said defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. circuit means for utilizing the processed defect pulses and the scanning position pulses to classify the defects detected in said member according to severity and length.

Claim 17

Apparatus for detecting defects in a member and classifying said defects according to severity, location and length, comprising: a. defect detecting means including a probe adapted to scan a surface of said member cyclically, said means adapted to produce electrical signals representing defects in said member, b. means including an encoder synchronized with probe scanning for generating a cyclic sequence of scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to said electrical signals for producing a plurality of different kinds of defect pulses, each kind representing a different defect severity, whenever any of said electrical signals differs from at least one predetermined waveform associated with each kind of defect severity, d. circuit means for processing at least one of the kinds of defect pulses in response to the scanning position pulses so as to pass said one kind of defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. circuit means for utilizing the processed anD unprocessed defect pulses and the scanning position pulses to classify the defects detected in said member according to severity, location and length.

Claim 18

Apparatus for detecting defects in a member and classifying said defects according to severity, location and length, comprising: a. defect detecting means including a probe adapted to scan a surface of said member cyclically, said means adapted to produce electrical signals representing defects in said member, b. means including an encoder synchronized with probe scanning for generating a cyclic sequence of scanning position pulses having correspondence with the location of adjacent increments of the surface scanned, c. circuit means responsive to said electrical signals for producing a plurality of different kinds of defect pulses, each kind representing a different defect severity, whenever any of said electrical signals differs from at least one predetermined waveform associated with each kind of defect severity, d. circuit means for processing at least one of the kinds of defect pulses in response to the scanning position pulses so as to pass said one kind of defect pulses which reoccur in a predetermined portion of one or more scanning cycles, and e. circuit means for utilizing the processed anD unprocessed defect pulses and the scanning position pulses to classify the defects detected in said member according to severity, location and length.

Claim 19

Apparatus for detecting defects in an elongated member and classifying said defects according to severity, length and location in a longitudinally extending section of said member, comprising: a. defect detecting means adapted to scan a surface of the elongated member cyclically during relative lengthwise movement therewith, said means producing electrical defect signals representative of defects detected in said member during said scanning, b. first defect signal detecting means for producing first level defect pulses whenever the electrical defect signals differ from at least one predetermined waveform representing a first level of defect severity, c. encoding means synchronized with means (a) scanning cycle for generating a keyed sequence of scanning position pulses in each cycle, each said pulses having correspondence with a plurality of adjacent, longitudinally extending, incremental surfaces traversed by means (a) during scanning of said elongated member surface, d. first electrical circuit means receiving the means (c) keyed sequence of pulses for producing a plurality of sequential gate control pulses and a plurality of shift pulses, each of said gate control pulses enduring for a different group of scanning position pulses and corresponding to a different adjacent section of said incremental surfaces, said shift pulses occurring once at least every other scanning cycle and in synchronism with a predetermined number of the gate control pulses, e. a plurality of gating circuits each receiving the first level defect pulses and each operating in response to a different gate control pulse for enabling passage of only those defect pulses which occur in the section of said member where said defects were detected, f. second electrical circuit means, including a plurality of signal storing and transferring means each connected to a different means (e) output and operating in response to means (d) shift pulses, for incrementally delaying corresponding sections of defect pulses from passage to respective output circuit means for a predetermined number of scanning cycles, and g. third electrical circuit means utilizing the plurality of means (f) outputs for classifying the defects detected in said elongated member according to a predetermined level of defect severity, length with regards to a predetermined number of scanning cycles, and location in one of the longitudinal sections of said member.

Claim 20

Apparatus for detecting defects in an elongated member and classifying said defects according to severity, length and location in a longitudinally extending section of said member, comprising: a. defect detecting means adapted to scan a surface of the elongated member cyclically during relative lengthwise movement therewith, said means producing electrical defect signals representative of defects detected in said member during said scanning, b. first defect signal detecting means for producing first level defect pulses whenever the electrical defect signals differ from at least one predetermined waveform representing a first level of defect severity, c. encoding means synchronized with means (a) scanning cycle for generating a keyed sequence of scanning position pulses in each cycle, each said pulses having correspondence with a plurality of adjacent, longitudinally extending, incremental surfaces traversed by means (a) during scanning of said elongated member surface, d. first electrical circuit means receiving the means (c) keyed sequence of pulses for producing a plurality of sequential gate control pulses and a plurality of shift pulses, each of said gate control pulses enduring for a different group of scanning position pulses and corresponding to a different adjacent section of said incremental surfaces, said shift pulses occurring once at least every other scanning cycle and in synchronism with a predetermined number of the gate control pulses, e. a plurality of gating circuits each receiving the first level defect pulses and each operating in response to a different gate control pulse for enabling passage of only those defect pulses which occur in the section of said member where said defects were detected, f. second electrical circuit means, including a plurality of signal storing and transferring means each connected to a different means (e) output and operating in response to means (d) shift pulses, for incrementally delaying corresponding sections of defect pulses from passage to respective output circuit means for a predetermined number of scanning cycles, and g. third electrical circuit means utilizing the plurality of means (f) outputs for classifying the defects detected in said elongated member according to a predetermined level of defect severity, length with regards to a predetermined number of scanning cycles, and location in one of the longitudinal sections of said member.

Claim 21

The apparatus of claim 11 further including: h. second defect signal detecting means for producing second level defect pulses whenever the electrical defect signals differ from at least one predetermined waveform representing a second level of defect severity, and i. the third electrical circuit means is adapted to also utilize means (h) output for classifying second level defects.

Claim 22

The apparatus of claim 11 wherein the electrical defect signals produced by means (a) comprise random false defect signals intermixed with true defect signals which are recurrable in at least one successive scanning cycle, and wherein means (b) correspondingly produces recurrable true and random false first level defect pulses, said apparatus including: j. signal correlating means receiving said true and false defect pulses from means (b), and operating in response to the scanning position pulses from means (c), for passing true defect signals to means (e) which reoccur in one or more scanning cycles and rejecting random false defect signals.

Claim 23

The apparatus of claim 13 wherein signal correlating means (j) comprises: k. fourth electrical circuit means, including signal storing and transferring means connected to means (b) output and operating in response to the scanning position pulses from means (c), for storing and transferring the true and false defect pulses through a pluralIty of incremental storage stages situated between a storage input circuit and a predetermined number of storage output circuits, said outputs corresponding to cyclic increments of single, multiple, or related fractional cycles of scanning history, and l. fifth electrical circuit means, including a correlator output means, operating under one of a number of correlating modes for enabling the comparison of the means (b) output with at least one of the means (k) outputs, said fifth electrical circuit means passing a true defect pulse to the correlator output means when coincidence occurs between an instantaneous true defect pulse and a stored true defect pulse, said circuit means rejecting random false defect pulses.

Claim 24

The apparatus of claim 14 wherein means (k) includes: m. shift register means for storing and transferring the true and false defect pulses stepwise between said input and output circuits, said shift register means having M sections of at least N stages of serially-connected binary storage elements per section, each of the binary elements having a shift circuit operative in response to the scanning position pulses from means (c).

Claim 25

The apparatus of claim 15 wherein shift register means (m) includes: n. at least 2N stages with outputs tapped at N and 2N stages connected to circuit means (l).

Claim 26

The apparatus of claim 15 wherein shift register means (m) includes: o. at least 2N stages with outputs tapped at N, 2N and other predetermined stages adjacent N, 2N or N and 2N stages connected to circuit means (l).

Claim 27

The apparatus of claim 14 wherein circuit means (l) includes: p. correlating mode selecting means for providing separate selection signals so that signal correlation may take place during either the same, or one or more leading or lagging, recurring increments of the scanning cycle, and q. logic means operating under control of the correlating mode selection signals for enabling the comparison of means (b) output with means (k) outputs and the passage of the true defect pulse.

Claim 28

The apparatus of claim 11 wherein means (f) plurality of signal storing and transferring means consists of: r. a plurality of shift registers each connected to a different means (e) output, and operating in response to the shift pulses from means (d), for storing and transferring the sectional defect pulses throughout a plurality of incremental storage stages to effect said incremental delay of the respective deflect pulses.

Claim 29

The apparatus of claim 11 wherein second electrical circuit means (f) comprises: s. a plurality of shift registers each connected to a different means (e) output, and operating in response to the shift pulses from means (d), for storing and transferring the sectional defect pulses through a plurality of incremental storage stages to effect said incremental delay of the respective defect pulses, said plurality of stages corresponding to a predetermined number of scanning cycles and having a plurality of outputs tapped at preselected stages, and t. means receiving the plurality of outputs from each of the plurality of shift registers for preselecting the same incremental delay for each shift register from a variety of such delays and providing a plurality of outputs with delayed defect pulses, each output being related to a different one of the aforesaid longitudinal sections of the elongated member.

Claim 30

The apparatus of claim 11 wherein third electrical circuit means (g) includes: u. defect marking means operatively associated with the elongated member under test and including a plurality of marker units, a predetermined number of said marker units being responsive to a different one of the means (f) output circuits, for marking the elongated member where defects occur according to said classification.

Claim 31

The apparatus of claim 12 wherein third electrical circuit means (g) includes: v. defect marking means operatively associated with the elongated member under test and including a plurality of marker units, a first predetermined number of said marker units being responsive to a different one of the means (f) output circuits, a second predetermined number of said marker units being responsive to means (h) output circuit, said defect marking means marking the elongated member where first and second level defects occur according to said classification.

Claim 32

The apparatus of claim 22 wherein the first predetermined number of marker units is responsive to means (h) output instead of means (f) output, or alternatively means (f) and means (h) outputs.